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Massimo Vanzi Vis

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*2007
18EEReimund Wittmann, Massimo Vanzi, Hans-Joachim Wassener, Navraj Nandra, Joachim Kunkel, Jose Franca, Christian Münker: Life begins at 65: unless you are mixed signal? DATE 2007: 936-941
2006
17EEM. Meneghini, Simona Podda, A. Morelli, Ruggero Pintus, L. Trevisanello, Gaudenzio Meneghesso, Massimo Vanzi, Enrico Zanoni: High brightness GaN LEDs degradation during dc and pulsed stress. Microelectronics Reliability 46(9-11): 1720-1724 (2006)
16EEG. Cassanelli, G. Mura, Fausto Fantini, Massimo Vanzi, B. Plano: Failure Analysis-assisted FMEA. Microelectronics Reliability 46(9-11): 1795-1799 (2006)
2005
15EEFrancesca Mighela, Cristian Perra, Massimo Vanzi: Video Streaming in Electron Microscopy Applications. VLBV 2005: 115-120
14EEG. Cassanelli, G. Mura, F. Cesaretti, Massimo Vanzi, Fausto Fantini: Reliability predictions in electronic industrial applications. Microelectronics Reliability 45(9-11): 1321-1326 (2005)
13EERuggero Pintus, Simona Podda, Massimo Vanzi: Image alignment for 3D reconstruction in a SEM. Microelectronics Reliability 45(9-11): 1581-1584 (2005)
2003
12EEGaudenzio Meneghesso, S. Levada, Enrico Zanoni, G. Scamarcio, G. Mura, Simona Podda, Massimo Vanzi, S. Du, I. Eliashevich: Reliability of visible GaN LEDs in plastic package. Microelectronics Reliability 43(9-11): 1737-1742 (2003)
11EEG. Mura, Massimo Vanzi, Maria Stangoni, Mauro Ciappa, Wolfgang Fichtner: On the behaviour of the selective iodine-based gold etch for the failure analysis of aged optoelectronic devices. Microelectronics Reliability 43(9-11): 1771-1776 (2003)
2002
10EEFausto Fantini, Massimo Vanzi: Editorial. Microelectronics Reliability 42(9-11): 1249 (2002)
9EEGaudenzio Meneghesso, A. Cocco, G. Mura, Simona Podda, Massimo Vanzi: Backside Failure Analysis of GaAs ICs after ESD tests. Microelectronics Reliability 42(9-11): 1293-1298 (2002)
8EEL. Sponton, L. Cerati, G. Croce, G. Mura, Simona Podda, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni: ESD protection structures for 20 V and 40 V power supply suitable for BCD6 smart power technology. Microelectronics Reliability 42(9-11): 1303-1306 (2002)
7EEM. Giglio, G. Martines, G. Mura, Simona Podda, Massimo Vanzi: An automated lifetest equipment for optical emitters. Microelectronics Reliability 42(9-11): 1311-1315 (2002)
6EEMassimo Vanzi, G. Salmini, R. Pastorelli, S. Pessina, P. Furcas: Reliability tests on WDM filters. Microelectronics Reliability 42(9-11): 1317-1321 (2002)
5EEC. Caprile, I. De Munari, M. Improntac, Simona Podda, A. Scorzoni, Massimo Vanzi: A specimen-current branching approach for FA of long Electromigration test lines. Microelectronics Reliability 42(9-11): 1715-1718 (2002)
2001
4EEDaniel L. Barton, Shigeru Nakajima, Massimo Vanzi: Editorial. Microelectronics Reliability 41(8): 1143-1144 (2001)
1988
3EEClaudio Lombardi, Stefano Manzini, Antonio Saporito, Massimo Vanzi: A physically based mobility model for numerical simulation of nonplanar devices. IEEE Trans. on CAD of Integrated Circuits and Systems 7(11): 1164-1171 (1988)
1987
2EEZhiping Yu, Robert W. Dutton, Massimo Vanzi: An Extension to Newton's Method in Device Simulators--On An Efficient Algorithm to Evaluate Small-Signal Parameters and to Predict Initial Guess. IEEE Trans. on CAD of Integrated Circuits and Systems 6(1): 41-45 (1987)
1986
1EEClaudio Turchetti, P. Prioretti, Guido Masetti, E. Profumo, Massimo Vanzi: A Meyer-Like Approach for the Transient Analysis of Digital MOS IC's. IEEE Trans. on CAD of Integrated Circuits and Systems 5(4): 499-507 (1986)

Coauthor Index

1Daniel L. Barton [4]
2C. Caprile [5]
3G. Cassanelli [14] [16]
4L. Cerati [8]
5F. Cesaretti [14]
6Mauro Ciappa [11]
7A. Cocco [9]
8G. Croce [8]
9S. Du [12]
10Robert W. Dutton [2]
11I. Eliashevich [12]
12Fausto Fantini [10] [14] [16]
13Wolfgang Fichtner [11]
14Jose Franca [18]
15P. Furcas [6]
16M. Giglio [7]
17M. Improntac [5]
18Joachim Kunkel [18]
19S. Levada [12]
20Claudio Lombardi [3]
21Stefano Manzini [3]
22G. Martines [7]
23Guido Masetti [1]
24Gaudenzio Meneghesso [8] [9] [12] [17]
25M. Meneghini [17]
26Francesca Mighela [15]
27A. Morelli [17]
28I. De Munari [5]
29Christian Münker [18]
30G. Mura [7] [8] [9] [11] [12] [14] [16]
31Shigeru Nakajima [4]
32Navraj Nandra [18]
33R. Pastorelli [6]
34Cristian Perra [15]
35S. Pessina [6]
36Ruggero Pintus [13] [17]
37B. Plano [16]
38Simona Podda [5] [7] [8] [9] [12] [13] [17]
39P. Prioretti [1]
40E. Profumo [1]
41G. Salmini [6]
42Antonio Saporito [3]
43G. Scamarcio [12]
44A. Scorzoni [5]
45L. Sponton [8]
46Maria Stangoni [11]
47L. Trevisanello [17]
48Claudio Turchetti [1]
49Hans-Joachim Wassener [18]
50Reimund Wittmann [18]
51Zhiping Yu [2]
52Enrico Zanoni [8] [12] [17]

Colors in the list of coauthors

Copyright © Tue Nov 3 08:52:44 2009 by Michael Ley (ley@uni-trier.de)