Yuki Yoshikawa Vis

*	2009
2	EE	Yuki Yoshikawa, Satoshi Ohtake, Tomoo Inoue, Hideo Fujiwara: Fast false path identification based on functional unsensitizability using RTL information. ASP-DAC 2009: 660-665
	2005
1	EE	Yuki Yoshikawa, Satoshi Ohtake, Michiko Inoue, Hideo Fujiwara: Design for Testability Based on Single-Port-Change Delay Testing for Data Paths. Asian Test Symposium 2005: 254-259

Coauthor Index

1	Hideo Fujiwara	[1] [2]
2	Michiko Inoue	[1]
3	Tomoo Inoue	[2]
4	Satoshi Ohtake	[1] [2]