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Li-C. Wang Vis

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*2009
87EENicholas Callegari, Pouria Bastani, Li-C. Wang, Sreejit Chakravarty, Alexander Tetelbaum: Path selection for monitoring unexpected systematic timing effects. ASP-DAC 2009: 781-786
86EENicholas Callegari, Li-C. Wang, Pouria Bastani: Speedpath analysis based on hypothesis pruning and ranking. DAC 2009: 346-351
85EEDragoljub Gagi Drmanac, Frank Liu, Li-C. Wang: Predicting variability in nanoscale lithography processes. DAC 2009: 545-550
2008
84EEPouria Bastani, Kip Killpack, Li-C. Wang, Eli Chiprout: Speedpath prediction based on learning from a small set of examples. DAC 2008: 217-222
83EEOnur Guzey, Li-C. Wang, Jeremy R. Levitt, Harry Foster: Functional test selection based on unsupervised support vector analysis. DAC 2008: 262-267
82EEPouria Bastani, Nicholas Callegari, Li-C. Wang, Magdy S. Abadir: Statistical diagnosis of unmodeled systematic timing effects. DAC 2008: 355-360
81EEPouria Bastani, Li-C. Wang, Magdy S. Abadir: Linking Statistical Learning to Diagnosis. IEEE Design & Test of Computers 25(3): 232-239 (2008)
2007
80 Magdy S. Abadir, Li-C. Wang, Jayanta Bhadra: Eighth International Workshop on Microprocessor Test and Verification (MTV 2007), Common Challenges and Solutions, 5-6 December 2007, Austin, Texas, USA IEEE Computer Society 2007
79EELi-C. Wang, Pouria Bastani, Magdy S. Abadir: Design-Silicon Timing Correlation A Data Mining Perspective. DAC 2007: 384-389
78EECharles H.-P. Wen, Li-C. Wang, Jayanta Bhadra: An incremental learning framework for estimating signal controllability in unit-level verification. ICCAD 2007: 250-257
77EEJayanta Bhadra, Magdy S. Abadir, Li-C. Wang: Guest Editors' Introduction: Attacking Functional Verification through Hybrid Techniques. IEEE Design & Test of Computers 24(2): 110-111 (2007)
76EEJayanta Bhadra, Magdy S. Abadir, Li-C. Wang, Sandip Ray: A Survey of Hybrid Techniques for Functional Verification. IEEE Design & Test of Computers 24(2): 112-122 (2007)
2006
75 Magdy S. Abadir, Li-C. Wang, Jayanta Bhadra: Seventh International Workshop on Microprocessor Test and Verification (MTV 2006), Common Challenges and Solutions, 4-5 December 2006, Austin, Texas, USA IEEE Computer Society 2006
74EEBenjamin N. Lee, Li-C. Wang, Magdy S. Abadir: Refined statistical static timing analysis through. DAC 2006: 149-154
73EEOnur Guzey, Charles H.-P. Wen, Li-C. Wang, Tao Feng, Hillel Miller, Magdy S. Abadir: Extracting a Simplified View of Design Functionality Based on Vector Simulation. Haifa Verification Conference 2006: 34-49
72EELeonard Lee, Li-C. Wang: On bounding the delay of a critical path. ICCAD 2006: 81-88
71EECharles H.-P. Wen, Onur Guzey, Li-C. Wang: Simulation-based functional test justification using a decision-digram-based Boolean data miner. ICCD 2006
70EECharles H.-P. Wen, Li-C. Wang, Kwang-Ting Cheng: Simulation-Based Functional Test Generation for Embedded Processors. IEEE Trans. Computers 55(11): 1335-1343 (2006)
2005
69 Magdy S. Abadir, Li-C. Wang: Sixth International Workshop on Microprocessor Test and Verification (MTV 2005), Common Challenges and Solutions, 3-4 November 2005, Austin, Texas, USA IEEE Computer Society 2005
68EEFeng Lu, Madhu K. Iyer, Ganapathy Parthasarathy, Li-C. Wang, Kwang-Ting Cheng, Kuang-Chien Chen: An Efficient Sequential SAT Solver With Improved Search Strategies. DATE 2005: 1102-1107
67EELeonard Lee, Sean Wu, Charles H.-P. Wen, Li-C. Wang: On Generating Tests to Cover Diverse Worst-Case Timing Corners. DFT 2005: 415-426
66EECharles H.-P. Wen, Li-C. Wang: Simulation Data Mining for Functional Test Pattern Justification. MTV 2005: 76-83
65EECharles H.-P. Wen, Li-C. Wang, Kwang-Ting Cheng, Kai Yang, Wei-Ting Liu, Ji-Jan Chen: On A Software-Based Self-Test Methodology and Its Application. VTS 2005: 107-113
64EEBenjamin N. Lee, Li-C. Wang, Magdy S. Abadir: Reducing Pattern Delay Variations for Screening Frequency Dependent Defects. VTS 2005: 153-160
63EELeonard Lee, Li-C. Wang, Praveen Parvathala, T. M. Mak: On Silicon-Based Speed Path Identification. VTS 2005: 35-41
62EETao Feng, Li-C. Wang, Kwang-Ting Cheng, Chih-Chan Lin: Using 2-domain partitioned OBDD data structure in an enhanced symbolic simulator. ACM Trans. Design Autom. Electr. Syst. 10(4): 627-650 (2005)
2004
61EEChee-Kian Ong, Dongwoo Hong, Kwang-Ting Cheng, Li-C. Wang: Jitter spectral extraction for multi-gigahertz signal. ASP-DAC 2004: 298-303
60EEGanapathy Parthasarathy, Madhu K. Iyer, Kwang-Ting Cheng, Li-C. Wang: Efficient reachability checking using sequential SAT. ASP-DAC 2004: 418-423
59EETao Feng, Li-C. Wang, Kwang-Ting Cheng: Improved symbolic simulation by functional-space decomposition. ASP-DAC 2004: 634-639
58EEKai Yang, Kwang-Ting Cheng, Li-C. Wang: TranGen: a SAT-based ATPG for path-oriented transition faults. ASP-DAC 2004: 92-97
57EEGanapathy Parthasarathy, Madhu K. Iyer, Kwang-Ting Cheng, Li-C. Wang: An efficient finite-domain constraint solver for circuits. DAC 2004: 212-217
56EELi-C. Wang, T. M. Mak, Kwang-Ting Cheng, Magdy S. Abadir: On path-based learning and its applications in delay test and diagnosis. DAC 2004: 492-497
55EEMango Chia-Tso Chao, Li-C. Wang, Kwang-Ting Cheng: Pattern Selection for Testing of Deep Sub-Micron Timing Defects. DATE 2004: 160
54EEChee-Kian Ong, Dongwoo Hong, Kwang-Ting Cheng, Li-C. Wang: Random Jitter Extraction Technique in a Multi-Gigahertz Signal. DATE 2004: 286-291
53EETao Feng, Li-C. Wang, Kwang-Ting Cheng, Chih-Chan Lin: Improved Symoblic Simulation by Dynamic Funtional Space Partitioning. DATE 2004: 42-49
52EELi-C. Wang: Regression Simulation: Applying Path-Based Learning In Delay Test and Post-Silicon Validation. DATE 2004: 692-695
51EERob A. Rutenbar, Li-C. Wang, Kwang-Ting Cheng, Sandip Kundu: Static statistical timing analysis for latch-based pipeline designs. ICCAD 2004: 468-472
50EELeonard Lee, Li-C. Wang, T. M. Mak, Kwang-Ting Cheng: A path-based methodology for post-silicon timing validation. ICCAD 2004: 713-720
49EEJing Zeng, Magdy S. Abadir, A. Kolhatkar, G. Vandling, Li-C. Wang, Jacob A. Abraham: On Correlating Structural Tests with Functional Tests for Speed Binning of High Performance Design. ITC 2004: 31-37
48EEJing Zeng, Magdy S. Abadir, G. Vandling, Li-C. Wang, S. Karako, Jacob A. Abraham: On Correlating Structural Tests with Functional Tests for Speed Binning of High Performance Design. MTV 2004: 103-109
47EEChee-Kian Ong, Dongwoo Hong, Kwang-Ting Cheng, Li-C. Wang: A Scalable On-Chip Jitter Extraction Technique. VTS 2004: 267-272
46EEGanapathy Parthasarathy, Madhu K. Iyer, Kwang-Ting Cheng, Li-C. Wang: Safety Property Verification Using Sequential SAT and Bounded Model Checking. IEEE Design & Test of Computers 21(2): 132-143 (2004)
45EEMagdy S. Abadir, Li-C. Wang: Guest Editors' Introduction: The Verification and Test of Complex Digital ICs. IEEE Design & Test of Computers 21(2): 80-82 (2004)
44EET. M. Mak, Angela Krstic, Kwang-Ting (Tim) Cheng, Li-C. Wang: New Challenges in Delay Testing of Nanometer, Multigigahertz Designs. IEEE Design & Test of Computers 21(3): 241-247 (2004)
43EELi-C. Wang, Jing-Jia Liou, Kwang-Ting Cheng: Critical path selection for delay fault testing based upon a statistical timing model. IEEE Trans. on CAD of Integrated Circuits and Systems 23(11): 1550-1565 (2004)
42EECliff C. N. Sze, Ting-Chi Wang, Li-C. Wang: Multilevel circuit clustering for delay minimization. IEEE Trans. on CAD of Integrated Circuits and Systems 23(7): 1073-1085 (2004)
41EEFeng Lu, Li-C. Wang, Kwang-Ting (Tim) Cheng, John Moondanos, Ziyad Hanna: A Signal Correlation Guided Circuit-SAT Solver. J. UCS 10(12): 1629-1654 (2004)
2003
40EEFeng Lu, Li-C. Wang, Kwang-Ting Cheng, John Moondanos, Ziyad Hanna: A signal correlation guided ATPG solver and its applications for solving difficult industrial cases. DAC 2003: 436-441
39EEAngela Krstic, Li-C. Wang, Kwang-Ting Cheng, Jing-Jia Liou, T. M. Mak: Enhancing diagnosis resolution for delay defects based upon statistical timing and statistical fault models. DAC 2003: 668-673
38EEAngela Krstic, Li-C. Wang, Kwang-Ting Cheng, Jing-Jia Liou, Magdy S. Abadir: Delay Defect Diagnosis Based Upon Statistical Timing Models - The First Step. DATE 2003: 10328-10335
37EEFeng Lu, Li-C. Wang, Kwang-Ting Cheng, Ric C.-Y. Huang: A Circuit SAT Solver With Signal Correlation Guided Learning. DATE 2003: 10892-10897
36EEAngela Krstic, Jing-Jia Liou, Kwang-Ting Cheng, Li-C. Wang: On Structural vs. Functional Testing for Delay Faults. ISQED 2003: 438-441
35EELi-C. Wang, Angela Krstic, Leonard Lee, Kwang-Ting Cheng, M. Ray Mercer, Thomas W. Williams, Magdy S. Abadir: Using Logic Models To Predict The Detection Behavior Of Statistical Timing Defects. ITC 2003: 1041-1050
34EEAngela Krstic, Li-C. Wang, Kwang-Ting Cheng, T. M. Mak: Diagnosis-Based Post-Silicon Timing Validation Using Statistical Tools and Methodologies. ITC 2003: 339-348
33EEAngela Krstic, Li-C. Wang, Kwang-Ting Cheng, Jing-Jia Liou: Diagnosis of Delay Defects Using Statistical Timing Models. VTS 2003: 339-344
32EEKenneth M. Butler, Kwang-Ting (Tim) Cheng, Li-C. Wang: Guest Editors' Introduction: Speed Test and Speed Binning for Complex ICs. IEEE Design & Test of Computers 20(5): 6-7 (2003)
2002
31EEJing-Jia Liou, Li-C. Wang, Kwang-Ting Cheng, Jennifer Dworak, M. Ray Mercer, Rohit Kapur, Thomas W. Williams: Enhancing test efficiency for delay fault testing using multiple-clocked schemes. DAC 2002: 371-374
30EEJing-Jia Liou, Angela Krstic, Li-C. Wang, Kwang-Ting Cheng: False-path-aware statistical timing analysis and efficient path selection for delay testing and timing validation. DAC 2002: 566-569
29EEJennifer Dworak, James Wingfield, Brad Cobb, Sooryong Lee, Li-C. Wang, M. Ray Mercer: Fortuitous Detection and its Impact on Test Set Sizes Using Stuck-at and Transition Faults. DFT 2002: 177-185
28EEJing-Jia Liou, Li-C. Wang, Kwang-Ting Cheng: On theoretical and practical considerations of path selection for delay fault testing. ICCAD 2002: 94-100
27EEGanapathy Parthasarathy, Madhu K. Iyer, Tao Feng, Li-C. Wang, Kwang-Ting Cheng, Magdy S. Abadir: Combining ATPG and Symbolic Simulation for Efficient Validation of Embedded Array Systems. ITC 2002: 203-212
26EELi-C. Wang, Magdy S. Abadir, Juhong Zhu: On Testing High-Performance Custom Circuits without Explicit Testing of the Internal Faults. ITC 2002: 398-406
25EEJing-Jia Liou, Li-C. Wang, Kwang-Ting Cheng, Jennifer Dworak, M. Ray Mercer, Rohit Kapur, Thomas W. Williams: Analysis of Delay Test Effectiveness with a Multiple-Clock Scheme. ITC 2002: 407-416
2001
24EEJianbang Lai, Ming-Shiun Lin, Ting-Chi Wang, Li-C. Wang: Module placement with boundary constraints using the sequence-pair representation. ASP-DAC 2001: 515-520
23EEMagdy S. Abadir, Li-C. Wang: Verification and Validation of Complex Digital Systems: An Industrial Perspective. ISQED 2001: 11-12
22EEMagdy S. Abadir, Juhong Zhu, Li-C. Wang: Analysis of Testing Methodologies for Custom Designs in PowerPCTM Microprocessor. VTS 2001: 252-259
21EEJennifer Dworak, Jason D. Wicker, Sooryong Lee, Michael R. Grimaila, M. Ray Mercer, Kenneth M. Butler, Bret Stewart, Li-C. Wang: Defect-Oriented Testing and Defective-Part-Level Prediction. IEEE Design & Test of Computers 18(1): 31-41 (2001)
2000
20EEJennifer Dworak, Michael R. Grimaila, Brad Cobb, Ting-Chi Wang, Li-C. Wang, M. Ray Mercer: On the superiority of DO-RE-ME/MPG-D over stuck-at-based defective part level prediction. Asian Test Symposium 2000: 151-
19EEKwang-Ting Cheng, Vishwani D. Agrawal, Jing-Yang Jou, Li-C. Wang, Chi-Feng Wu, Shianling Wu: Collaboration between Industry and Academia in Test Research. Asian Test Symposium 2000: 17-
18 Jennifer Dworak, Michael R. Grimaila, Sooryong Lee, Li-C. Wang, M. Ray Mercer: Enhanced DO-RE-ME based defect level prediction using defect site aggregation-MPG-D. ITC 2000: 930-939
17EELi-C. Wang, Magdy S. Abadir: On Efficiently Producing Quality Tests for Custom Circuits in PowerPCTM Microprocessors. J. Electronic Testing 16(1-2): 121-130 (2000)
1999
16 Jennifer Dworak, Michael R. Grimaila, Sooryong Lee, Li-C. Wang, M. Ray Mercer: Modeling the probability of defect excitation for a commercial IC with implications for stuck-at fault-based ATPG strategies. ITC 1999: 1031-1037
15 Li-C. Wang, Magdy S. Abadir: Tradeoff analysis for producing high quality tests for custom circuits in PowerPC microprocessors. ITC 1999: 830-838
14EEMichael R. Grimaila, Sooryong Lee, Jennifer Dworak, Kenneth M. Butler, Bret Stewart, Hari Balachandran, Bryan Houchins, Vineet Mathur, Jaehong Park, Li-C. Wang, M. Ray Mercer: REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experimen. VTS 1999: 268-274
13EELi-C. Wang, Magdy S. Abadir: Experience in Validation of PowerPCTM Microprocessor Embedded Arrays. J. Electronic Testing 15(1-2): 191-205 (1999)
1998
12EELi-C. Wang, Magdy S. Abadir, Nari Krishnamurthy: Automatic Generation of Assertions for Formal Verification of PowerPC Microprocessor Arrays Using Symbolic Trajectory Evaluation. DAC 1998: 534-537
11EELi-C. Wang, Magdy S. Abadir, Jing Zeng: Measuring the Effectiveness of Various Design Validation Approaches For PowerPC(TM) Microprocessor Arrays. DATE 1998: 273-277
10EEArun Chandra, Li-C. Wang, Magdy S. Abadir: Practical Considerations in Formal Equivalence Checking of PowerPC(tm) Microprocessors. Great Lakes Symposium on VLSI 1998: 362-367
9EELi-C. Wang, Magdy S. Abadir, Jing Zeng: On Logic and Transistor Level Design Error Detection of Various Validation Approaches for PowerPC(tm) Microprocessor Arrays. VTS 1998: 260-265
8EELi-C. Wang, Magdy S. Abadir, Jing Zeng: On measuring the effectiveness of various design validation approaches for PowerPC microprocessor embedded arrays. ACM Trans. Design Autom. Electr. Syst. 3(4): 524-532 (1998)
7EELi-C. Wang, Magdy S. Abadir: Test Generation Based on High-Level Assertion Specification for PowerPCTM Microprocessor Embedded Arrays. J. Electronic Testing 13(2): 121-135 (1998)
1997
6 Li-C. Wang, Magdy S. Abadir: A New Validation Methodology Combining Test and Formal Verification for PowerPCTM Microprocessor Arrays. ITC 1997: 954-963
1996
5EELi-C. Wang, M. Ray Mercer, Thomas W. Williams: A Better ATPG Algorithm and Its Design Principles. ICCD 1996: 248-253
4 Li-C. Wang, M. Ray Mercer, Thomas W. Williams: Using Target Faults To Detect Non-Tartget Defects. ITC 1996: 629-638
1995
3 Li-C. Wang, M. Ray Mercer, Thomas W. Williams: On Efficiently and Reliably Achieving Low Defective Part Levels. ITC 1995: 616-625
2EELi-C. Wang, M. Ray Mercer, Sophia W. Kao, Thomas W. Williams: On the decline of testing efficiency as fault coverage approaches 100%. VTS 1995: 74-83
1993
1EEAlbert G. Greenberg, Boris D. Lubachevsky, Li-C. Wang: Experience in Massively Parallel Discrete Event Simulation. SPAA 1993: 193-202

Coauthor Index

1Magdy S. Abadir [6] [7] [8] [9] [10] [11] [12] [13] [15] [17] [22] [23] [26] [27] [35] [38] [45] [48] [49] [56] [64] [69] [73] [74] [75] [76] [77] [79] [80] [81] [82]
2Jacob A. Abraham [48] [49]
3Vishwani D. Agrawal [19]
4Hari Balachandran [14]
5Pouria Bastani [79] [81] [82] [84] [86] [87]
6Jayanta Bhadra [75] [76] [77] [78] [80]
7Kenneth M. Butler [14] [21] [32]
8Nicholas Callegari [82] [86] [87]
9Sreejit Chakravarty [87]
10Arun Chandra [10]
11Mango Chia-Tso Chao [55]
12Ji-Jan Chen [65]
13Kuang-Chien Chen [68]
14Kwang-Ting Cheng (Kwang-Ting (Tim) Cheng) [19] [25] [27] [28] [30] [31] [32] [33] [34] [35] [36] [37] [38] [39] [40] [41] [43] [44] [46] [47] [50] [51] [53] [54] [55] [56] [57] [58] [59] [60] [61] [62] [65] [68] [70]
15Eli Chiprout [84]
16Brad Cobb [20] [29]
17Dragoljub Gagi Drmanac [85]
18Jennifer Dworak [14] [16] [18] [20] [21] [25] [29] [31]
19Tao Feng [27] [53] [59] [62] [73]
20Harry Foster [83]
21Albert G. Greenberg [1]
22Michael R. Grimaila [14] [16] [18] [20] [21]
23Onur Guzey [71] [73] [83]
24Ziyad Hanna [40] [41]
25Dongwoo Hong [47] [54] [61]
26Bryan Houchins [14]
27Ric C.-Y. Huang [37]
28Madhu K. Iyer [27] [46] [57] [60] [68]
29Jing-Yang Jou [19]
30Sophia W. Kao [2]
31Rohit Kapur [25] [31]
32S. Karako [48]
33Kip Killpack [84]
34A. Kolhatkar [49]
35Nari Krishnamurthy [12]
36Angela Krstic [30] [33] [34] [35] [36] [38] [39] [44]
37Sandip Kundu [51]
38Jianbang Lai [24]
39Benjamin N. Lee [64] [74]
40Leonard Lee [35] [50] [63] [67] [72]
41Sooryong Lee [14] [16] [18] [21] [29]
42Jeremy R. Levitt [83]
43Chih-Chan Lin [53] [62]
44Ming-Shiun Lin [24]
45Jing-Jia Liou [25] [28] [30] [31] [33] [36] [38] [39] [43]
46Frank Liu [85]
47Wei-Ting Liu [65]
48Feng Lu [37] [40] [41] [68]
49Boris D. Lubachevsky [1]
50T. M. Mak [34] [39] [44] [50] [56] [63]
51Vineet Mathur [14]
52M. Ray Mercer [2] [3] [4] [5] [14] [16] [18] [20] [21] [25] [29] [31] [35]
53Hillel Miller [73]
54John Moondanos [40] [41]
55Chee-Kian Ong [47] [54] [61]
56Jaehong Park [14]
57Ganapathy Parthasarathy [27] [46] [57] [60] [68]
58Praveen Parvathala [63]
59Sandip Ray [76]
60Rob A. Rutenbar [51]
61Bret Stewart [14] [21]
62Cliff C. N. Sze (Chin Ngai Sze, Cliff N. Sze) [42]
63Alexander Tetelbaum [87]
64G. Vandling [48] [49]
65Ting-Chi Wang [20] [24] [42]
66Charles H.-P. Wen [65] [66] [67] [70] [71] [73] [78]
67Jason D. Wicker [21]
68Thomas W. Williams [2] [3] [4] [5] [25] [31] [35]
69James Wingfield [29]
70Chi-Feng Wu [19]
71Sean Wu [67]
72Shianling Wu [19]
73Kai Yang [58] [65]
74Jing Zeng [8] [9] [11] [48] [49]
75Juhong Zhu [22] [26]

Colors in the list of coauthors

Copyright © Tue Nov 3 08:52:44 2009 by Michael Ley (ley@uni-trier.de)