| |
| 2004 | ||
|---|---|---|
| 1 | EE | Yervant Zorian, Dimitris Gizopoulos, Cary Vandenberg, Philippe Magarshack: Guest Editors' Introduction: Design for Yield and Reliability. IEEE Design & Test of Computers 21(3): 177-182 (2004) |
| 1 | Dimitris Gizopoulos | [1] |
| 2 | Philippe Magarshack | [1] |
| 3 | Yervant Zorian | [1] |