Ilia Polian

2008
37	EE	Stefan Spinner, Ilia Polian, Piet Engelke, Bernd Becker, Martin Keim, Wu-Tung Cheng: Automatic Test Pattern Generation for Interconnect Open Defects. VTS 2008: 181-186
36	EE	Piet Engelke, Ilia Polian, Michel Renovell, Sandip Kundu, Bharath Seshadri, Bernd Becker: On Detection of Resistive Bridging Defects by Low-Temperature and Low-Voltage Testing. IEEE Trans. on CAD of Integrated Circuits and Systems 27(2): 327-338 (2008)
2007
35	EE	Ilia Polian, Damian Nowroth, Bernd Becker: Identification of Critical Errors in Imaging Applications. IOLTS 2007: 201-202
34	EE	John P. Hayes, Ilia Polian, Bernd Becker: An Analysis Framework for Transient-Error Tolerance. VTS 2007: 249-255
33	EE	Ilia Polian, Alejandro Czutro, Bernd Becker: Evolutionary Optimization in Code-Based Test Compression CoRR abs/0710.4670: (2007)
32	EE	Stefan Spinner, J. Bartholomeyczik, Bernd Becker, M. Doelle, O. Paul, Ilia Polian, R. Roth, K. Seitz, P. Ruther: Electromechanical Reliability Testing of Three-Axial Silicon Force Sensors CoRR abs/0711.3289: (2007)
31	EE	Ilia Polian, Alejandro Czutro, Sandip Kundu, Bernd Becker: Power Droop Testing. IEEE Design & Test of Computers 24(3): 276-284 (2007)
30	EE	Ilia Polian, Hideo Fujiwara: Functional Constraints vs. Test Compression in Scan-Based Delay Testing. J. Electronic Testing 23(5): 445-455 (2007)
2006
29	EE	Ilia Polian, Hideo Fujiwara: Functional constraints vs. test compression in scan-based delay testing. DATE 2006: 1039-1044
28		Jochen Eisinger, Ilia Polian, Bernd Becker, Alexander Metzner, Stephan Thesing, Reinhard Wilhelm: Automatic Identification of Timing Anomalies for Cycle-Accurate Worst-Case Execution Time Analysis. DDECS 2006: 15-20
27	EE	Ilia Polian, Bernd Becker, Masato Nakasato, Satoshi Ohtake, Hideo Fujiwara: Low-Cost Hardening of Image Processing Applications Against Soft Errors. DFT 2006: 274-279
26	EE	Ilia Polian, Alejandro Czutro, Sandip Kundu, Bernd Becker: Power Droop Testing. ICCD 2006
25	EE	Sandip Kundu, Ilia Polian: An Improved Technique for Reducing False Alarms Due to Soft Errors. IOLTS 2006: 105-110
24	EE	Jan Reineke, Björn Wachter, Stephan Thesing, Reinhard Wilhelm, Ilia Polian, Jochen Eisinger, Bernd Becker: A Definition and Classification of Timing Anomalies. WCET 2006
23	EE	Yuyi Tang, Hans-Joachim Wunderlich, Piet Engelke, Ilia Polian, Bernd Becker, Jürgen Schlöffel, Friedrich Hapke, Michael Wittke: X-masking during logic BIST and its impact on defect coverage. IEEE Trans. VLSI Syst. 14(2): 193-202 (2006)
22	EE	Piet Engelke, Ilia Polian, Michel Renovell, Bernd Becker: Simulating Resistive-Bridging and Stuck-At Faults. IEEE Trans. on CAD of Integrated Circuits and Systems 25(10): 2181-2192 (2006)
21	EE	Piet Engelke, Ilia Polian, Michel Renovell, Bernd Becker: Automatic Test Pattern Generation for Resistive Bridging Faults. J. Electronic Testing 22(1): 61-69 (2006)
20	EE	Bernd Becker, Ilia Polian, Sybille Hellebrand, Bernd Straube, Hans-Joachim Wunderlich: DFG-Projekt RealTest - Test und Zuverlässigkeit nanoelektronischer Systeme (DFG-Project - Test and Reliability of Nano-Electronic Systems). it - Information Technology 48(5): 304- (2006)
2005
19	EE	Sandip Kundu, Piet Engelke, Ilia Polian, Bernd Becker: On Detection of Resistive Bridging Defects by Low-Temperature and Low-Voltage Testing. Asian Test Symposium 2005: 266-271
18	EE	Ilia Polian, Thomas Fiehn, Bernd Becker, John P. Hayes: A Family of Logical Fault Models for Reversible Circuits. Asian Test Symposium 2005: 422-427
17	EE	Ilia Polian, Alejandro Czutro, Bernd Becker: Evolutionary Optimization in Code-Based Test Compression. DATE 2005: 1124-1129
16	EE	Ilia Polian, Sandip Kundu, Jean Marc Galliere, Piet Engelke, Michel Renovell, Bernd Becker: Resistive Bridge Fault Model Evolution from Conventional to Ultra Deep Submicron Technologies. VTS 2005: 343-348
15	EE	Ilia Polian, Piet Engelke, Michel Renovell, Bernd Becker: Modeling Feedback Bridging Faults with Non-Zero Resistance. J. Electronic Testing 21(1): 57-69 (2005)
14	EE	Ilia Polian: Nichtstandardfehlermodelle für digitale Logikschaltkreise: Simulation, prüfgerechter Entwurf, industrielle Anwendungen (On Non-standard Fault Models for Logic Digital Circuits: Simulation, Design for Testability, Industrial Applications). it - Information Technology 47(3): 172-174 (2005)
2004
13	EE	John P. Hayes, Ilia Polian, Bernd Becker: Testing for Missing-Gate Faults in Reversible Circuits. Asian Test Symposium 2004: 100-105
12	EE	Yuyi Tang, Hans-Joachim Wunderlich, Harald P. E. Vranken, Friedrich Hapke, Michael Wittke, Piet Engelke, Ilia Polian, Bernd Becker: X-Masking During Logic BIST and Its Impact on Defect Coverage. ITC 2004: 442-451
11	EE	Piet Engelke, Ilia Polian, Michel Renovell, Bharath Seshadri, Bernd Becker: The Pros and Cons of Very-Low-Voltage Testing: An Analysis based on Resistive Bridging Faults. VTS 2004: 171-178
2003
10	EE	Ilia Polian, Bernd Becker, Sudhakar M. Reddy: Evolutionary Optimization of Markov Sources for Pseudo Random Scan BIST. DATE 2003: 11184-11185
9	EE	Piet Engelke, Ilia Polian, Michel Renovell, Bernd Becker: Simulating Resistive Bridging and Stuck-At Faults. ITC 2003: 1051-1059
8		Ilia Polian, Bernd Becker: Reducing ATE Cost in System-on-Chip Test. VLSI-SOC 2003: 337-342
7	EE	Ilia Polian, Wolfgang Günther, Bernd Becker: Pattern-based verification of connections to intellectual property cores. Integration 35(1): 25-44 (2003)
2002
6	EE	Ilia Polian, Irith Pomeranz, Bernd Becker: Exact Computation of Maximally Dominating Faults and Its Application to n-Detection Tests. Asian Test Symposium 2002: 2-14
5	EE	Ilia Polian, Bernd Becker: Stop & Go BIST. IOLTW 2002: 147-151
4	EE	Ilia Polian, Martin Keim, Nicolai Mallig, Bernd Becker: Sequential n -Detection Criteria: Keep It Simple. IOLTW 2002: 189
3	EE	Ilia Polian, Piet Engelke, Bernd Becker: Efficient Bridging Fault Simulation of Sequential Circuits Based on Multi-Valued Logics. ISMVL 2002: 216-
2001
2	EE	Ilia Polian, Wolfgang Günther, Bernd Becker: Efficient Pattern-Based Verification of Connections to IP Cores . Asian Test Symposium 2001: 443-448
1	EE	Ilia Polian, Bernd Becker: Multiple Scan Chain Design for Two-Pattern Testing. VTS 2001: 88-93

Coauthor Index

1	J. Bartholomeyczik	[32]
2	Bernd Becker	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [15] [16] [17] [18] [19] [20] [21] [22] [23] [24] [26] [27] [28] [31] [32] [33] [34] [35] [36] [37]
3	Wu-Tung Cheng	[37]
4	Alejandro Czutro	[17] [26] [31] [33]
5	M. Doelle	[32]
6	Jochen Eisinger	[24] [28]
7	Piet Engelke	[3] [9] [11] [12] [15] [16] [19] [21] [22] [23] [36] [37]
8	Thomas Fiehn	[18]
9	Hideo Fujiwara	[27] [29] [30]
10	Jean Marc Galliere	[16]
11	Wolfgang Günther	[2] [7]
12	Friedrich Hapke	[12] [23]
13	John P. Hayes	[13] [18] [34]
14	Sybille Hellebrand	[20]
15	Martin Keim	[4] [37]
16	Sandip Kundu	[16] [19] [25] [26] [31] [36]
17	Nicolai Mallig	[4]
18	Alexander Metzner	[28]
19	Masato Nakasato	[27]
20	Damian Nowroth	[35]
21	Satoshi Ohtake	[27]
22	O. Paul	[32]
23	Irith Pomeranz	[6]
24	Sudhakar M. Reddy	[10]
25	Jan Reineke	[24]
26	Michel Renovell	[9] [11] [15] [16] [21] [22] [36]
27	R. Roth	[32]
28	P. Ruther	[32]
29	Jürgen Schlöffel	[23]
30	K. Seitz	[32]
31	Bharath Seshadri	[11] [36]
32	Stefan Spinner	[32] [37]
33	Bernd Straube	[20]
34	Yuyi Tang	[12] [23]
35	Stephan Thesing	[24] [28]
36	Harald P. E. Vranken	[12]
37	Björn Wachter	[24]
38	Reinhard Wilhelm	[24] [28]
39	Michael Wittke	[12] [23]
40	Hans-Joachim Wunderlich	[12] [20] [23]