| |
| 2006 | ||
|---|---|---|
| 3 | EE | Brian Swahn, Soha Hassoun: Gate sizing: finFETs vs 32nm bulk MOSFETs. DAC 2006: 528-531 |
| 2 | EE | Brian Swahn, Soha Hassoun: METS: A Metric for Electro-Thermal Sensitivity, and Its Application To FinFETs. ISQED 2006: 121-126 |
| 2003 | ||
| 1 | EE | Brian Swahn, Soha Hassoun: Hardware Scheduling for Dynamic Adaptability using External Profiling and Hardware Threading. ICCAD 2003: 58-65 |
| 1 | Soha Hassoun | [1] [2] [3] |