| |
| * | 2007 | |
|---|---|---|
| 2 | EE | Ying Zhou, Zhuo Li, Yuxin Tian, Weiping Shi, Frank Liu: A New Methodology for Interconnect Parasitics Extraction Considering Photo-Lithography Effects. ASP-DAC 2007: 450-455 |
| 2003 | ||
| 1 | EE | Yuxin Tian, Michael R. Grimaila, Weiping Shi, M. Ray Mercer: Minimizing Defective Part Level Using a Linear Programming-Based Optimal Test Selection Method. Asian Test Symposium 2003: 354-359 |
| 1 | Michael R. Grimaila | [1] |
| 2 | Zhuo Li | [2] |
| 3 | Frank Liu | [2] |
| 4 | M. Ray Mercer | [1] |
| 5 | Weiping Shi | [1] [2] |
| 6 | Ying Zhou | [2] |