| |
| * | 2006 | |
|---|---|---|
| 5 | EE | M. Yamashita, K. Suganuma: Improvement in high-temperature degradation by isotropic conductive adhesives including Ag-Sn alloy fillers. Microelectronics Reliability 46(5-6): 850-858 (2006) |
| 4 | EE | M. Yamashita, K. Suganuma: Degradation by Sn diffusion applied to surface mounting with Ag-epoxy conductive adhesive with joining pressure. Microelectronics Reliability 46(7): 1113-1118 (2006) |
| 2002 | ||
| 3 | T. Harada, M. Yamashita: k-Coteries for Tolerating Network 2-Partition. OPODIS 2002: 117-124 | |
| 1994 | ||
| 2 | Celina A. A. P. Abar, M. Yamashita: On Non-Alethic Logic. IPMU 1994: 339-347 | |
| 1984 | ||
| 1 | M. Yamashita: Parallel and sequential transformations on digital images. Pattern Recognition 17(6): 677 (1984) | |
| 1 | Celina A. A. P. Abar | [2] |
| 2 | T. Harada | [3] |
| 3 | K. Suganuma | [4] [5] |