Jorge Semião Vis

*	2008
10	EE	Jorge Semião, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Process Tolerant Design Using Thermal and Power-Supply Tolerance in Pipeline Based Circuits. DDECS 2008: 34-37
9	EE	Jorge Semião, Marcial Jesús Rodríguez-Irago, Juan J. Rodríguez-Andina, Leonardo Bisch Piccoli, Fabian Vargas, Marcelino Bicho Dos Santos, Isabel Maria Cacho Teixeira, João Paulo Teixeira: Signal Integrity Enhancement in Digital Circuits. IEEE Design & Test of Computers 25(5): 452-461 (2008)
	2007
8		Jorge Semião, J. Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Improving Tolerance to Power-Supply and Temperature Variations in Synchronous Circuits. DDECS 2007: 295-300
7	EE	Jorge Semião, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino Bicho Dos Santos, Isabel C. Teixeira, João Paulo Teixeira: Improving the Tolerance of Pipeline Based Circuits to Power Supply or Temperature Variations. DFT 2007: 303-311
6	EE	Jorge Semião, J. Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: On-line Dynamic Delay Insertion to Improve Signal Integrity in Synchronous Circuits. IOLTS 2007: 167-172
5	EE	Jorge Semião, J. Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Enhancing the Tolerance to Power-Supply Instability in Digital Circuits. ISVLSI 2007: 207-212
	2006
4		F. Guerreiro, Jorge Semião, A. Pierce, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Functional-Oriented BIST of Sequential Circuits Aiming at Dynamic Faults Coverage. DDECS 2006: 279-284
3	EE	Marcial Jesús Rodríguez-Irago, Juan J. Rodríguez-Andina, Fabian Vargas, Jorge Semião, Isabel C. Teixeira, João Paulo Teixeira: Dynamic Fault Detection in Digital Systems Using Dynamic Voltage Scaling and Multi-Temperature Schemes. IOLTS 2006: 257-262
	2001
2	EE	Yervant Zorian, Paolo Prinetto, João Paulo Teixeira, Isabel C. Teixeira, Carlos Eduardo Pereira, Octávio Páscoa Dias, Jorge Semião, Peter Muhmenthaler, W. Radermacher: Embedded tutorial: TRP: integrating embedded test and ATE. DATE 2001: 34-37
	2000
1	EE	Octávio Páscoa Dias, Jorge Semião, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Quality of Electronic Design: From Architectural Level to Test Coverage. ISQED 2000: 197-

Coauthor Index

1	Octávio Páscoa Dias	[1] [2]
2	J. Freijedo	[5] [6] [8]
3	F. Guerreiro	[4]
4	Peter Muhmenthaler	[2]
5	Carlos Eduardo Pereira	[2]
6	Leonardo Bisch Piccoli	[9]
7	A. Pierce	[4]
8	Paolo Prinetto	[2]
9	W. Radermacher	[2]
10	Juan J. Rodríguez-Andina	[3] [5] [6] [7] [8] [9] [10]
11	Marcial Jesús Rodríguez-Irago	[3] [9]
12	Marcelino B. Santos	[1] [4] [5] [6] [8] [10]
13	Marcelino Bicho Dos Santos	[7] [9]
14	Isabel C. Teixeira	[1] [2] [3] [4] [5] [6] [7] [8] [10]
15	Isabel Maria Cacho Teixeira	[9]
16	João Paulo Teixeira	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10]
17	Fabian Vargas	[3] [5] [6] [7] [8] [9] [10]
18	Yervant Zorian	[2]