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IEEE Design & Test of Computers, Volume 14

Volume 14, Number 1, January-March 1997

EIC Message Interview-Design data standard News-JOLLY, BIST for embedded DRAM Guest Editor's Introduction Ultrasparc Testability Memory Defect Mapping Features Special Features A D&T Roundtable Panel Summaries-Asynchronous design, Intranets and EDA Conference Reports-ATS 96, System Test Standards Committee DATC Newsletter TTTC Newsletter The Last Byte-Teaching George about test

Volume 14, Number 2, April-June 1997

Letters News Panel Summaries A D&T Profile Guest Editors' Introduction Cosimulation and Compilation Ram Address Decoders Microsystem Cad High-Level Synthesis Features Parity Prediction Digital System Design A D&T Roundtable Author Guidelines DATC Newsletter TTTC Newsletter The Last Byte

Volume 14, Number 3, July-September 1997

EIC Message-Welcome ITC 97 Attendees News Panel Summaries Conference Reports VTS 97 Keynote Guest Editors' Introduction Feature IC Diagnosis and Failure Analysis Special Feature DATC Newsletter TTTC Newsletter The Last Byte

Volume 14, Number 4, October-December 1997

Message from the EIC Panel Summaries Conference Reports A D&T Profile Guest Editors' Introduction Feature Special Feature IEEE Design & Test of Computers: 1997 Annual Index, Volume 14 DDATC Newsletter TTTC Newsletter The Last Byte

Copyright © Mon Nov 2 21:34:05 2009 by Michael Ley (ley@uni-trier.de)