| 2008 |
| 12 | EE | Tianyang Wang,
Zhiyi Fang,
Lianyu Zhao,
Dan Zhao,
Peng Xu,
Jin Liu:
Implementation of Collaborative Control in Supply Chain Management by Using DA and Workflow Technology.
ITNG 2008: 303-308 |
| 2007 |
| 11 | EE | Dan Zhao,
Unni Chandran,
Hideo Fujiwara:
Shelf Packing to the Design and Optimization of A Power-Aware Multi-Frequency Wrapper Architecture for Modular IP Cores.
ASP-DAC 2007: 714-719 |
| 10 | EE | Yi Wang,
Dan Zhao:
The design and synthesis of a synchronous and distributed MAC protocol for wireless network-on-chip.
ICCAD 2007: 612-617 |
| 9 | EE | Yi Wang,
Dan Zhao:
Design and Implementation of Routing Scheme for Wireless Network-on-Chip.
ISCAS 2007: 1357-1360 |
| 8 | EE | Dan Zhao,
Ronghua Huang,
Tomokazu Yoneda,
Hideo Fujiwara:
Power-Aware Multi-Frequency Heterogeneous SoC Test Framework Design with Floor-Ceiling Packing.
ISCAS 2007: 2942-2945 |
| 2006 |
| 7 | EE | Dan Zhao,
John Mylopoulos,
Iluju Kiringa,
Verena Kantere:
An ECA Rule Rewriting Mechanism for Peer Data Management Systems.
EDBT 2006: 1069-1078 |
| 6 | EE | Dan Zhao,
Shambhu J. Upadhyaya,
Martin Margala:
Design of a wireless test control network with radio-on-chip technology for nanometer system-on-a-chip.
IEEE Trans. on CAD of Integrated Circuits and Systems 25(7): 1411-1418 (2006) |
| 2005 |
| 5 | EE | Dan Zhao,
Shambhu J. Upadhyaya:
Dynamically partitioned test scheduling with adaptive TAM configuration for power-constrained SoC testing.
IEEE Trans. on CAD of Integrated Circuits and Systems 24(6): 956-965 (2005) |
| 2003 |
| 4 | EE | Dan Zhao,
Shambhu J. Upadhyaya,
Martin Margala:
Control Constrained Resource Partitioning for Complex SoCs.
DFT 2003: 425-432 |
| 3 | EE | Dan Zhao,
Shambhu J. Upadhyaya:
Power Constrained Test Scheduling with Dynamically Varied TAM.
VTS 2003: 273-278 |
| 2002 |
| 2 | EE | Dan Zhao,
Shambhu J. Upadhyaya,
Martin Margala:
Minimizing concurrent test time in SoC's by balancing resource usage.
ACM Great Lakes Symposium on VLSI 2002: 77-82 |
| 1 | EE | Dan Zhao,
Shambhu J. Upadhyaya:
Adaptive Test Scheduling in SoC's by Dynamic Partitioning.
DFT 2002: 334-344 |