| 2007 |
|---|
| 6 | EE | Alodeep Sanyal,
Sandip Kundu:
On Derating Soft Error Probability Based on Strength Filtering.
IOLTS 2007: 152-160 |
| 5 | EE | Alodeep Sanyal,
Kunal P. Ganeshpure,
Sandip Kundu:
Accelerating Soft Error Rate Testing Through Pattern Selection.
IOLTS 2007: 191-193 |
| 4 | EE | Alodeep Sanyal,
Kunal P. Ganeshpure,
Sandip Kundu:
On Accelerating Soft-Error Detection by Targeted Pattern Generation.
ISQED 2007: 723-728 |
| 3 | EE | Ashesh Rastogi,
Wei Chen,
Alodeep Sanyal,
Sandip Kundu:
An Efficient Technique for Leakage Current Estimation in Sub 65nm Scaled CMOS Circuits Based on Loading Effect.
VLSI Design 2007: 583-588 |
| 2006 |
|---|
| 2 | EE | Kunal P. Ganeshpure,
Alodeep Sanyal,
Sandip Kundu:
A Pattern Generation Technique for Maximizing Power Supply Currents.
ICCD 2006 |
| 2005 |
|---|
| 1 | EE | Artem Sokolov,
Alodeep Sanyal,
L. Darrell Whitley,
Yashwant K. Malaiya:
Dynamic power minimization during combinational circuit testing as a traveling salesman problem.
Congress on Evolutionary Computation 2005: 1088-1095 |
