| 2008 |
|---|
| 46 | EE | Yves Le Traon,
Tejeddine Mouelhi,
Alexander Pretschner,
Benoit Baudry:
Test-Driven Assessment of Access Control in Legacy Applications.
ICST 2008: 238-247 |
| 45 | EE | Alexander Pretschner,
Tejeddine Mouelhi,
Yves Le Traon:
Model-Based Tests for Access Control Policies.
ICST 2008: 338-347 |
| 2007 |
|---|
| 44 | EE | Erwan Brottier,
Benoit Baudry,
Yves Le Traon,
David Touzet,
Bertrand Nicolas:
Producing a Global Requirement Model from Multiple Requirement Specifications.
EDOC 2007: 390-404 |
| 43 | EE | Benoit Baudry,
Clémentine Nebut,
Yves Le Traon:
Model-Driven Engineering for Requirements Analysis.
EDOC 2007: 459-466 |
| 42 | EE | Jacques Simonin,
Yves Le Traon,
Jean-Marc Jézéquel:
An Enterprise Architecture Alignment Measure for Telecom Service Development.
EDOC 2007: 476-483 |
| 41 | EE | Simon Pickin,
Claude Jard,
Thierry Jéron,
Jean-Marc Jézéquel,
Yves Le Traon:
Test Synthesis from UML Models of Distributed Software.
IEEE Trans. Software Eng. 33(4): 252-269 (2007) |
| 2006 |
|---|
| 40 | | Yves Le Traon:
Le test et le diagnostic en vue de la m maintenance : des objets aux modéles.
CAL 2006: 190 |
| 39 | EE | Jean-Marie Mottu,
Benoit Baudry,
Yves Le Traon:
Mutation Analysis Testing for Model Transformations.
ECMDA-FA 2006: 376-390 |
| 38 | EE | Benoit Baudry,
Franck Fleurey,
Yves Le Traon:
Improving test suites for efficient fault localization.
ICSE 2006: 82-91 |
| 37 | EE | Erwan Brottier,
Franck Fleurey,
Jim Steel,
Benoit Baudry,
Yves Le Traon:
Metamodel-based Test Generation for Model Transformations: an Algorithm and a Tool.
ISSRE 2006: 85-94 |
| 36 | | Yves Le Traon:
Test et diagnostic - des objets aux modèles.
LMO 2006: 17 |
| 35 | | Yves Le Traon,
Benoit Baudry:
Test d'intégration d'un système à objets - planification de l'ordre d'intégration.
LMO 2006: 217-230 |
| 34 | EE | Jean-Marie Mottu,
Benoit Baudry,
Yves Le Traon:
Reusable MDA Components: A Testing-for-Trust Approach.
MoDELS 2006: 589-603 |
| 33 | EE | Clémentine Nebut,
Yves Le Traon,
Jean-Marc Jézéquel:
System Testing of Product Lines: From Requirements to Test Cases.
Software Product Lines 2006: 447-477 |
| 32 | EE | Clémentine Nebut,
Franck Fleurey,
Yves Le Traon,
Jean-Marc Jézéquel:
Automatic Test Generation: A Use Case Driven Approach.
IEEE Trans. Software Eng. 32(3): 140-155 (2006) |
| 31 | EE | Yves Le Traon,
Benoit Baudry,
Jean-Marc Jézéquel:
Design by Contract to Improve Software Vigilance.
IEEE Trans. Software Eng. 32(8): 571-586 (2006) |
| 2005 |
|---|
| 30 | EE | Benoit Baudry,
Franck Fleurey,
Jean-Marc Jézéquel,
Yves Le Traon:
Automatic Test Case Optimization: A Bacteriologic Algorithm.
IEEE Software 22(2): 76-82 (2005) |
| 29 | EE | Benoit Baudry,
Yves Le Traon:
Measuring design testability of a UML class diagram.
Information & Software Technology 47(13): 859-879 (2005) |
| 28 | EE | Benoit Baudry,
Franck Fleurey,
Jean-Marc Jézéquel,
Yves Le Traon:
From genetic to bacteriological algorithms for mutation-based testing.
Softw. Test., Verif. Reliab. 15(2): 73-96 (2005) |
| 2004 |
|---|
| 27 | EE | Franck Fleurey,
Yves Le Traon,
Benoit Baudry:
From Testing to Diagnosis: An Automated Approach.
ASE 2004: 306-309 |
| 26 | EE | David Lugato,
Frédéric Maraux,
Yves Le Traon,
Véronique Normand,
Hubert Dubois,
Jean-Yves Pierron,
Jean-Pierre Gallois,
Clémentine Nebut:
Automated Functional Test Case Synthesis from THALES industrial Requirements.
IEEE Real-Time and Embedded Technology and Applications Symposium 2004: 104-111 |
| 2003 |
|---|
| 25 | EE | Clémentine Nebut,
Simon Pickin,
Yves Le Traon,
Jean-Marc Jézéquel:
Automated Requirements-based Generation of Test Cases for Product Families.
ASE 2003: 263-266 |
| 24 | EE | Benoit Baudry,
Yves Le Traon,
Gerson Sunyé,
Jean-Marc Jézéquel:
Measuring and Improving Design Patterns Testability.
IEEE METRICS 2003: 50- |
| 23 | EE | Clémentine Nebut,
Franck Fleurey,
Yves Le Traon,
Jean-Marc Jézéquel:
Requirements by Contracts allow Automated System Testing.
ISSRE 2003: 85-98 |
| 22 | EE | Clémentine Nebut,
Franck Fleurey,
Yves Le Traon,
Jean-Marc Jézéquel:
A Requirement-Based Approach to Test Product Families.
PFE 2003: 198-210 |
| 21 | EE | Yves Le Traon,
Farid Ouabdesselam,
Chantal Robach,
Benoit Baudry:
From diagnosis to diagnosability: axiomatization, measurement and application.
Journal of Systems and Software 65(1): 31-50 (2003) |
| 2002 |
|---|
| 20 | EE | Benoit Baudry,
Franck Fleurey,
Jean-Marc Jézéquel,
Yves Le Traon:
Automatic Test Cases Optimization Using a Bacteriological Adaptation Model: Application to .NET Component.
ASE 2002: 253-256 |
| 19 | EE | Simon Pickin,
Claude Jard,
Yves Le Traon,
Thierry Jéron,
Jean-Marc Jézéquel,
Alain Le Guennec:
System Test Synthesis from UML Models of Distributed Software.
FORTE 2002: 97-113 |
| 18 | EE | Benoit Baudry,
Yves Le Traon,
Gerson Sunyé:
Testability Analysis of a UML Class Diagram.
IEEE METRICS 2002: 54- |
| 17 | EE | Benoit Baudry,
Franck Fleurey,
Jean-Marc Jézéquel,
Yves Le Traon:
Genes and Bacteria for Automatic Test Cases Optimization in the .NET Environment.
ISSRE 2002: 195-206 |
| 2001 |
|---|
| 16 | EE | Vu Le Hanh,
Kamel Akif,
Yves Le Traon,
Jean-Marc Jézéquel:
Selecting an Efficient OO Integration Testing Strategy: An Experimental Comparison of Actual Strategies.
ECOOP 2001: 381-401 |
| 15 | EE | Benoit Baudry,
Yves Le Traon,
Jean-Marc Jézéquel:
Robustness and Diagnosability of OO Systems Designed by Contracts.
IEEE METRICS 2001: 272-284 |
| 14 | EE | Gerson Sunyé,
Damien Pollet,
Yves Le Traon,
Jean-Marc Jézéquel:
Refactoring UML Models.
UML 2001: 134-148 |
| 13 | EE | Jean-Marc Jézéquel,
Daniel Deveaux,
Yves Le Traon:
Reliable Objects: Lightweight Testing for OO Languages.
IEEE Software 18(4): 76-83 (2001) |
| 2000 |
|---|
| 12 | EE | Yves Le Traon,
Farid Ouabdesselam,
Chantal Robach:
Analyzing Testability on Data Flow Designs.
ISSRE 2000: 162-173 |
| 11 | EE | Benoit Baudry,
Vu Le Hanh,
Jean-Marc Jézéquel,
Yves Le Traon:
Building Trust into OO Components Using a Genetic Analogy.
ISSRE 2000: 4-14 |
| 10 | EE | Benoit Baudry,
Vu Le Hanh,
Yves Le Traon:
Testing-for-Trust: The Genetic Selection Model Applied to Component Qualification.
TOOLS (33) 2000: 108-119 |
| 1999 |
|---|
| 9 | EE | Yves Le Traon,
Daniel Deveaux,
Jean-Marc Jézéquel:
Self-Testable Components: From Pragmatic Tests to Design-for-Testability Methodology.
TOOLS (29) 1999: 96-107 |
| 8 | | Daniel Deveaux,
Régis Fleurquin,
Patrice Frison,
Jean-Marc Jézéquel,
Yves Le Traon:
Composants objets fiables : une approche pragmatique.
L'OBJET 5(3/4): (1999) |
| 1998 |
|---|
| 7 | EE | Maisaa Khalil,
Yves Le Traon,
Chantal Robach:
Towards an automatic diagnosis for high-level design validation.
ITC 1998: 1010- |
| 1997 |
|---|
| 6 | EE | Yves Le Traon,
Chantal Robach:
Testability Measurements for Data Flow Designs.
IEEE METRICS 1997: 91-98 |
| 5 | EE | Ghassan Al Hayek,
Yves Le Traon,
Chantal Robach:
Impact of System Partitioning on Test Cost.
IEEE Design & Test of Computers 14(1): 64-74 (1997) |
| 1996 |
|---|
| 4 | EE | Ghassan Al Hayek,
Yves Le Traon,
Chantal Robach:
Considering Test Economics in the Process of Hardware/Software Partitioning.
EUROMICRO 1996: 28- |
| 3 | | Yves Le Traon,
Ghassan Al Hayek,
Chantal Robach:
Testability-Oriented Hardware/Software Partitioning.
ITC 1996: 725-731 |
| 1995 |
|---|
| 2 | EE | Yves Le Traon,
Chantal Robach:
Testability analysis of co-designed systems.
Asian Test Symposium 1995: 206- |
| 1 | | Yves Le Traon,
Chantal Robach:
From Hardware to Software Testability.
ITC 1995: 710-719 |
