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Bart Vermeulen Vis

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*2009
24EEKees Goossens, Bart Vermeulen, Ashkan Beyranvand Nejad: A high-level debug environment for communication-centric debug. DATE 2009: 202-207
2008
23EEMiron Abramovici, Kees Goossens, Bart Vermeulen, Jack Greenbaum, Neal Stollon, Adam Donlin: You can catch more bugs with transaction level honey. CODES+ISSS 2008: 121-124
22EEBart Vermeulen, Kees Goossens, Siddharth Umrani: Debugging Distributed-Shared-Memory Communication at Multiple Granularities in Networks on Chip. NOCS 2008: 3-12
21EEBart Vermeulen: Functional Debug Techniques for Embedded Systems. IEEE Design & Test of Computers 25(3): 208-215 (2008)
20EEBart Vermeulen, Neal Stollon, Rolf Kühnis, Gary Swoboda, Jeff Rearick: Overview of Debug Standardization Activities. IEEE Design & Test of Computers 25(3): 258-267 (2008)
2007
19EEUdaya Seshua, Nagaraju Bussa, Bart Vermeulen: A Run-Time Memory Protection Methodology. ASP-DAC 2007: 498-503
18EEBart Vermeulen, Kees Goossens, Remco van Steeden, Martijn T. Bennebroek: Communication-Centric SoC Debug Using Transactions. European Test Symposium 2007: 69-76
17EEKees Goossens, Bart Vermeulen, Remco van Steeden, Martijn T. Bennebroek: Transaction-Based Communication-Centric Debug. NOCS 2007: 95-106
2005
16EEHenk D. L. Hollmann, Erik Jan Marinissen, Bart Vermeulen: Optimal Interconnect ATPG Under a Ground-Bounce Constraint. J. Electronic Testing 21(1): 17-31 (2005)
2004
15EEBart Vermeulen, Mohammad Zalfany Urfianto, Sandeep Kumar Goel: Automatic generation of breakpoint hardware for silicon debug. DAC 2004: 514-517
14EEBart Vermeulen, Camelia Hora, Bram Kruseman, Erik Jan Marinissen, Robert Van Rijsinge: Trends in Testing Integrated Circuits. ITC 2004: 688-697
2003
13EEErik Jan Marinissen, Bart Vermeulen, Robert Madge, Michael Kessler, Michael Müller: Creating Value Through Test. DATE 2003: 10402-10409
12EEHenk D. L. Hollmann, Erik Jan Marinissen, Bart Vermeulen: Optimal Interconnect ATPG Under a Ground-Bounce Constraint. ITC 2003: 369-378
11EEErik Jan Marinissen, Bart Vermeulen, Henk D. L. Hollmann, Ben Bennetts: Minimizing Pattern Count for Interconnect Test under a Ground Bounce Constraint. IEEE Design & Test of Computers 20(2): 8-18 (2003)
10EESandeep Kumar Goel, Bart Vermeulen: Data Invalidation Analysis for Scan-Based Debug on Multiple-Clock System Chips. J. Electronic Testing 19(4): 407-416 (2003)
9EEBart Vermeulen, Tom Waayers, Sjaak Bakker: Multi-TAP Controller Architecture for Digital System Chips. J. Electronic Testing 19(4): 417-424 (2003)
2002
8EESandeep Kumar Goel, Bart Vermeulen: Hierarchical Data Invalidation Analysis for Scan-Based Debug on Multiple-Clock System Chips. ITC 2002: 1103-1110
7EEBart Vermeulen: TAPS All Over My Chips! So Now What Do I Do? ITC 2002: 1190
6EEBart Vermeulen, Tom Waayers, Sjaak Bakker: EEE 1149.1-Compliant Access Architecture for Multiple Core Debug on Digital System Chips. ITC 2002: 55-63
5EEBart Vermeulen, Tom Waayers, Sandeep Kumar Goel: Core-Based Scan Architecture for Silicon Debug. ITC 2002: 638-647
4EEFidel Muradali, Mike Ricchetti, Bart Vermeulen, Bulent I. Dervisoglu, Bob Gottlieb, Bernd Koenemann, C. J. Clark: Reducing Time to Volume and Time to Market: Is Silicon Debug and Diagnosis the Answer? VTS 2002: 445-446
3EEBart Vermeulen, Sandeep Kumar Goel: Design for Debug: Catching Design Errors in Digital Chips. IEEE Design & Test of Computers 19(3): 37-45 (2002)
2001
2 Bart Vermeulen, Steven Oostdijk, Frank Bouwman: Test and debug strategy of the PNX8525 NexperiaTM digital video platform system chip. ITC 2001: 121-130
1999
1 Gert-Jan van Rootselaar, Bart Vermeulen: Silicon debug: scan chains alone are not enough. ITC 1999: 892-902

Coauthor Index

1Miron Abramovici [23]
2Sjaak Bakker [6] [9]
3Martijn T. Bennebroek [17] [18]
4Ben Bennetts (R. G. Bennetts) [11]
5Frank Bouwman [2]
6Nagaraju Bussa [19]
7C. J. Clark [4]
8Bulent I. Dervisoglu [4]
9Adam Donlin [23]
10Sandeep Kumar Goel [3] [5] [8] [10] [15]
11Kees G. W. Goossens (Kees Goossens) [17] [18] [22] [23] [24]
12Bob Gottlieb [4]
13Jack Greenbaum [23]
14Henk D. L. Hollmann [11] [12] [16]
15Camelia Hora [14]
16Michael Kessler [13]
17Bernd Koenemann [4]
18Bram Kruseman [14]
19Rolf Kühnis [20]
20Robert Madge [13]
21Erik Jan Marinissen [11] [12] [13] [14] [16]
22Michael Müller [13]
23Fidel Muradali [4]
24Ashkan Beyranvand Nejad [24]
25Steven Oostdijk [2]
26Jeff Rearick [20]
27Mike Ricchetti [4]
28Robert Van Rijsinge [14]
29Gert-Jan van Rootselaar [1]
30Udaya Seshua [19]
31Remco van Steeden [17] [18]
32Neal Stollon [20] [23]
33Gary Swoboda [20]
34Siddharth Umrani [22]
35Mohammad Zalfany Urfianto [15]
36Tom Waayers [5] [6] [9]

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Copyright © Tue Nov 3 08:52:44 2009 by Michael Ley (ley@uni-trier.de)