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Egor S. Sogomonyan Vis

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*2008
30EEMichael Gössel, Egor S. Sogomonyan: A Non-linear Split Error Detection Code. Fundam. Inform. 83(1-2): 109-115 (2008)
2006
29EECristian Grecu, André Ivanov, Res Saleh, Egor S. Sogomonyan, Partha Pratim Pande: On-line Fault Detection and Location for NoC Interconnects. IOLTS 2006: 145-150
28EEDaniel Marienfeld, Egor S. Sogomonyan, Vitalij Ocheretnij, Michael Gössel: A New Self-Checking and Code-Disjoint Non-Restoring Array Divider. IOLTS 2006: 23-30
27EEVitalij Ocheretnij, Michael Gössel, Egor S. Sogomonyan, Daniel Marienfeld: Modulo p=3 Checking for a Carry Select Adder. J. Electronic Testing 22(1): 101-107 (2006)
2005
26EEDaniel Marienfeld, Egor S. Sogomonyan, Vitalij Ocheretnij, Michael Gössel: New Self-checking Output-Duplicated Booth Multiplier with High Fault Coverage for Soft Errors. Asian Test Symposium 2005: 76-81
2004
25 Egor S. Sogomonyan, Daniel Marienfeld, Vitalij Ocheretnij, Michael Gössel: Self-checking Carry-selectAdder with Sum-bit Duplication. ARCS Workshops 2004: 84-91
24EEEgor S. Sogomonyan, Daniel Marienfeld, Vitalij Ocheretnij, Michael Gössel: A New Self-Checking Sum-Bit Duplicated Carry-Select Adder. DATE 2004: 1360-1361
23EEVitalij Ocheretnij, Daniel Marienfeld, Egor S. Sogomonyan, Michael Gössel: Self-Checking Code-Disjoint Carry-Select Adder with Low Area Overhead by Use of Add1-Circuits. IOLTS 2004: 31-36
2003
22EEVitalij Ocheretnij, Michael Gössel, Egor S. Sogomonyan, Daniel Marienfeld: A Modulo p Checked Self-Checking Carry Select Adder. IOLTS 2003: 25-29
21EEKartik Mohanram, Egor S. Sogomonyan, Michael Gössel, Nur A. Touba: Synthesis of Low-Cost Parity-Based Partially Self-Checking Circuits. IOLTS 2003: 35-
20EEAdit D. Singh, Markus Seuring, Michael Gössel, Egor S. Sogomonyan: Multimode scan: Test per clock BIST for IP cores. ACM Trans. Design Autom. Electr. Syst. 8(4): 491-505 (2003)
2002
19EEDaniel Marienfeld, Vitalij Ocheretnij, Michael Gössel, Egor S. Sogomonyan: Partially Duplicated Code-Disjoint Carry-Skip Adder. DFT 2002: 78-86
18EEDaniel Marienfeld, Egor S. Sogomonyan, Vitalij Ocheretnij, Michael Gössel: A New Self-Checking Code-Disjoint Carry-Skip Adder. IOLTW 2002: 39-43
17EEMichael Gössel, Egor S. Sogomonyan, Adit D. Singh: Scan-Path with Directly Duplicated and Inverted Duplicated Registers. VTS 2002: 47-52
2001
16EEVitalij Ocheretnij, Egor S. Sogomonyan, Michael Gössel: A New Code-Disjoint Sum-Bit Duplicated Carry Look-Ahead Adder for Parity Codes. Asian Test Symposium 2001: 365-
15EEVitalij Ocheretnij, Michael Gössel, Egor S. Sogomonyan: Code-Disjoint Carry-Dependent Sum Adder with Partial Look-Ahead. IOLTW 2001: 147-152
14EEEgor S. Sogomonyan, A. A. Morosov, Jan Rzeha, Michael Gössel, Adit D. Singh: Early Error Detection in Systems-on-Chip for Fault-Tolerance and At-Speed Debugging. VTS 2001: 184-189
1999
13 Adit D. Singh, Egor S. Sogomonyan, Michael Gössel, Markus Seuring: Testability evaluation of sequential designs incorporating the multi-mode scannable memory element. ITC 1999: 286-293
12EEMichael Gössel, A. A. Morosov, Egor S. Sogomonyan: A New Totally Error Propagating Compactor for Arbitrary Cores with Digital Interfaces. VTS 1999: 49-57
11EEEgor S. Sogomonyan, Adit D. Singh, Michael Gössel: A Multi-Mode Scannable Memory Element for High Test Application Efficiency and Delay Testing. J. Electronic Testing 15(1-2): 87-96 (1999)
1998
10EEEgor S. Sogomonyan, Adit D. Singh, Michael Gössel: A Multi-Mode Scannable Memory Element for High Test Application Efficiency and Delay Testing. VTS 1998: 324-331
9EEMarkus Seuring, Michael Gössel, Egor S. Sogomonyan: A Structural Approach for Space Compaction for Concurrent Checking and BIST. VTS 1998: 354-361
1997
8EEHendrik Hartje, Michael Gössel, Egor S. Sogomonyan: Code-Disjoint Circuits for Parity Circuits. Asian Test Symposium 1997: 100-
7EEAndrzej Hlawiczka, Michael Gössel, Egor S. Sogomonyan: A linear code-preserving signature analyzer COPMISR. VTS 1997: 350-355
1996
6EEEgor S. Sogomonyan, Michael Gössel: Concurrently self-testing embedded checkers for ultra-reliable fault-tolerant systems. VTS 1996: 138-144
5 S. Kundu, Egor S. Sogomonyan, Michael Gössel, Steffen Tarnick: Self-Checking Comparator with One Periodic Output. IEEE Trans. Computers 45(3): 379-380 (1996)
4EEMichael Gössel, Egor S. Sogomonyan: A parity-preserving multi-input signature analyzer and its application for concurrent checking and BIST. J. Electronic Testing 8(2): 165-177 (1996)
1993
3 Egor S. Sogomonyan, Michael Gössel: Design of Self-Parity Combinational Circuits for Self-testing and On-line Detection. DFT 1993: 239-246
2 Michael Gössel, Egor S. Sogomonyan: Self-parity cominational circuits for self-testing, concurrent fault detection and parity scan design. VLSI 1993: 103-111
1EEEgor S. Sogomonyan, Michael Gössel: Design of self-testing and on-line fault detection combinational circuits with weakly independent outputs. J. Electronic Testing 4(3): 267-281 (1993)

Coauthor Index

1Michael Gössel [1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15] [16] [17] [18] [19] [20] [21] [22] [23] [24] [25] [26] [27] [28] [30]
2Cristian Grecu [29]
3Hendrik Hartje [8]
4Andrzej Hlawiczka [7]
5André Ivanov [29]
6S. Kundu [5]
7Daniel Marienfeld [18] [19] [22] [23] [24] [25] [26] [27] [28]
8Kartik Mohanram [21]
9A. A. Morosov [12] [14]
10Vitalij Ocheretnij [15] [16] [18] [19] [22] [23] [24] [25] [26] [27] [28]
11Partha Pratim Pande [29]
12Jan Rzeha [14]
13Resve A. Saleh (Resve Saleh, Res Saleh) [29]
14Markus Seuring [9] [13] [20]
15Adit D. Singh [10] [11] [13] [14] [17] [20]
16Steffen Tarnick [5]
17Nur A. Touba [21]

Colors in the list of coauthors

Copyright © Tue Nov 3 08:52:44 2009 by Michael Ley (ley@uni-trier.de)