| |
| 2007 | ||
|---|---|---|
| 7 | EE | Carsten Wegener, Michael Peter Kennedy: Hard-Fault Detection and Diagnosis During the Application of Model-Based Data Converter Testing. J. Electronic Testing 23(6): 513-525 (2007) |
| 2006 | ||
| 6 | EE | Carsten Wegener, Michael Peter Kennedy: Test Development Through Defect and Test Escape Level Estimation for Data Converters. J. Electronic Testing 22(4-6): 313-324 (2006) |
| 2005 | ||
| 5 | EE | Carsten Wegener, Michael Peter Kennedy: Overcoming Test Setup Limitations by Applying Model-Based Testing to High-Precision ADCs. J. Electronic Testing 21(3): 299-310 (2005) |
| 2003 | ||
| 4 | EE | Carsten Wegener, Michael Peter Kennedy: Linear Model-Based Error Identification and Calibration for Data Converters. DATE 2003: 10630-10635 |
| 3 | EE | Gwenolé Maugard, Carsten Wegener, Tom O'Dwyer, Michael Peter Kennedy: Method of reducing contactor effect when testing high-precision ADCs. ITC 2003: 210-217 |
| 2002 | ||
| 2 | EE | Carsten Wegener, Michael Peter Kennedy: Implementation of Model-Based Testing for Medium to High-Resolution Nyquist-Rate ADCs. ITC 2002: 851-860 |
| 2000 | ||
| 1 | EE | Carsten Wegener, Michael Peter Kennedy: Incorporation of Hard-Fault-Coverage in Model-Based Testing of Mixed-Signal ICs. DATE 2000: 765 |
| 1 | Michael Peter Kennedy | [1] [2] [3] [4] [5] [6] [7] |
| 2 | Gwenolé Maugard | [3] |
| 3 | Tom O'Dwyer | [3] |