| * | 2009 |
|---|
| 7 | EE | Michael DeBole,
Krishnan Ramakrishnan,
Varsha Balakrishnan,
Wenping Wang,
Hong Luo,
Yu Wang,
Yuan Xie,
Yu Cao,
Narayanan Vijaykrishnan:
A framework for estimating NBTI degradation of microarchitectural components.
ASP-DAC 2009: 455-460 |
| 2008 |
|---|
| 6 | EE | Prasanth Mangalagiri,
Sungmin Bae,
Krishnan Ramakrishnan,
Yuan Xie,
Vijaykrishnan Narayanan:
Thermal-aware reliability analysis for platform FPGAs.
ICCAD 2008: 722-727 |
| 5 | EE | Krishnan Ramakrishnan,
Xiaoxia Wu,
Narayanan Vijaykrishnan,
Yuan Xie:
Comparative analysis of NBTI effects on low power and high performance flip-flops.
ICCD 2008: 200-205 |
| 4 | EE | Krishnan Ramakrishnan,
R. Rajaraman,
Narayanan Vijaykrishnan,
Yuan Xie,
Mary Jane Irwin,
K. Unlu:
Hierarchical Soft Error Estimation Tool (HSEET).
ISQED 2008: 680-683 |
| 3 | EE | Suresh Srinivasan,
Krishnan Ramakrishnan,
Prasanth Mangalagiri,
Yuan Xie,
Vijaykrishnan Narayanan,
Mary Jane Irwin,
Karthik Sarpatwari:
Toward Increasing FPGA Lifetime.
IEEE Trans. Dependable Sec. Comput. 5(2): 115-127 (2008) |
| 2007 |
|---|
| 2 | EE | Krishnan Ramakrishnan,
R. Rajaraman,
S. Suresh,
Narayanan Vijaykrishnan,
Yuan Xie,
Mary Jane Irwin:
Variation Impact on SER of Combinational Circuits.
ISQED 2007: 911-916 |
| 1 | EE | Krishnan Ramakrishnan,
S. Suresh,
Narayanan Vijaykrishnan,
Mary Jane Irwin:
Impact of NBTI on FPGAs.
VLSI Design 2007: 717-722 |
