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Isabel C. Teixeira Vis

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*2009
40 Carlos Leong, Pedro Machado, Vasco Bexiga, João Paulo Teixeira, Isabel C. Teixeira, Joel Rego, Pedro Neves, Fernando Piedade, Pedro Lousã, Pedro Rodrigues, Andreia Trindade, R. Bugalho, J. F. Pinheiro, Manuel Ferreira, João Varela: Data Acquisition Electronics for PET Mammography Imaging. BIODEVICES 2009: 192-197
39 E. Albuquerque, Vasco Bexiga, R. Bugalho, B. Carriço, C. S. Ferreira, Manuel Ferreira, J. Godinho, F. Gonçalves, Carlos Leong, Pedro Lousã, Pedro Machado, R. Moura, Pedro Neves, C. Ortigão, Fernando Piedade, J. F. Pinheiro, P. Relvas, A. Rivetti, Pedro Rodrigues, J. C. Silva, M. M. Silva, Isabel C. Teixeira, J. P. Teixeira, Andreia Trindade, João Varela: On-Detector Electronics of the Clear PEM Scanner. BIODEVICES 2009: 355-358
2008
38EEJorge Semião, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Process Tolerant Design Using Thermal and Power-Supply Tolerance in Pipeline Based Circuits. DDECS 2008: 34-37
2007
37 Jorge Semião, J. Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Improving Tolerance to Power-Supply and Temperature Variations in Synchronous Circuits. DDECS 2007: 295-300
36EEJorge Semião, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino Bicho Dos Santos, Isabel C. Teixeira, João Paulo Teixeira: Improving the Tolerance of Pipeline Based Circuits to Power Supply or Temperature Variations. DFT 2007: 303-311
35EEJorge Semião, J. Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: On-line Dynamic Delay Insertion to Improve Signal Integrity in Synchronous Circuits. IOLTS 2007: 167-172
34EEJorge Semião, J. Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Enhancing the Tolerance to Power-Supply Instability in Digital Circuits. ISVLSI 2007: 207-212
2006
33 F. Guerreiro, Jorge Semião, A. Pierce, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Functional-Oriented BIST of Sequential Circuits Aiming at Dynamic Faults Coverage. DDECS 2006: 279-284
32EEMarcial Jesús Rodríguez-Irago, Juan J. Rodríguez-Andina, Fabian Vargas, Jorge Semião, Isabel C. Teixeira, João Paulo Teixeira: Dynamic Fault Detection in Digital Systems Using Dynamic Voltage Scaling and Multi-Temperature Schemes. IOLTS 2006: 257-262
2005
31 Carlos Leong, P. Bento, Pedro Rodrigues, Andreia Trindade, J. C. Silva, Pedro Lousã, Joel Rego, J. Nobre, João Varela, João Paulo Teixeira, Isabel C. Teixeira: Design and Test Methodology for a Reconfigurable PEM Data Acquisition Electronics System. FPL 2005: 523-526
30EEMarcial Jesús Rodríguez-Irago, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Dynamic Fault Test and Diagnosis in Digital Systems Using Multiple Clock Schemes and Multi-VDD Test. IOLTS 2005: 281-286
29EED. Barros Júnior, Marcial Jesús Rodríguez-Irago, Marcelino B. Santos, Isabel C. Teixeira, Fabian Vargas, João Paulo Teixeira: Fault Modeling and Simulation of Power Supply Voltage Transients in Digital Systems on a Chip. J. Electronic Testing 21(4): 349-363 (2005)
2004
28EEDaniel Barros Jr., Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Modeling and Simulation of Time Domain Faults in Digital Systems. IOLTS 2004: 5-10
27EEMarcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira, Salvador Manich, L. Balado, Joan Figueras: On High-Quality, Low Energy Built-In Self Test Preparation at RT-Level. J. Electronic Testing 20(4): 345-355 (2004)
2003
26EEMarcelino B. Santos, José M. Fernandes, Isabel C. Teixeira, João Paulo Teixeira: RTL Test Pattern Generation for High Quality Loosely Deterministic BIST. DATE 2003: 10994-10999
25EEFernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Property Coverage for Quality Assessment of Fault Tolerant or Fail Safe Systems. IOLTS 2003: 164-165
2002
24EEFernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Self-Checking and Fault Tolerance Quality Assessment Using Fault Sampling. DFT 2002: 216-224
23EEMarcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira, Salvador Manich, Rosa Rodríguez-Montañés, Joan Figueras: RTL Level Preparation of High-Quality/Low-Energy/Low-Power BIST. ITC 2002: 814-823
22EEMarcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira: RTL Design Validation, DFT and Test Pattern Generation for High Defects Coverage. J. Electronic Testing 18(2): 179-187 (2002)
21EEFernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Design and Test of a Certifiable ASIC for a Safety-Critical Gas Burner Control System. J. Electronic Testing 18(3): 285-294 (2002)
2001
20EEYervant Zorian, Paolo Prinetto, João Paulo Teixeira, Isabel C. Teixeira, Carlos Eduardo Pereira, Octávio Páscoa Dias, Jorge Semião, Peter Muhmenthaler, W. Radermacher: Embedded tutorial: TRP: integrating embedded test and ATE. DATE 2001: 34-37
19 Hugo Lérias, João Luz, Pedro Moura, Ana Mendes, Isabel C. Teixeira, João Paulo Teixeira: Towards E-Management as Enabler for Accelerated Change. ICEIS (2) 2001: 807-814
18EEFernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Design and Test of Certifiable ASICs for Safety-Critical Gas Burners Contro. IOLTW 2001: 197-201
17 Fernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Implicit functionality and multiple branch coverage (IFMB): a testability metric for RT-level. ITC 2001: 377-385
16EEMarcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira: RTL-Based Functional Test Generation for High Defects Coverage in Digital Systems. J. Electronic Testing 17(3-4): 311-319 (2001)
2000
15 Octávio Páscoa Dias, Isabel C. Teixeira, João Paulo Teixeira, Leandro Buss Becker, Carlos Eduardo Pereira: Optimizing Functional distribution in Complex System Design. DIPES 2000: 75-86
14EELeandro Buss Becker, Carlos Eduardo Pereira, Octávio Páscoa Dias, Isabel C. Teixeira, João Paulo Teixeira: MOSYS A Methodology for Automatic Object Identification from System Specification. ISORC 2000: 198-201
13EEOctávio Páscoa Dias, Jorge Semião, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Quality of Electronic Design: From Architectural Level to Test Coverage. ISQED 2000: 197-
1999
12EEMarcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira: Defect-Oriented Verilog Fault Simulation of SoC Macros using a Stratified Fault Sampling Technique. VTS 1999: 326-332
11EEOctávio Páscoa Dias, Isabel C. Teixeira, João Paulo Teixeira: Metrics and Criteria for Quality Assessment of Testable Hw/Sw Systems Architectures. J. Electronic Testing 14(1-2): 149-158 (1999)
1998
10 Octávio Páscoa Dias, Isabel C. Teixeira, João Paulo Teixeira, Carlos Eduardo Pereira: An OO Based Methodology for Real-Time HW/SW Systems Modeling. DIPES 1998: 213-222
9EEFernando M. Gonçalves, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Defect-oriented test quality assessment using fault sampling and simulation. ITC 1998: 35-42
1997
8EEFernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira: Realistic Fault Extraction for High-Quality Design and Test of VLSI Systems. DFT 1997: 29-37
1995
7EEMarcelino B. Santos, M. Simões, Isabel C. Teixeira, João Paulo Teixeira: Test preparation for high coverage of physical defects in CMOS digital ICs. VTS 1995: 330-337
1994
6 M. Calha, Marcelino B. Santos, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira: Back Annotation of Physical Defects into Gate-Level, Realistic Faults in Digital ICs. ITC 1994: 720-728
1993
5 Antonio Casimiro, M. Simões, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Experiments on Bridging Fault Analysis and Layout-Level DFT for CMOS Designs. DFT 1993: 109-116
4 P. Nicolau, J. Barbosa, M. Saraiva, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Realistic Fault Analysis of CMOS Analog Building Blocks. DFT 1993: 311-318
1992
3 M. Saraiva, P. Casimiro, Marcelino B. Santos, José T. de Sousa, Fernando M. Gonçalves, Isabel C. Teixeira, João Paulo Teixeira: Physical DFT for High Coverage of Realistic Faults. ITC 1992: 642-651
1991
2EEJoão Paulo Teixeira, Isabel C. Teixeira, C. F. Beltrá Almeida, Fernando M. Gonçalves, J. Gonçalves: A methodology for testability enhancement at layout level. J. Electronic Testing 1(4): 287-299 (1991)
1990
1EEJoão Paulo Teixeira, Isabel C. Teixeira, C. F. Beltrá Almeida, Fernando M. Gonçalves, J. Gonçalves, R. Crespo: A strategy for testability enhancement at layout level. EURO-DAC 1990: 413-417

Coauthor Index

1E. Albuquerque [39]
2C. F. Beltrá Almeida [1] [2]
3L. Balado [27]
4J. Barbosa [4]
5Daniel Barros Jr. [28]
6Leandro Buss Becker [14] [15]
7P. Bento [31]
8Vasco Bexiga [39] [40]
9R. Bugalho [39] [40]
10M. Calha [6]
11B. Carriço [39]
12Antonio Casimiro [5]
13P. Casimiro [3]
14R. Crespo [1]
15Octávio Páscoa Dias [10] [11] [13] [14] [15] [20]
16José M. Fernandes [26]
17C. S. Ferreira [39]
18Manuel Ferreira [39] [40]
19Joan Figueras [23] [27]
20J. Freijedo [34] [35] [37]
21J. Godinho [39]
22F. Gonçalves [39]
23Fernando M. Gonçalves [1] [2] [3] [6] [8] [9] [12] [16] [17] [18] [21] [22] [24] [25]
24J. Gonçalves [1] [2]
25F. Guerreiro [33]
26D. Barros Júnior [29]
27Carlos Leong [31] [39] [40]
28Hugo Lérias [19]
29Pedro Lousã [31] [39] [40]
30João Luz [19]
31Pedro Machado [39] [40]
32Salvador Manich [23] [27]
33Ana Mendes [19]
34Pedro Moura [19]
35R. Moura [39]
36Peter Muhmenthaler [20]
37Pedro Neves [39] [40]
38P. Nicolau [4]
39J. Nobre [31]
40C. Ortigão [39]
41Carlos Eduardo Pereira [10] [14] [15] [20]
42Fernando Piedade [39] [40]
43A. Pierce [33]
44J. F. Pinheiro [39] [40]
45Paolo Prinetto [20]
46W. Radermacher [20]
47Joel Rego [31] [40]
48P. Relvas [39]
49A. Rivetti [39]
50Pedro Rodrigues [31] [39] [40]
51Juan J. Rodríguez-Andina [30] [32] [34] [35] [36] [37] [38]
52Marcial Jesús Rodríguez-Irago [29] [30] [32]
53Rosa Rodríguez-Montañés [23]
54Marcelino B. Santos [3] [4] [5] [6] [7] [9] [12] [13] [16] [17] [18] [21] [22] [23] [24] [25] [26] [27] [28] [29] [30] [33] [34] [35] [37] [38]
55Marcelino Bicho Dos Santos [36]
56M. Saraiva [3] [4]
57Jorge Semião [13] [20] [32] [33] [34] [35] [36] [37] [38]
58J. C. Silva [31] [39]
59M. M. Silva [39]
60M. Simões [5] [7]
61José T. de Sousa [3]
62J. P. Teixeira [39]
63João Paulo Teixeira [1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15] [16] [17] [18] [19] [20] [21] [22] [23] [24] [25] [26] [27] [28] [29] [30] [31] [32] [33] [34] [35] [36] [37] [38] [40]
64Andreia Trindade [31] [39] [40]
65João Varela [31] [39] [40]
66Fabian Vargas [28] [29] [30] [32] [34] [35] [36] [37] [38]
67Yervant Zorian [20]

Copyright © Tue Nov 3 08:52:44 2009 by Michael Ley (ley@uni-trier.de)