| |
| * | 2003 | |
|---|---|---|
| 1 | EE | Mohammad Yunus, K. Srihari, J. M. Pitarresi, Anthony Primavera: Effect of voids on the reliability of BGA/CSP solder joints. Microelectronics Reliability 43(12): 2077-2086 (2003) |
| 1 | J. M. Pitarresi | [1] |
| 2 | Anthony Primavera | [1] |
| 3 | K. Srihari | [1] |