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João Paulo Teixeira Vis

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*2009
55 Carlos Leong, Pedro Machado, Vasco Bexiga, João Paulo Teixeira, Isabel C. Teixeira, Joel Rego, Pedro Neves, Fernando Piedade, Pedro Lousã, Pedro Rodrigues, Andreia Trindade, R. Bugalho, J. F. Pinheiro, Manuel Ferreira, João Varela: Data Acquisition Electronics for PET Mammography Imaging. BIODEVICES 2009: 192-197
2008
54EEJorge Semião, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Process Tolerant Design Using Thermal and Power-Supply Tolerance in Pipeline Based Circuits. DDECS 2008: 34-37
53EEJorge Semião, Marcial Jesús Rodríguez-Irago, Juan J. Rodríguez-Andina, Leonardo Bisch Piccoli, Fabian Vargas, Marcelino Bicho Dos Santos, Isabel Maria Cacho Teixeira, João Paulo Teixeira: Signal Integrity Enhancement in Digital Circuits. IEEE Design & Test of Computers 25(5): 452-461 (2008)
2007
52 Jorge Semião, J. Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Improving Tolerance to Power-Supply and Temperature Variations in Synchronous Circuits. DDECS 2007: 295-300
51EEJorge Semião, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino Bicho Dos Santos, Isabel C. Teixeira, João Paulo Teixeira: Improving the Tolerance of Pipeline Based Circuits to Power Supply or Temperature Variations. DFT 2007: 303-311
50EEJorge Semião, J. Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: On-line Dynamic Delay Insertion to Improve Signal Integrity in Synchronous Circuits. IOLTS 2007: 167-172
49EEJorge Semião, J. Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Enhancing the Tolerance to Power-Supply Instability in Digital Circuits. ISVLSI 2007: 207-212
2006
48 F. Guerreiro, Jorge Semião, A. Pierce, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Functional-Oriented BIST of Sequential Circuits Aiming at Dynamic Faults Coverage. DDECS 2006: 279-284
47EEMarcial Jesús Rodríguez-Irago, Juan J. Rodríguez-Andina, Fabian Vargas, Jorge Semião, Isabel C. Teixeira, João Paulo Teixeira: Dynamic Fault Detection in Digital Systems Using Dynamic Voltage Scaling and Multi-Temperature Schemes. IOLTS 2006: 257-262
2005
46 Carlos Leong, P. Bento, Pedro Rodrigues, Andreia Trindade, J. C. Silva, Pedro Lousã, Joel Rego, J. Nobre, João Varela, João Paulo Teixeira, Isabel C. Teixeira: Design and Test Methodology for a Reconfigurable PEM Data Acquisition Electronics System. FPL 2005: 523-526
45EEMarcial Jesús Rodríguez-Irago, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Dynamic Fault Test and Diagnosis in Digital Systems Using Multiple Clock Schemes and Multi-VDD Test. IOLTS 2005: 281-286
44EED. Barros Júnior, Marcial Jesús Rodríguez-Irago, Marcelino B. Santos, Isabel C. Teixeira, Fabian Vargas, João Paulo Teixeira: Fault Modeling and Simulation of Power Supply Voltage Transients in Digital Systems on a Chip. J. Electronic Testing 21(4): 349-363 (2005)
2004
43EEA. Parreira, João Paulo Teixeira, Marcelino B. Santos: FPGAs BIST Evaluation. FPL 2004: 333-343
42EEDaniel Barros Jr., Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Modeling and Simulation of Time Domain Faults in Digital Systems. IOLTS 2004: 5-10
41 A. Parreira, João Paulo Teixeira, Marcelino B. Santos: Built-In Self-Test Quality Assessment Using Hardware Fault Emulation In FPGAs. Computers and Artificial Intelligence 23(5): (2004)
40EEMarcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira, Salvador Manich, L. Balado, Joan Figueras: On High-Quality, Low Energy Built-In Self Test Preparation at RT-Level. J. Electronic Testing 20(4): 345-355 (2004)
2003
39EEMarcelino B. Santos, José M. Fernandes, Isabel C. Teixeira, João Paulo Teixeira: RTL Test Pattern Generation for High Quality Loosely Deterministic BIST. DATE 2003: 10994-10999
38EEA. Parreira, João Paulo Teixeira, A. Pantelimon, Marcelino B. Santos, José T. de Sousa: Fault Simulation Using Partially Reconfigurable Hardware. FPL 2003: 839-848
37EEFernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Property Coverage for Quality Assessment of Fault Tolerant or Fail Safe Systems. IOLTS 2003: 164-165
36EEJoão Paulo Teixeira, Diamantino Freitas: Evaluation of a Segmental Durations Model for TTS. PROPOR 2003: 40-48
35EEDaniela Braga, Diamantino Freitas, João Paulo Teixeira, Aldina Marques: On the Use of Prosodic Labelling in Corpus-Based Linguistic Studies of Spontaneous Speech. TSD 2003: 388-393
2002
34EEFernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Self-Checking and Fault Tolerance Quality Assessment Using Fault Sampling. DFT 2002: 216-224
33EEMarcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira, Salvador Manich, Rosa Rodríguez-Montañés, Joan Figueras: RTL Level Preparation of High-Quality/Low-Energy/Low-Power BIST. ITC 2002: 814-823
32EEDiamantino Freitas, António Moura, Daniela Braga, Helder Ferreira, João Paulo Teixeira, Maria João Barros, Paulo Gouveia, Vagner Latsch: A Project of Speech Input and Output in an E-commerce Application. PorTAL 2002: 141-150
31EEMarcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira: RTL Design Validation, DFT and Test Pattern Generation for High Defects Coverage. J. Electronic Testing 18(2): 179-187 (2002)
30EEFernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Design and Test of a Certifiable ASIC for a Safety-Critical Gas Burner Control System. J. Electronic Testing 18(3): 285-294 (2002)
2001
29EEYervant Zorian, Paolo Prinetto, João Paulo Teixeira, Isabel C. Teixeira, Carlos Eduardo Pereira, Octávio Páscoa Dias, Jorge Semião, Peter Muhmenthaler, W. Radermacher: Embedded tutorial: TRP: integrating embedded test and ATE. DATE 2001: 34-37
28 Hugo Lérias, João Luz, Pedro Moura, Ana Mendes, Isabel C. Teixeira, João Paulo Teixeira: Towards E-Management as Enabler for Accelerated Change. ICEIS (2) 2001: 807-814
27EEFernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Design and Test of Certifiable ASICs for Safety-Critical Gas Burners Contro. IOLTW 2001: 197-201
26 Fernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Implicit functionality and multiple branch coverage (IFMB): a testability metric for RT-level. ITC 2001: 377-385
25EEMarcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira: RTL-Based Functional Test Generation for High Defects Coverage in Digital Systems. J. Electronic Testing 17(3-4): 311-319 (2001)
2000
24 Octávio Páscoa Dias, Isabel C. Teixeira, João Paulo Teixeira, Leandro Buss Becker, Carlos Eduardo Pereira: Optimizing Functional distribution in Complex System Design. DIPES 2000: 75-86
23EELeandro Buss Becker, Carlos Eduardo Pereira, Octávio Páscoa Dias, Isabel C. Teixeira, João Paulo Teixeira: MOSYS A Methodology for Automatic Object Identification from System Specification. ISORC 2000: 198-201
22EEOctávio Páscoa Dias, Jorge Semião, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Quality of Electronic Design: From Architectural Level to Test Coverage. ISQED 2000: 197-
1999
21EEMarcelino B. Santos, João Paulo Teixeira: Defect-Oriented Mixed-Level Fault Simulation of Digital Systems-on-a-Chip Using HDL. DATE 1999: 549-
20EEFernando M. Gonçalves, João Paulo Teixeira: Teaching Microelectronic-Based Integrated Systems Design and Test. MSE 1999: 65-66
19EEMarcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira: Defect-Oriented Verilog Fault Simulation of SoC Macros using a Stratified Fault Sampling Technique. VTS 1999: 326-332
18EEOctávio Páscoa Dias, Isabel C. Teixeira, João Paulo Teixeira: Metrics and Criteria for Quality Assessment of Testable Hw/Sw Systems Architectures. J. Electronic Testing 14(1-2): 149-158 (1999)
17EEFernando M. Gonçalves, João Paulo Teixeira: Defect-Oriented Sampling of Non-Equally Probable Faults in VLSI Systems. J. Electronic Testing 15(1-2): 41-52 (1999)
1998
16 Octávio Páscoa Dias, Isabel C. Teixeira, João Paulo Teixeira, Carlos Eduardo Pereira: An OO Based Methodology for Real-Time HW/SW Systems Modeling. DIPES 1998: 213-222
15EEFernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Defect-oriented test quality assessment using fault sampling and simulation. ITC 1998: 35-42
14EEFernando M. Gonçalves, João Paulo Teixeira: Sampling Techniques of Non-Equally Probable Faults in VLSI System. VTS 1998: 283-288
1997
13EEFernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira: Realistic Fault Extraction for High-Quality Design and Test of VLSI Systems. DFT 1997: 29-37
1996
12 F. Celeiro, L. Dias, J. Ferreira, Marcelino B. Santos, João Paulo Teixeira: Defect-Oriented IC Test and Diagnosis Using VHDL Fault Simulation. ITC 1996: 620-628
11EEJosé T. de Sousa, Fernando M. Gonçalves, João Paulo Teixeira, Cristoforo Marzocca, Francesco Corsi, Thomas W. Williams: Defect level evaluation in an IC design environment. IEEE Trans. on CAD of Integrated Circuits and Systems 15(10): 1286-1293 (1996)
1995
10EEMarcelino B. Santos, M. Simões, Isabel C. Teixeira, João Paulo Teixeira: Test preparation for high coverage of physical defects in CMOS digital ICs. VTS 1995: 330-337
1994
9 Antonio Casimiro, F. Conçalves, João Paulo Teixeira, Marcelino B. Santos: On the Analysis of Routing Cells and Adjacency Faults in CMOS Digital Circuits. DFT 1994: 263-270
8 José T. de Sousa, Fernando M. Gonçalves, João Paulo Teixeira, Thomas W. Williams: Fault Modeling and Defect Level Projections in Digital ICs. EDAC-ETC-EUROASIC 1994: 436-442
7 M. Calha, Marcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira: Back Annotation of Physical Defects into Gate-Level, Realistic Faults in Digital ICs. ITC 1994: 720-728
1993
6 Antonio Casimiro, M. Simões, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Experiments on Bridging Fault Analysis and Layout-Level DFT for CMOS Designs. DFT 1993: 109-116
5 P. Nicolau, J. Barbosa, M. Saraiva, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Realistic Fault Analysis of CMOS Analog Building Blocks. DFT 1993: 311-318
1992
4 M. Saraiva, P. Casimiro, Marcelino B. Santos, José T. de Sousa, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira: Physical DFT for High Coverage of Realistic Faults. ITC 1992: 642-651
1991
3 José T. de Sousa, Fernando M. Gonçalves, João Paulo Teixeira: IC Defects-Based Testability Analysis. ITC 1991: 500-509
2EEJoão Paulo Teixeira, Isabel C. Teixeira, C. F. Beltrá Almeida, Fernando M. Gonçalves, J. Gonçalves: A methodology for testability enhancement at layout level. J. Electronic Testing 1(4): 287-299 (1991)
1990
1EEJoão Paulo Teixeira, Isabel C. Teixeira, C. F. Beltrá Almeida, Fernando M. Gonçalves, J. Gonçalves, R. Crespo: A strategy for testability enhancement at layout level. EURO-DAC 1990: 413-417

Coauthor Index

1C. F. Beltrá Almeida [1] [2]
2L. Balado [40]
3J. Barbosa [5]
4Maria João Barros [32]
5Daniel Barros Jr. [42]
6Leandro Buss Becker [23] [24]
7P. Bento [46]
8Vasco Bexiga [55]
9Daniela Braga [32] [35]
10R. Bugalho [55]
11M. Calha [7]
12Antonio Casimiro [6] [9]
13P. Casimiro [4]
14F. Celeiro [12]
15F. Conçalves [9]
16Francesco Corsi [11]
17R. Crespo [1]
18L. Dias [12]
19Octávio Páscoa Dias [16] [18] [22] [23] [24] [29]
20José M. Fernandes [39]
21Helder Ferreira [32]
22J. Ferreira [12]
23Manuel Ferreira [55]
24Joan Figueras [33] [40]
25J. Freijedo [49] [50] [52]
26Diamantino Freitas [32] [35] [36]
27Fernando M. Gonçalves [1] [2] [3] [4] [7] [8] [11] [13] [14] [15] [17] [19] [20] [25] [26] [27] [30] [31] [34] [37]
28J. Gonçalves [1] [2]
29Paulo Gouveia [32]
30F. Guerreiro [48]
31D. Barros Júnior [44]
32Vagner Latsch [32]
33Carlos Leong [46] [55]
34Hugo Lérias [28]
35Pedro Lousã [46] [55]
36João Luz [28]
37Pedro Machado [55]
38Salvador Manich [33] [40]
39Aldina Marques [35]
40Cristoforo Marzocca [11]
41Ana Mendes [28]
42António Moura [32]
43Pedro Moura [28]
44Peter Muhmenthaler [29]
45Pedro Neves [55]
46P. Nicolau [5]
47J. Nobre [46]
48A. Pantelimon [38]
49A. Parreira [38] [41] [43]
50Carlos Eduardo Pereira [16] [23] [24] [29]
51Leonardo Bisch Piccoli [53]
52Fernando Piedade [55]
53A. Pierce [48]
54J. F. Pinheiro [55]
55Paolo Prinetto [29]
56W. Radermacher [29]
57Joel Rego [46] [55]
58Pedro Rodrigues [46] [55]
59Juan J. Rodríguez-Andina [45] [47] [49] [50] [51] [52] [53] [54]
60Marcial Jesús Rodríguez-Irago [44] [45] [47] [53]
61Rosa Rodríguez-Montañés [33]
62Marcelino B. Santos [4] [5] [6] [7] [9] [10] [12] [15] [19] [21] [22] [25] [26] [27] [30] [31] [33] [34] [37] [38] [39] [40] [41] [42] [43] [44] [45] [48] [49] [50] [52] [54]
63Marcelino Bicho Dos Santos [51] [53]
64M. Saraiva [4] [5]
65Jorge Semião [22] [29] [47] [48] [49] [50] [51] [52] [53] [54]
66J. C. Silva [46]
67M. Simões [6] [10]
68José T. de Sousa [3] [4] [8] [11] [38]
69Isabel C. Teixeira [1] [2] [4] [5] [6] [7] [10] [13] [15] [16] [18] [19] [22] [23] [24] [25] [26] [27] [28] [29] [30] [31] [33] [34] [37] [39] [40] [42] [44] [45] [46] [47] [48] [49] [50] [51] [52] [54] [55]
70Isabel Maria Cacho Teixeira [53]
71Andreia Trindade [46] [55]
72João Varela [46] [55]
73Fabian Vargas [42] [44] [45] [47] [49] [50] [51] [52] [53] [54]
74Thomas W. Williams [8] [11]
75Yervant Zorian [29]

Colors in the list of coauthors

Copyright © Tue Nov 3 08:52:44 2009 by Michael Ley (ley@uni-trier.de)