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Hyungcheol Shin Vis

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*2009
10EESeongjae Cho, Jung Hoon Lee, Gil Sung Lee, Jong Duk Lee, Hyungcheol Shin, Byung-Gook Park: Design Consideration for Vertical Nonvolatile Memory Device Regarding Gate-Induced Barrier Lowering (GIBL). IEICE Transactions 92-C(5): 620-626 (2009)
9EEJongwook Jeon, Ickhyun Song, Jong Duk Lee, Byung-Gook Park, Hyungcheol Shin: Application of the Compact Channel Thermal Noise Model of Short Channel MOSFETs to CMOS RFIC Design. IEICE Transactions 92-C(5): 627-634 (2009)
8EEYoon Kim, Seongjae Cho, Gil Sung Lee, Il Han Park, Jong Duk Lee, Hyungcheol Shin, Byung-Gook Park: 3-Dimensional Terraced NAND (3D TNAND) Flash Memory-Stacked Version of Folded NAND Array. IEICE Transactions 92-C(5): 653-658 (2009)
7EEDoo-Hyun Kim, Il Han Park, Seongjae Cho, Jong Duk Lee, Hyungcheol Shin, Byung-Gook Park: Simulation of Retention Characteristics in Double-Gate Structure Multi-Bit SONOS Flash Memory. IEICE Transactions 92-C(5): 659-663 (2009)
2008
6EESeongjae Cho, Il Han Park, Jung Hoon Lee, Jang-Gn Yun, Doo-Hyun Kim, Jong Duk Lee, Hyungcheol Shin, Byung-Gook Park: Establishing Read Operation Bias Schemes for 3-D Pillar Structure Flash Memory Devices to Overcome Paired Cell Interference (PCI). IEICE Transactions 91-C(5): 731-735 (2008)
5EEHochul Lee, Youngchang Yoon, Ickhyun Song, Hyungcheol Shin: FN Stress Induced Degradation on Random Telegraph Signal Noise in Deep Submicron NMOSFETs. IEICE Transactions 91-C(5): 776-779 (2008)
2007
4EEHochul Lee, Youngchang Yoon, Seongjae Cho, Hyungcheol Shin: Accurate Extraction of the Trap Depth from RTS Noise Data by Including Poly Depletion Effect and Surface Potential Variation in MOSFETs. IEICE Transactions 90-C(5): 968-972 (2007)
3EESeongjae Cho, Jang-Gn Yun, Il Han Park, Jung Hoon Lee, Jong Pil Kim, Jong Duk Lee, Hyungcheol Shin, Byung-Gook Park: Analyses on Current Characteristics of 3-D MOSFET Determined by Junction Doping Profiles for Nonvolatile Memory Devices. IEICE Transactions 90-C(5): 988-993 (2007)
2003
2EEMinkyu Je, Jeonghu Han, Hyungcheol Shin, Kwyro Lee: A simple four-terminal small-signal model of RF MOSFETs and its parameter extraction. Microelectronics Reliability 43(4): 601-609 (2003)
1998
1EEJoonho Gil, Minkyu Je, Jongho Lee, Hyungcheol Shin: A high speed and low power SOL inverter using active body-bias. ISLPED 1998: 59-63

Coauthor Index

1Seongjae Cho [3] [4] [6] [7] [8] [10]
2Joonho Gil [1]
3Jeonghu Han [2]
4Minkyu Je [1] [2]
5Jongwook Jeon [9]
6Doo-Hyun Kim [6] [7]
7Jong Pil Kim [3]
8Yoon Kim [8]
9Gil Sung Lee [8] [10]
10Hochul Lee [4] [5]
11Jong Duk Lee [3] [6] [7] [8] [9] [10]
12Jongho Lee [1]
13Jung Hoon Lee [3] [6] [10]
14Kwyro Lee [2]
15Byung-Gook Park [3] [6] [7] [8] [9] [10]
16Il Han Park [3] [6] [7] [8]
17Ickhyun Song [5] [9]
18Youngchang Yoon [4] [5]
19Jang-Gn Yun [3] [6]

Colors in the list of coauthors

Copyright © Tue Nov 3 08:52:44 2009 by Michael Ley (ley@uni-trier.de)