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Hiroshi Takahashi Vis

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*2009
51EEHiroshi Takahashi: A Study on a Method to Call Drivers' Attention to Hazard. HCI (17) 2009: 441-450
50EEKoji Yamazaki, Toshiyuki Tsutsumi, Hiroshi Takahashi, Yoshinobu Higami, Takashi Aikyo, Yuzo Takamatsu, Hiroyuki Yotsuyanagi, Masaki Hashizume: A Novel Approach for Improving the Quality of Open Fault Diagnosis. VLSI Design 2009: 85-90
49EEHiroyuki Yotsuyanagi, Masaki Hashizume, Toshiyuki Tsutsumi, Koji Yamazaki, Takashi Aikyo, Yoshinobu Higami, Hiroshi Takahashi, Yuzo Takamatsu: Fault Effect of Open Faults Considering Adjacent Signal Lines in a 90 nm IC. VLSI Design 2009: 91-96
48EESatoru Takahashi, Hiroshi Takahashi, Kazuhiko Tsuda: Analysis of the effect of Headline News in financial market through text categorisation. IJCAT 35(2/3/4): 204-209 (2009)
2008
47EEYasuo Yamashita, Hiroshi Takahashi, Takao Terano: The Development of the Financial Learning Tool through Business Game. KES (2) 2008: 986-993
46EEYoshinobu Higami, Kewal K. Saluja, Hiroshi Takahashi, Shin-ya Kobayashi, Yuzo Takamatsu: Maximizing Stuck-Open Fault Coverage Using Stuck-at Test Vectors. IEICE Transactions 91-A(12): 3506-3513 (2008)
45EEYuzo Takamatsu, Hiroshi Takahashi, Yoshinobu Higami, Takashi Aikyo, Koji Yamazaki: Fault Diagnosis on Multiple Fault Models by Using Pass/Fail Information. IEICE Transactions 91-D(3): 675-682 (2008)
44EEYoshinobu Higami, Kewal K. Saluja, Hiroshi Takahashi, Shin-ya Kobayashi, Yuzo Takamatsu: Fault Simulation and Test Generation for Transistor Shorts Using Stuck-at Test Tools. IEICE Transactions 91-D(3): 690-699 (2008)
43EEHiroshi Takahashi, Yoshinobu Higami, Shuhei Kadoyama, Yuzo Takamatsu, Koji Yamazaki, Takashi Aikyo, Yasuo Sato: Post-BIST Fault Diagnosis for Multiple Faults. IEICE Transactions 91-D(3): 771-775 (2008)
2007
42EETakashi Aikyo, Hiroshi Takahashi, Yoshinobu Higami, Junichi Ootsu, Kyohei Ono, Yuzo Takamatsu: Timing-Aware Diagnosis for Small Delay Defects. DFT 2007: 223-234
41EEHiroshi Takahashi, Yoshinobu Higami, Toru Kikkawa, Takashi Aikyo, Yuzo Takamatsu, Hiroyuki Yotsuyanagi, Masaki Hashizume: Test Generation and Diagnostic Test Generation for Open Faults with Considering Adjacent Lines. DFT 2007: 243-251
40EEHiroshi Takahashi, Takao Terano: Analyzing the Influence of Overconfident Investors on Financial Markets Through Agent-Based Model. IDEAL 2007: 1042-1052
39EESatoru Takahashi, Masakazu Takahashi, Hiroshi Takahashi, Kazuhiko Tsuda: Analysis of the Relation Between Stock Price Returns and Headline News Using Text Categorization. KES (2) 2007: 1339-1345
38EEYoshinobu Higami, Kewal K. Saluja, Hiroshi Takahashi, Yuzo Takamatsu: Fault Coverage and Fault Efficiency of Transistor Shorts using Gate-Level Simulation and Test Generation. VLSI Design 2007: 781-786
2006
37EEYoshinobu Higami, Kewal K. Saluja, Hiroshi Takahashi, Shin-ya Kobayashi, Yuzo Takamatsu: Compaction of pass/fail-based diagnostic test vectors for combinational and sequential circuits. ASP-DAC 2006: 659-664
36EEHiroshi Takahashi, Shuhei Kadoyama, Yoshinobu Higami, Yuzo Takamatsu, Koji Yamazaki, Takashi Aikyo, Yasuo Sato: Effective Post-BIST Fault Diagnosis for Multiple Faults. DFT 2006: 401-109
35EESatoru Takahashi, Masakazu Takahashi, Hiroshi Takahashi, Kazuhiko Tsuda: Analysis of Stock Price Return Using Textual Data and Numerical Data Through Text Mining. KES (2) 2006: 310-316
34EEIkuo Matsuba, Hiroshi Takahashi, Shinya Wakasa: Stochastically Equivalent Dynamical System Approach to Nonlinear Deterministic Prediction. I. J. Bifurcation and Chaos 16(9): 2721-2728 (2006)
2005
33EET. Seiyama, Hiroshi Takahashi, Yoshinobu Higami, Kazuo Yamazaki, Yuzo Takamatsu: On the fault diagnosis in the presence of unknown fault models using pass/fail information. ISCAS (3) 2005: 2987-2990
32EESatoru Takahashi, Masakazu Takahashi, Hiroshi Takahashi, Kazuhiko Tsuda: Learning Value-Added Information of Asset Management from Analyst Reports Through Text Mining. KES (4) 2005: 785-791
31EEHiroshi Takahashi, Keith J. Keller, Kim T. Le, Kewal K. Saluja, Yuzo Takamatsu: A method for reducing the target fault list of crosstalk faults in synchronous sequential circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 24(2): 252-263 (2005)
30EEAkihiko Hirata, Hiroyoshi Togo, Naofumi Shimizu, Hiroshi Takahashi, Katsunari Okamoto, Tadao Nagatsuma: Low-Phase Noise Photonic Millimeter-Wave Generator Using an AWG Integrated with a 3-dB Combiner. IEICE Transactions 88-C(7): 1458-1464 (2005)
2004
29EEHiroshi Takahashi, Yukihiro Yamamoto, Yoshinobu Higami, Yuzo Takamatsu: Enhancing BIST Based Single/Multiple Stuck-at Fault Diagnosis by Ambiguous Test Set. Asian Test Symposium 2004: 216-221
28EEYuichi Sato, Hiroshi Takahashi, Yoshinobu Higami, Yuzo Takamatsu: Failure Analysis of Open Faults by Using Detecting/Un-detecting Information on Tests. Asian Test Symposium 2004: 222-227
27EESatoru Takahashi, Hiroshi Takahashi, Kazuhiko Tsuda: An Efficient Learning System for Knowledge of Asset Management. KES 2004: 494-500
2003
26EEHiroshi Takahashi, Yasunori Tsugaoka, Hidekazu Ayano, Yuzo Takamatsu: BIST Based Fault Diagnosis Using Ambiguous Test Set. DFT 2003: 89-96
25 Ikuo Matsuba, Hiroshi Takahashi, Shinya Wakasa: Stochastically Equivalent Dynamical System Approach To Nonlinear Deterministic Prediction. HIS 2003: 409-418
24EEHiroshi Takahashi, Takao Terano: Agent-Based Approach to Investors' Behavior and Asset Price Fluctuation in Financial Markets. J. Artificial Societies and Social Simulation 6(3): (2003)
2002
23EEKeith J. Keller, Hiroshi Takahashi, Kim T. Le, Kewal K. Saluja, Yuzo Takamatsu: Reduction of Target Fault List for Crosstalk-Induced Delay Faults by using Layout Constraints. Asian Test Symposium 2002: 242-247
22EEJiang Brandon Liu, Andreas G. Veneris, Hiroshi Takahashi: Incremental Diagnosis of Multiple Open-Interconnects. ITC 2002: 1085-1092
21EEHiroshi Takahashi, Kewal K. Saluja, Yuzo Takamatsu: An Alternative Method of Generating Tests for Path Delay Faults Using N -Detection Test Sets. PRDC 2002: 275-282
20EEHiroshi Takahashi, Kwame Osei Boateng, Kewal K. Saluja, Yuzo Takamatsu: On diagnosing multiple stuck-at faults using multiple and singlefault simulation in combinational circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 21(3): 362-368 (2002)
2001
19EEHiroshi Takahashi, Marong Phadoongsidhi, Yoshinobu Higami, Kewal K. Saluja, Yuzo Takamatsu: Simulation-Based Diagnosis for Crosstalk Faults in Sequential Circuits. Asian Test Symposium 2001: 63-
18 Keith J. Keller, Hiroshi Takahashi, Kewal K. Saluja, Yuzo Takamatsu: On reducing the target fault list of crosstalk-induced delay faults in synchronous sequential circuits. ITC 2001: 568-577
17EEThomas Clouqueur, Ozen Ercevik, Kewal K. Saluja, Hiroshi Takahashi: Efficient Signature-Based Fault Diagnosis Using Variable Size Windows. VLSI Design 2001: 391-396
2000
16EEKwame Osei Boateng, Hiroshi Takahashi, Yuzo Takamatsu: General BIST-Amenable Method of Test Generation for Iterative Logic Arrays. VTS 2000: 171-178
15EESatoshi Koizumi, Masayuki Matsushita, Yasufumi Takama, Hiroshi Takahashi, Kaoru Hirota: Temporal-Hierarchical Emergency-Degree Inference System for Running Vehicles Using Image and Navigation Data. JACIII 4(1): 76-87 (2000)
1999
14EETeruhiko Yamada, Toshinori Kotake, Hiroshi Takahashi, Koji Yamazaki: Identification of Redundant Crosspoint Faults in Sequential PLAs with Fault-Free Hardware Reset. Asian Test Symposium 1999: 269-274
13EEHiroshi Takahashi, Kwame Osei Boateng, Yuzo Takamatsu, Nobuhiro Yanagida: Multiple Fault Diagnosis in Logic Circuits Using EB Tester and Multiple/Single Fault Simulators. Asian Test Symposium 1999: 341-346
12EEHiroshi Takahashi, Kwame Osei Boateng, Yuzo Takamatsu: A New Method for Diagnosing Multiple Stuck-at Faults using Multiple and Single Fault Simulations. VTS 1999: 64-69
11EEHiroshi Takahashi, Kouichi Kuroda: Study on Intelligent Vehicle Control Considering Driver Perception of Driving Environment. JACIII 3(1): 42-49 (1999)
1998
10EEHiroshi Takahashi, Kwame Osei Boateng, Yuzo Takamatsu: Diagnosis of Single Gate Delay Faults in Combinational Circuits using Delay Fault Simulation. Asian Test Symposium 1998: 108-112
9EENobuhiro Yanagida, Hiroshi Takahashi, Yuzo Takamatsu: Electron Beam Tester Aided Fault Diagnosis for Logic Circuits Based on Sensitized Paths. Asian Test Symposium 1998: 237-
1997
8EEHiroshi Takahashi, Kwame Osei Boateng, Yuzo Takamatsu, Toshiyuki Matsunaga: A Method of Generating Tests for Marginal Delays an Delay Faults in Combinational Circuits. Asian Test Symposium 1997: 320-325
7EEKwame Osei Boateng, Hiroshi Takahashi, Yuzo Takamatsu: Design of C-Testable Multipliers Based on the Modified Booth Algorithm. Asian Test Symposium 1997: 42-47
6EEHiroshi Takahashi: Vehicle Control Based on Fuzzy Evaluation Knowledge Obtained by Coefficients of the ARMA Model. JACIII 1(1): 8-9 (1997)
5EEHiroshi Takahashi, Takashi Watanabe, Toshiyuki Matsunaga, Yuzo Takamatsu: Tests for small gate delay faults in combinational circuits and a test generation method. Systems and Computers in Japan 28(6): 68-76 (1997)
1996
4 Nobuhiro Yanagida, Hiroshi Takahashi, Yuzo Takamatsu: Multiple Fault Diagnosis in Sequential Circuits Using Sensitizing Sequence Pairs. FTCS 1996: 86-95
1995
3EEHiroshi Takahashi, Takashi Watanabe, Yuzo Takamatsu: Generation of tenacious tests for small gate delay faults in combinational circuits. Asian Test Symposium 1995: 332-338
2EEHiroshi Takahashi, Nobuhiro Yanagida, Yuzo Takamatsu: Enhancing multiple fault diagnosis in combinational circuits based on sensitized paths and EB testing. Asian Test Symposium 1995: 58-64
1EENobuhiro Yanagida, Hiroshi Takahashi, Yuzo Takamatsu: Multiple Fault Diagnosis by Sensitizing Input Pairs. IEEE Design & Test of Computers 12(3): 44-52 (1995)

Coauthor Index

1Takashi Aikyo [36] [41] [42] [43] [45] [49] [50]
2Hidekazu Ayano [26]
3Kwame Osei Boateng [7] [8] [10] [12] [13] [16] [20]
4Thomas Clouqueur [17]
5Ozen Ercevik [17]
6Masaki Hashizume [41] [49] [50]
7Yoshinobu Higami [19] [28] [29] [33] [36] [37] [38] [41] [42] [43] [44] [45] [46] [49] [50]
8Akihiko Hirata [30]
9Kaoru Hirota [15]
10Shuhei Kadoyama [36] [43]
11Keith J. Keller [18] [23] [31]
12Toru Kikkawa [41]
13Shin-ya Kobayashi [37] [44] [46]
14Satoshi Koizumi [15]
15Toshinori Kotake [14]
16Kouichi Kuroda [11]
17Kim T. Le [23] [31]
18Jiang Brandon Liu [22]
19Ikuo Matsuba [25] [34]
20Toshiyuki Matsunaga [5] [8]
21Masayuki Matsushita [15]
22Tadao Nagatsuma [30]
23Katsunari Okamoto [30]
24Kyohei Ono [42]
25Junichi Ootsu [42]
26Marong Phadoongsidhi [19]
27Kewal K. Saluja [17] [18] [19] [20] [21] [23] [31] [37] [38] [44] [46]
28Yasuo Sato [36] [43]
29Yuichi Sato [28]
30T. Seiyama [33]
31Naofumi Shimizu [30]
32Masakazu Takahashi [32] [35] [39]
33Satoru Takahashi [27] [32] [35] [39] [48]
34Yasufumi Takama [15]
35Yuzo Takamatsu [1] [2] [3] [4] [5] [7] [8] [9] [10] [12] [13] [16] [18] [19] [20] [21] [23] [26] [28] [29] [31] [33] [36] [37] [38] [41] [42] [43] [44] [45] [46] [49] [50]
36Takao Terano [24] [40] [47]
37Hiroyoshi Togo [30]
38Kazuhiko Tsuda [27] [32] [35] [39] [48]
39Yasunori Tsugaoka [26]
40Toshiyuki Tsutsumi [49] [50]
41Andreas G. Veneris [22]
42Shinya Wakasa [25] [34]
43Takashi Watanabe [3] [5]
44Teruhiko Yamada [14]
45Yukihiro Yamamoto [29]
46Yasuo Yamashita [47]
47Kazuo Yamazaki [33]
48Koji Yamazaki [14] [36] [43] [45] [49] [50]
49Nobuhiro Yanagida [1] [2] [4] [9] [13]
50Hiroyuki Yotsuyanagi [41] [49] [50]

Colors in the list of coauthors

Copyright © Tue Nov 3 08:52:44 2009 by Michael Ley (ley@uni-trier.de)