| * | 2009 |
|---|
| 4 | EE | Santiago Remersaro,
Janusz Rajski,
Sudhakar M. Reddy,
Irith Pomeranz:
A scalable method for the generation of small test sets.
DATE 2009: 1136-1141 |
| 2008 |
|---|
| 3 | EE | Santiago Remersaro,
Janusz Rajski,
Thomas Rinderknecht,
Sudhakar M. Reddy,
Irith Pomeranz:
ATPG Heuristics Dependant Observation Point Insertion for Enhanced Compaction and Data Volume Reduction.
DFT 2008: 385-393 |
| 2007 |
|---|
| 2 | EE | Santiago Remersaro,
Xijiang Lin,
Sudhakar M. Reddy,
Irith Pomeranz,
Janusz Rajski:
Low Shift and Capture Power Scan Tests.
VLSI Design 2007: 793-798 |
| 1 | EE | Santiago Remersaro,
Xijiang Lin,
Sudhakar M. Reddy,
Irith Pomeranz,
Janusz Rajski:
Scan-Based Tests with Low Switching Activity.
IEEE Design & Test of Computers 24(3): 268-275 (2007) |
