Robert Trahan
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1992
1
Robert Trahan,
Rex Kiang
: An Analysis of the Die Testing Process Using Taguchi Techniques and Circuit Diagnostics.
ITC 1992
: 260-269
Coauthor
Index
1
Rex Kiang
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1
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Copyright ©
Thu Jun 5 07:42:39 2008 by
Michael Ley
(
ley@uni-trier.de
)