| |
| 2006 | ||
|---|---|---|
| 1 | EE | Jeffrey E. Nelson, Thomas Zanon, Jason G. Brown, Osei Poku, R. D. (Shawn) Blanton, Wojciech Maly, Brady Benware, Chris Schuermyer: Extracting Defect Density and Size Distributions from Product ICs. IEEE Design & Test of Computers 23(5): 390-400 (2006) |
| 1 | Brady Benware | [1] |
| 2 | R. D. (Shawn) Blanton (Ronald D. Blanton) | [1] |
| 3 | Jason G. Brown | [1] |
| 4 | Wojciech Maly | [1] |
| 5 | Jeffrey E. Nelson | [1] |
| 6 | Chris Schuermyer | [1] |
| 7 | Thomas Zanon | [1] |