- R. A. Evans:
**Editorial reasonable engineering guess.**1

- R. A. Evans:
**Editorial genuine imitation Bayesian.**2

- R. A. Evans:
**Editorial confidence intervals for discrete variables.**3

- Xu Haiyan, Tang Yincai:
**Commentary: the Khamis/Higgins model.**4-6

- R. A. Betensky, E. C. Martin:
**Commentary: failure-rate functions for doubly-truncated random variables.**7-8

- A. Birolini:
**Commentary: author reply to a book review.**9

- J. A. Connor:
**Commentary: getting real about reliability, through wit and humor.**10-13

- Shaomin Wu, Ling-Yau Chan:
**Performance utility-analysis of multi-state systems.**14-21

- Li Sheng, Jie Wu:
**Maximum-shortest-path (MSP) is not optimal for a general N×N torus.**22-25

- S. Gasmi, C. E. Love, W. Kahle:
**A general repair, proportional-hazards, framework to model complex repairable systems.**26-32

- C. D. Lai, Min Xie, D. N. P. Murthy:
**A modified Weibull distribution.**33-37

- Jie Mi:
**A unified way of comparing the reliability of coherent systems.**38-43

- M. Lanus, Liang Yin, Kishor S. Trivedi:
**Hierarchical composition and aggregation of state-based availability and performability models.**44-52

- C. Constantinescu:
**Experimental evaluation of error-detection mechanisms.**53-57

- M. G. F. Bell:
**The use of game theory to measure the vulnerability of stochastic networks.**63-68

- O. Gaudoin, Bo Yang, Min Xie:
**A simple goodness-of-fit test for the power-law process, based on the Duane plot.**69-74

- Nong Ye, Sean Vilbert, Qiang Chen:
**Computer intrusion detection through EWMA for autocorrelated and uncorrelated data.**75-82

- Yeh Lam, Yuan Lin Zhang:
**A geometric-process maintenance model for a deteriorating system under a random environment.**83-89

- N. Balakrishnan, N. Kannan, C.-T. Lin, H. K. T. Ng:
**Point and interval estimation for Gaussian distribution, based on progressively Type-II censored samples.**90-95

- Antoine Rauzy:
**A new methodology to handle Boolean models with loops.**96-105

- A. O. C. Elegbede, Chengbin Chu, Kondo H. Adjallah, Farouk Yalaoui:
**Reliability allocation through cost minimization.**106-111

- A. Brezavscek, A. Hudoklin:
**Joint optimization of block-replacement and periodic-review spare-provisioning policy.**112-117

- T. R. Bennett, J. M. Booker, Sallie Keller-McNulty, Nozer D. Singpurwalla:
**Testing the untestable: reliability in the 21st century.**118-124

- G.-A. Klutke, Peter C. Kiessler, M. A. Wortman:
**A critical look at the bathtub curve.**125-129

- T. E. Salzer:
**Tubulation techniques for locating fine-leak sites in hermetic electronic packages.**130-132

- Nader B. Ebrahimi:
**Indirect assessment of system reliability.**58-62

- Hoang Pham:
**Commentary: steady-state series-system availability.**146-147

- J. A. McLinn:
**Commentary: material review board in 2003.**148

- W. Tustin:
**Commentary: real education.**149

- A.-R. M. Abouammoh, I. S. Qamber:
**New better than renewal-used classes of life distributions.**150-153

- M. L. Ulrey:
**Formulas for the distribution of sums of independent exponential random variables.**154-161

- A. J. Fry:
**Integrity-based self-validation test scheduling.**162-167

- Philip J. Boland, Harshinder Singh:
**A birth-process approach to Moranda's geometric software-reliability model.**168-174

- Antoine Rauzy:
**Toward an efficient implementation of the MOCUS algorithm.**175-180

- Ruiqing Zhao, Baoding Liu:
**Stochastic programming models for general redundancy-optimization problems.**181-191

- Gregory Levitin:
**Optimal allocation of multistate elements in a linear consecutively-connected system.**192-199

- A. M. Mathai:
**Order statistics from a logistic distribution and applications to survival and reliability analysis.**200-206

- Héctor Cancela, Mohamed El Khadiri:
**The recursive variance-reduction simulation algorithm for network reliability evaluation.**207-212

- J. D. Andrews, S. Beeson:
**Birnbaum's measure of component importance for noncoherent systems.**213-219

- Yong Ou, Joanne Bechta Dugan:
**Approximate sensitivity analysis for acyclic Markov reliability models.**220-230

- Gregory Levitin:
**Reliability evaluation for acyclic transmission networks of multi-state elements with delays.**231-237

- Hairong Sun, James J. Han, Haim Levendel:
**Availability requirement for a fault-management server in high-availability communication systems.**238-244

- Dong Xiang, Ai Chen, Jie Wu:
**Reliable broadcasting in wormhole-routed hypercube-connected networks using local safety information.**245-256

- J. Quigley, Lesley Walls:
**Confidence intervals for reliability-growth models with small sample-sizes.**257-262

- Gregory Levitin:
**Linear multi-state sliding-window systems.**263-269

- R. A. Evans:
**Editorials-from 1978.**273-276

- R. A. Evans:
**Editorials-from 1979.**277-280

- R. A. Evans:
**Editorials-from 1980.**281-284

- R. A. Evans:
**Editorials-from 1981.**285-288

- Alexandru O. Balan, Lorenzo Traldi:
**Preprocessing minpaths for sum of disjoint products.**289-295

- Thomas S. Barnett, Adit D. Singh, Victor P. Nelson:
**Extending integrated-circuit yield-models to estimate early-life reliability.**296-300

- S. Beeson, J. D. Andrews:
**Importance measures for noncoherent-system analysis.**301-310

- A. Biswas, J. Sarkar, S. Sarkar:
**Availability of a periodically inspected system, maintained under an imperfect-repair policy.**311-318

- Juan A. Carrasco:
**Solving dependability/performability irreducible Markov models using regenerative randomization.**319-329

- Joohan Lee, Steve J. Chapin, S. Taylor:
**Reliable heterogeneous applications.**330-339

- Gregory Levitin:
**Reliability of multi-state systems with two failure-modes.**340-348

- Anna Richelli, Luigi Colalongo, Zsolt Miklós Kovács-Vajna:
**Increasing the immunity to electromagnetic interferences of CMOS OpAmps.**349-353

- Shiuh-Pyng Shieh, Yea-Ching Tsai, Yu-Lun Huang:
**Optimal information-dispersal for fault-tolerant communication over a burst-error channel.**354-366

- G. Shmueli:
**Computing consecutive-type reliabilities nonrecursively.**367-372

- S. K. Yang:
**A condition-based failure-prediction and processing-scheme for preventive maintenance.**373-383

- Chih-Tsun Huang, Chi-Feng Wu, Jin-Fu Li, Cheng-Wen Wu:
**Built-in redundancy analysis for memory yield improvement.**386-399

- Fabrizio Ferrandi, Franco Fummi, Graziano Pravadelli, Donatella Sciuto:
**Identification of design errors through functional testing.**400-412

- Karl Thaller, Andreas Steininger:
**A transparent online memory test for simultaneous detection of functional faults and soft errors in memories.**413-422

- Jun Zhao, Fred J. Meyer, Fabrizio Lombardi, Nohpill Park:
**Maximal diagnosis of interconnects of random access memories.**423-434

- J. H. Jiang, Wen-Ben Jone, Shih-Chieh Chang, S. Ghosh:
**Embedded core test generation using broadcast test architecture and netlist scrambling.**435-443

- W. P. M. Allen, D. G. Bailey, Serge N. Demidenko, Vincenzo Piuri:
**Analysis and application of digital spectral warping in analog and mixed-signal testing.**444-457

- Cristiana Bolchini:
**A software methodology for detecting hardware faults in VLIW data paths.**458-468

- Cecilia Metra, Luca Schiano, Michele Favalli:
**Concurrent detection of power supply noise.**469-475

- Gian-Carlo Cardarilli, A. Leandri, P. Marinucci, Marco Ottavi, Salvatore Pontarelli, Marco Re, Adelio Salsano:
**Design of a fault tolerant solid state mass memory.**476-491

- Stanislaw J. Piestrak, Abbas Dandache, Fabrice Monteiro:
**Designing fault-secure parallel encoders for systematic linear error correcting codes.**492-500

- Kaijie Wu, Ramesh Karri:
**Selectively breaking data dependences to improve the utilization of idle cycles in algorithm level re-computing data paths.**501-511

- Christoph Scherrer, Andreas Steininger:
**Dealing with dormant faults in an embedded fault-tolerant computer system.**512-522

- A. Barros, C. Bérenguer, A. Grall:
**Optimization of replacement times using imperfect monitoring information.**523-533