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Siegfried Selberherr Vis

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*2009
67 Thomas Windbacher, Viktor Sverdlov, Siegfried Selberherr, Clemens Heitzinger, Norbert Mauser, Christian A. Ringhofer: Study of the Properties of Biotin-streptavidin Sensitive BioFETs. BIODEVICES 2009: 24-30
66EEOtmar Ertl, Siegfried Selberherr: A fast level set framework for large three-dimensional topography simulations. Computer Physics Communications 180(8): 1242-1250 (2009)
2008
65EEMahdi Pourfath, Hans Kosina, Siegfried Selberherr: Numerical study of quantum transport in carbon nanotube transistors. Mathematics and Computers in Simulation 79(4): 1051-1059 (2008)
64EEEnzo Ungersboeck, W. Gös, S. Dhar, Hans Kosina, Siegfried Selberherr: The effect of uniaxial stress on band structure and electron mobility of silicon. Mathematics and Computers in Simulation 79(4): 1071-1077 (2008)
2007
63 René Heinzl, Philipp Schwaha, Siegfried Selberherr: Modern Concepts for High-Perfomance Scientific Computing - Library Centric Application Design. ICSOFT (SE) 2007: 100-107
62 Philipp Schwaha, Markus Schwaha, René Heinzl, Enzo Ungersboeck, Siegfried Selberherr: Simulation Methodologies for Scientific Computing - Modern Application Design. ICSOFT (SE) 2007: 270-276
61EEAlexandre Nentchev, Siegfried Selberherr: Three-dimensional on-chip inductance and resistance extraction. SBCCI 2007: 218-223
60EEViktor Sverdlov, Hans Kosina, Siegfried Selberherr: Modeling current transport in ultra-scaled field-effect transistors. Microelectronics Reliability 47(1): 11-19 (2007)
2006
59EEMichael Spevak, René Heinzl, Philipp Schwaha, Siegfried Selberherr: A Computational Framework for Topological Operations. PARA 2006: 781-790
58EERené Heinzl, Michael Spevak, Philipp Schwaha, Siegfried Selberherr: A High Performance Generic Scientific Simulation Environment. PARA 2006: 996-1005
57EEJ. Cervenka, W. Wessner, E. Al-Ani, Tibor Grasser, Siegfried Selberherr: Generation of Unstructured Meshes for Process and Device Simulation by Means of Partial Differential Equations. IEEE Trans. on CAD of Integrated Circuits and Systems 25(10): 2118-2128 (2006)
56EEW. Wessner, J. Cervenka, Clemens Heitzinger, Andreas Hössinger, Siegfried Selberherr: Anisotropic Mesh Refinement for the Simulation of Three-Dimensional Semiconductor Manufacturing Processes. IEEE Trans. on CAD of Integrated Circuits and Systems 25(10): 2129-2139 (2006)
2005
55EEViktor Sverdlov, Hans Kosina, Christian A. Ringhofer, Mihail Nedjalkov, Siegfried Selberherr: Quantum Correction to the Semiclassical Electron-Phonon Scattering Operator. LSSC 2005: 594-601
54EEStephan Wagner, Tibor Grasser, Claus Fischer, Siegfried Selberherr: An advanced equation assembly module. Eng. Comput. (Lond.) 21(2): 151-163 (2005)
53EEClemens Heitzinger, Alireza Sheikholeslami, Jong Mun Park, Siegfried Selberherr: A method for generating structurally aligned grids for semiconductor device simulation. IEEE Trans. on CAD of Integrated Circuits and Systems 24(10): 1485-1491 (2005)
2004
52EEThomas Binder, Clemens Heitzinger, Siegfried Selberherr: A study on global and local optimization techniques for TCAD analysis tasks. IEEE Trans. on CAD of Integrated Circuits and Systems 23(6): 814-822 (2004)
51EEClemens Heitzinger, Andreas Hössinger, Siegfried Selberherr: An algorithm for smoothing three-dimensional Monte Carlo ion implantation simulation results. Mathematics and Computers in Simulation 66(2-3): 219-230 (2004)
50EEStefan Holzer, Rainer Minixhofer, Clemens Heitzinger, Johannes Fellner, Tibor Grasser, Siegfried Selberherr: Extraction of material parameters based on inverse modeling of three-dimensional interconnect fusing structures. Microelectronics Journal 35(10): 805-810 (2004)
49EEClemens Heitzinger, Siegfried Selberherr: On the simulation of the formation and dissolution of silicon self-interstitial clusters and the corresponding inverse modeling problem. Microelectronics Journal 35(2): 167-171 (2004)
48EEJ. M. Park, R. Klima, Siegfried Selberherr: High-voltage lateral trench gate SOI-LDMOSFETs. Microelectronics Journal 35(3): 299-304 (2004)
47EEVassil Palankovski, Siegfried Selberherr: Rigorous modeling of high-speed semiconductor devices. Microelectronics Reliability 44(6): 889-897 (2004)
46EEChristian A. Ringhofer, Hans Kosina, Mihail Nedjalkov, Siegfried Selberherr: Semiclassical Approximation of Electron-Phonon Scattering Beyond Fermi's Golden Rule. SIAM Journal of Applied Mathematics 64(6): 1933-1953 (2004)
2003
45EEHans Kosina, Mihail Nedjalkov, Siegfried Selberherr: A Stable Backward Monte Carlo Method for the Solution of the Boltzmann Equation. LSSC 2003: 170-177
44EEMihail Nedjalkov, Hans Kosina, Siegfried Selberherr: A Weight Decomposition Approach to the Sign Problem in Wigner Transport Simulations. LSSC 2003: 178-184
43EESergey Smirnov, Hans Kosina, Mihail Nedjalkov, Siegfried Selberherr: A Zero Field Monte Carlo Algorithm Accounting for the Pauli Exclusion Principle. LSSC 2003: 185-193
42EEClemens Heitzinger, Wolfgang Pyka, Naoki Tamaoki, Toshiro Takase, Toshimitsu Ohmine, Siegfried Selberherr: Simulation of arsenic in situ doping with polysilicon CVD and its application to high aspect ratio trenches. IEEE Trans. on CAD of Integrated Circuits and Systems 22(3): 285-292 (2003)
41EEClemens Heitzinger, Andreas Hössinger, Siegfried Selberherr: On smoothing three-dimensional Monte Carlo ion implantation simulation results. IEEE Trans. on CAD of Integrated Circuits and Systems 22(7): 879-883 (2003)
40EEThomas Binder, Andreas Hössinger, Siegfried Selberherr: Rigorous integration of semiconductor process and device simulators. IEEE Trans. on CAD of Integrated Circuits and Systems 22(9): 1204-1214 (2003)
39EEHans Kosina, Mihail Nedjalkov, Siegfried Selberherr: An event bias technique for Monte Carlo device simulation. Mathematics and Computers in Simulation 62(3-6): 367-375 (2003)
38EEMihail Nedjalkov, Hans Kosina, Siegfried Selberherr: Monte Carlo algorithms for stationary device simulations. Mathematics and Computers in Simulation 62(3-6): 453-461 (2003)
37EEMihail Nedjalkov, Hans Kosina, Siegfried Selberherr: Stochastic interpretation of the Wigner transport in nanostructures. Microelectronics Journal 34(5-8): 443-445 (2003)
36EEChristian Harlander, Rainer Sabelka, Siegfried Selberherr: Efficient inductance calculation in interconnect structures by applying the Monte Carlo method. Microelectronics Journal 34(9): 815-821 (2003)
35EEAndreas Gehring, F. Jiménez-Molinos, Hans Kosina, A. Palma, F. Gámiz, Siegfried Selberherr: Modeling of retention time degradation due to inelastic trap-assisted tunneling in EEPROM devices. Microelectronics Reliability 43(9-11): 1495-1500 (2003)
34EET. Ayalew, Andreas Gehring, J. M. Park, Tibor Grasser, Siegfried Selberherr: Improving SiC lateral DMOSFET reliability under high field stress. Microelectronics Reliability 43(9-11): 1889-1894 (2003)
2002
33 Clemens Heitzinger, Siegfried Selberherr: On the Topography Simulation of Memory Cell Trenches for Semiconductor Manufacturing Deposition Processes using the Level Set Method. ESM 2002: 653-660
32EEHajdin Ceric, Siegfried Selberherr: Simulative prediction of the resistance change due to electromigration induced void evolution. Microelectronics Reliability 42(9-11): 1457-1460 (2002)
2001
31EEHans Kosina, Mihail Nedjalkov, Siegfried Selberherr: Monte Carlo Analysis of the Small-Signal Response of Charge Carriers. LSSC 2001: 175-182
2000
30 Thomas Binder, Siegfried Selberherr: Object-oriented wafer-state services. ESM 2000: 360-364
29EERobert Kosik, Peter Fleischmann, Bernhard Haindl, Paola Pietra, Siegfried Selberherr: On the interplay between meshing and discretization inthree-dimensional diffusion simulation. IEEE Trans. on CAD of Integrated Circuits and Systems 19(11): 1233-1240 (2000)
28EEAndreas Hössinger, Erasmus Langer, Siegfried Selberherr: Parallelization of a Monte Carlo ion implantation simulator. IEEE Trans. on CAD of Integrated Circuits and Systems 19(5): 560-567 (2000)
1999
27 M. Radi, Siegfried Selberherr: AMIGOS A Rapid Prototyping System. Applied Informatics 1999: 372-374
26EEPeter Fleischmann, Robert Kosik, Siegfried Selberherr: Simple Mesh Examples to Illustrate Specific Finite Element Mesh Requirements. IMR 1999: 241-246
25EEWolfgang Pyka, Peter Fleischmann, Bernhard Haindl, Siegfried Selberherr: Three-dimensional simulation of HPCVD-linking continuum transport and reaction kinetics with topography simulation. IEEE Trans. on CAD of Integrated Circuits and Systems 18(12): 1741-1749 (1999)
1998
24EERui Martins, Wolfgang Pyka, Rainer Sabelka, Siegfried Selberherr: High-precision interconnect analysis. IEEE Trans. on CAD of Integrated Circuits and Systems 17(11): 1148-1159 (1998)
23EEWalter Bohmayr, Alexander Burenkov, Jürgen Lorenz, Heiner Ryssel, Siegfried Selberherr: Monte Carlo simulation of silicon amorphization during ion implantation. IEEE Trans. on CAD of Integrated Circuits and Systems 17(12): 1236-1243 (1998)
22EERichard Plasun, Michael Stockinger, Siegfried Selberherr: Integrated optimization capabilities in the VISTA technology CAD framework. IEEE Trans. on CAD of Integrated Circuits and Systems 17(12): 1244-1251 (1998)
21EEErnst Leitner, Siegfried Selberherr: Mixed-element decomposition method for three-dimensional grid adaptation. IEEE Trans. on CAD of Integrated Circuits and Systems 17(7): 561-572 (1998)
1997
20EEHeinrich Kirchauer, Siegfried Selberherr: Rigorous three-dimensional photoresist exposure and development simulation over nonplanar topography. IEEE Trans. on CAD of Integrated Circuits and Systems 16(12): 1431-1438 (1997)
19EEChristoph Wasshuber, Hans Kosina, Siegfried Selberherr: SIMON-A simulator for single-electron tunnel devices and circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 16(9): 937-944 (1997)
1995
18EEStefan Halama, Christoph Pichler, Gerhard Rieger, Gerhard Schrom, Thomas Simlinger, Siegfried Selberherr: VISTA-user interface, task level, and tool integration. IEEE Trans. on CAD of Integrated Circuits and Systems 14(10): 1208-1222 (1995)
17EEErnst Strasser, Siegfried Selberherr: Algorithms and models for cellular based topography simulation. IEEE Trans. on CAD of Integrated Circuits and Systems 14(9): 1104-1114 (1995)
1994
16EEFranz Fasching, Walter Tuppa, Siegfried Selberherr: VISTA-the data level. IEEE Trans. on CAD of Integrated Circuits and Systems 13(1): 72-81 (1994)
15EEHans Kosina, Siegfried Selberherr: A hybrid device simulator that combines Monte Carlo and drift-diffusion analysis. IEEE Trans. on CAD of Integrated Circuits and Systems 13(2): 201-210 (1994)
1992
14EEGerd Nanz, Peter Dickinger, Siegfried Selberherr: Calculation of contact currents in device simulation. IEEE Trans. on CAD of Integrated Circuits and Systems 11(1): 128-136 (1992)
1991
13EEKarl P. Traar, Martin Stiftinger, Otto Heinreichsberger, Siegfried Selberherr: Three-dimensional simulation of semiconductor devices on supercomputers. ICS 1991: 154-162
12 Otto Heinreichsberger, Siegfried Selberherr, Martin Stiftinger: Three-Dimensional MOS Device Simulation on a Connection Machine. PPSC 1991: 388-393
1990
11EEKarl P. Traar, Wolfgang R. Mader, Otto Heinreichsberger, Siegfried Selberherr, Martin Stiftinger: High performance preconditioning on supercomputers for the 3D device simulator MINIMOS. SC 1990: 224-231
10EEMartin Thurner, Philipp Lindorfer, Siegfried Selberherr: Numerical treatment of nonrectangular field-oxide for 3-D MOSFET simulation. IEEE Trans. on CAD of Integrated Circuits and Systems 9(11): 1189-1197 (1990)
9EEMartin Thurner, Siegfried Selberherr: Three-dimensional effects due to the field oxide in MOS devices analyzed with MINIMOS 5. IEEE Trans. on CAD of Integrated Circuits and Systems 9(8): 856-867 (1990)
1989
8EEGerhard Hobler, Siegfried Selberherr: Monte Carlo simulation of ion implantation into two- and three-dimensional structures. IEEE Trans. on CAD of Integrated Circuits and Systems 8(5): 450-459 (1989)
1988
7EEGerhard Hobler, Siegfried Selberherr: Two-dimensional modeling of ion implantation induced point defects. IEEE Trans. on CAD of Integrated Circuits and Systems 7(2): 174-180 (1988)
1985
6EEPeter Pichler, Werner Jüngling, Siegfried Selberherr, Edgar Guerrero, Hans W. Pötzl: Simulation of Critical IC-Fabrication Steps. IEEE Trans. on CAD of Integrated Circuits and Systems 4(4): 384-397 (1985)
1984
5 Johannes Demel, Siegfried Selberherr: JANAP - ein Programm zur Simulation des Zeitverhaltens von nichtlinearen elektrischen Schaltungen. Simulationstechnik 1984: 149-153
4 Siegfried Selberherr, Hans W. Pötzl: Numerische Simulation von Halbleiterbauelementen. Simulationstechnik 1984: 154-158
3 Johannes Demel, Siegfried Selberherr: VDPACK - Ein benutzerorientiertes Unterprogrammpaket zur Realisierung einer dynamischen Speicherverwaltung in FORTRAN. Angewandte Informatik 26(6): 244-247 (1984)
2EESiegfried Selberherr, Christian A. Ringhofer: Implications of Analytical Investigations About the Semiconductor Equations on Device Modeling Programs. IEEE Trans. on CAD of Integrated Circuits and Systems 3(1): 52-64 (1984)
1982
1EEA. Schütz, Siegfried Selberherr, Hans W. Pötzl: Analysis of Breakdown Phenomena in MOSFET's. IEEE Trans. on CAD of Integrated Circuits and Systems 1(2): 77-85 (1982)

Coauthor Index

1E. Al-Ani [57]
2T. Ayalew [34]
3Thomas Binder [30] [40] [52]
4Walter Bohmayr [23]
5Alexander Burenkov [23]
6Hajdin Ceric [32]
7J. Cervenka [56] [57]
8Johannes Demel [3] [5]
9S. Dhar [64]
10Peter Dickinger [14]
11Otmar Ertl [66]
12Franz Fasching [16]
13Johannes Fellner [50]
14Claus Fischer [54]
15Peter Fleischmann [25] [26] [29]
16F. Gámiz [35]
17Andreas Gehring [34] [35]
18W. Gös [64]
19Tibor Grasser [34] [50] [54] [57]
20Edgar Guerrero [6]
21Bernhard Haindl [25] [29]
22Stefan Halama [18]
23Christian Harlander [36]
24Otto Heinreichsberger [11] [12] [13]
25René Heinzl [58] [59] [62] [63]
26Clemens Heitzinger [33] [41] [42] [49] [50] [51] [52] [53] [56] [67]
27Gerhard Hobler [7] [8]
28Stefan Holzer [50]
29Andreas Hössinger [28] [40] [41] [51] [56]
30F. Jiménez-Molinos [35]
31Werner Jüngling [6]
32Heinrich Kirchauer [20]
33R. Klima [48]
34Robert Kosik [26] [29]
35Hans Kosina [15] [19] [31] [35] [37] [38] [39] [43] [44] [45] [46] [55] [60] [64] [65]
36Erasmus Langer [28]
37Ernst Leitner [21]
38Philipp Lindorfer [10]
39Jürgen Lorenz [23]
40Wolfgang R. Mader [11]
41Rui Martins [24]
42Norbert Mauser [67]
43Rainer Minixhofer [50]
44Gerd Nanz [14]
45Mihail Nedjalkov [31] [37] [38] [39] [43] [44] [45] [46] [55]
46Alexandre Nentchev [61]
47Toshimitsu Ohmine [42]
48Vassil Palankovski [47]
49A. Palma [35]
50J. M. Park [34] [48]
51Jong Mun Park [53]
52Christoph Pichler [18]
53Peter Pichler [6]
54Paola Pietra [29]
55Richard Plasun [22]
56Hans W. Pötzl [1] [4] [6]
57Mahdi Pourfath [65]
58Wolfgang Pyka [24] [25] [42]
59M. Radi [27]
60Gerhard Rieger [18]
61Christian A. Ringhofer [2] [46] [55] [67]
62Heiner Ryssel [23]
63Rainer Sabelka [24] [36]
64Gerhard Schrom [18]
65A. Schütz [1]
66Markus Schwaha [62]
67Philipp Schwaha [58] [59] [62] [63]
68Alireza Sheikholeslami [53]
69Thomas Simlinger [18]
70Sergey Smirnov [43]
71Michael Spevak [58] [59]
72Martin Stiftinger [11] [12] [13]
73Michael Stockinger [22]
74Ernst Strasser [17]
75Viktor Sverdlov [55] [60] [67]
76Toshiro Takase [42]
77Naoki Tamaoki [42]
78Martin Thurner [9] [10]
79Karl P. Traar [11] [13]
80Walter Tuppa [16]
81Enzo Ungersboeck [62] [64]
82Stephan Wagner [54]
83Christoph Wasshuber [19]
84W. Wessner [56] [57]
85Thomas Windbacher [67]

Colors in the list of coauthors

Copyright © Tue Nov 3 08:52:44 2009 by Michael Ley (ley@uni-trier.de)