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Prab Varma Vis

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*2004
18 Prab Varma: Verification evolution or industrial revolution? IEEE Design & Test of Computers 21(2): 168- (2004)
2003
17EEPrab Varma: Design Verification Problems: Test To The Rescue?. ITC 2003: 1292
2001
16EEMagdy S. Abadir, Scott Davidson, Vijay Nagasamy, Dhiraj K. Pradhan, Prab Varma: ATPG for Design Errors-Is It Possible? VTS 2001: 283-285
2000
15EEBechir Ayari, Prab Varma: Test Cycle Count Reduction in a Parallel Scan BIST Environment. J. Electronic Testing 16(5): 409-418 (2000)
1998
14EEBechir Ayari, Prab Varma: Test Cycle Count Reduction in a Parallel Scan BIST Environment. Asian Test Symposium 1998: 21-26
13EEPrab Varma: System Chip Test Challenges, Are There Solutions Today? (Panel). DAC 1998: 750-751
12EEPrab Varma: System chip test: are we there yet? ITC 1998: 1144
11EEPrab Varma, Sandeep Bhatia: A structured test re-use methodology for core-based system chips. ITC 1998: 294-302
1997
10EESandeep Bhatia, Prab Varma: Test Compaction in a Parallel Access Scan Environment. Asian Test Symposium 1997: 300-305
1996
9 Sandeep Bhatia, Tushar Gheewala, Prab Varma: A Unifying Methodology for Intellectual Property and Custom Logic Testing. ITC 1996: 639-648
8EESandeep K. Gupta, Slawomir Pilarski, Sudhakar M. Reddy, Jacob Savir, Prab Varma: Delay Fault Testing: How Robust are Our Models? VTS 1996: 502-503
1995
7 Prab Varma: Optimizing Product Profitability - The Test Way. ITC 1995: 922
1994
6 Prab Varma: On Path-Delay Testing in a Standard Scan Environment. ITC 1994: 164-173
5EEPrab Varma, Tushar Gheewala: The economics of scan-path design for testability. J. Electronic Testing 5(2-3): 179-193 (1994)
1993
4 Prab Varma, Tushar Gheewala: Delay Testing Using a Matrix of Accessible Storage. ITC 1993: 243-252
3 Prab Varma: Scan DFT: Why More Can Cost Less. ITC 1993: 267
1987
2EES. B. Tan, K. Totton, Keith Baker, Prab Varma, R. Porter: A Fast Signature Simulation Tool for Built-In Self-Testing Circuits. DAC 1987: 17-25
1984
1 Prab Varma, Anthony P. Ambler, Keith Baker: An Analysis of the Economics of Self Test. ITC 1984: 20-30

Coauthor Index

1Magdy S. Abadir [16]
2Anthony P. Ambler [1]
3Bechir Ayari [14] [15]
4Keith Baker [1] [2]
5Sandeep Bhatia [9] [10] [11]
6Scott Davidson [16]
7Tushar Gheewala [4] [5] [9]
8Sandeep K. Gupta [8]
9Vijay Nagasamy [16]
10Slawomir Pilarski [8]
11R. Porter [2]
12Dhiraj K. Pradhan [16]
13Sudhakar M. Reddy [8]
14Jacob Savir [8]
15S. B. Tan [2]
16K. Totton [2]

Colors in the list of coauthors

Copyright © Tue Nov 3 08:52:44 2009 by Michael Ley (ley@uni-trier.de)