| |
| 2007 | ||
|---|---|---|
| 2 | EE | Kazufumi Watanabe, Akinobu Teramoto, Rihito Kuroda, Shigetoshi Sugawa, Tadahiro Ohmi: Examination of degradation mechanism due to negative bias temperature stress from a perspective of hole energy for accurate lifetime prediction. Microelectronics Reliability 47(2-3): 409-418 (2007) |
| 1984 | ||
| 1 | Hiroshi G. Okuno, Ikuo Takeuchi, Nobuyasu Ohsato, Yasushi Hibino, Kazufumi Watanabe: TAO: Afst Interpreter-Centered Lisp System on Lisp Machine ELIS. LISP and Functional Programming 1984: 140-149 | |
| 1 | Yasushi Hibino | [1] |
| 2 | Rihito Kuroda | [2] |
| 3 | Tadahiro Ohmi | [2] |
| 4 | Nobuyasu Ohsato | [1] |
| 5 | Hiroshi G. Okuno | [1] |
| 6 | Shigetoshi Sugawa | [2] |
| 7 | Ikuo Takeuchi | [1] |
| 8 | Akinobu Teramoto | [2] |