| |
| * | 2006 | |
|---|---|---|
| 3 | EE | Ayhan A. Mutlu, Charles Kwong, Abir Mukherjee, Mahmud Rahman: Statistical circuit performance variability minimization under manufacturing variations. ISCAS 2006 |
| 2005 | ||
| 2 | EE | Norman G. Gunther, Emad Hamadeh, Darrell Niemann, Iliya Pesic, Mahmud Rahman: Modeling Intrinsic Fluctuations in Decananometer MOS Modeling Intrinsic Fluctuations in Decananometer MOS. ISQED 2005: 510-515 |
| 2003 | ||
| 1 | EE | Ayhan A. Mutlu, Norman G. Gunther, Mahmud Rahman: Concurrent optimization of process dependent variations in different circuit performance measures. ISCAS (4) 2003: 692-695 |
| 1 | Norman G. Gunther | [1] [2] |
| 2 | Emad Hamadeh | [2] |
| 3 | Charles Kwong | [3] |
| 4 | Abir Mukherjee | [3] |
| 5 | Ayhan A. Mutlu | [1] [3] |
| 6 | Darrell Niemann | [2] |
| 7 | Iliya Pesic | [2] |