| * | 2009 |
|---|
| 3 | EE | YongJoon Kim,
Myung-Hoon Yang,
Jaeseok Park,
Eunsei Park,
Sungho Kang:
Grouped Scan Slice Repetition Method for Reducing Test Data Volume and Test Application Time.
IEICE Transactions 92-D(7): 1462-1465 (2009) |
| 2008 |
|---|
| 2 | EE | Myung-Hoon Yang,
YongJoon Kim,
Sunghoon Chun,
Sungho Kang:
An Effective Power Reduction Methodology for Deterministic BIST Using Auxiliary LFSR.
J. Electronic Testing 24(6): 591-595 (2008) |
| 2005 |
|---|
| 1 | EE | Youbean Kim,
Myung-Hoon Yang,
Yong Lee,
Sungho Kang:
A New Low Power Test Pattern Generator using a Transition Monitoring Window based on BIST Architecture.
Asian Test Symposium 2005: 230-235 |
