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Philippe Perdu Vis

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*2007
32EEJulie Ferrigno, Philippe Perdu, Kevin Sanchez, Dean Lewis: Identification of process/design issues during 0.18 µm technology qualification for space application. DATE 2007: 989-993
2006
31EEA. Douin, V. Pouget, M. De Matos, D. Lewis, Philippe Perdu, Pascal Fouillat: Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation. Microelectronics Reliability 46(9-11): 1514-1519 (2006)
30EEF. Essely, F. Darracq, V. Pouget, M. Remmach, Felix Beaudoin, N. Guitard, M. Bafleur, Philippe Perdu, A. Touboul, D. Lewis: Application of various optical techniques for ESD defect localization. Microelectronics Reliability 46(9-11): 1563-1568 (2006)
29EEC. De Nardi, Romain Desplats, Philippe Perdu, J.-L. Gauffier, C. Guérin: Descrambling and data reading techniques for flash-EEPROM memories. Application to smart cards. Microelectronics Reliability 46(9-11): 1569-1574 (2006)
2005
28EEA. Douin, V. Pouget, D. Lewis, Pascal Fouillat, Philippe Perdu: Electrical Modeling for Laser Testing with Different Pulse Durations. IOLTS 2005: 9-13
27EEN. Guitard, F. Essely, D. Trémouilles, M. Bafleur, N. Nolhier, Philippe Perdu, A. Touboul, V. Pouget, D. Lewis: Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure. Microelectronics Reliability 45(9-11): 1415-1420 (2005)
26EEKevin Sanchez, Romain Desplats, Felix Beaudoin, Philippe Perdu, J. P. Roux, G. Woods, D. Lewis: NIR laser stimulation for dynamic timing analysis. Microelectronics Reliability 45(9-11): 1459-1464 (2005)
25EEAbdellatif Firiti, Felix Beaudoin, G. Haller, Philippe Perdu, D. Lewis, Pascal Fouillat: Impact of semiconductors material on IR Laser Stimulation signal. Microelectronics Reliability 45(9-11): 1465-1470 (2005)
24EEM. Remmach, A. Pigozzi, Romain Desplats, Philippe Perdu, D. Lewis, J. Noel, S. Dudit: Light Emission to Time Resolved Emission For IC Debug and Failure Analysis. Microelectronics Reliability 45(9-11): 1476-1481 (2005)
23EEC. De Nardi, Romain Desplats, Philippe Perdu, Felix Beaudoin, J.-L. Gauffier: Oxide charge measurements in EEPROM devices. Microelectronics Reliability 45(9-11): 1514-1519 (2005)
22EEFelix Beaudoin, Kevin Sanchez, Romain Desplats, Philippe Perdu, J. M. Nicot, J. P. Roux, M. Otte: Dynamic Laser Stimulation Case Studies. Microelectronics Reliability 45(9-11): 1538-1543 (2005)
21EED. Briand, Felix Beaudoin, J. Courbat, N. F. de Rooij, Romain Desplats, Philippe Perdu: Failure analysis of micro-heating elements suspended on thin membranes. Microelectronics Reliability 45(9-11): 1786-1789 (2005)
2003
20EERomain Desplats, Felix Beaudoin, Philippe Perdu, Nagamani Nataraj, Ted Lundquist, Ketan Shah: Fault Localization using Time Resolved Photon Emission and STIL Waveforms. ITC 2003: 254-263
19EET. Beauchêne, D. Lewis, Felix Beaudoin, V. Pouget, Philippe Perdu, Pascal Fouillat, Y. Danto: A physical approach on SCOBIC investigation in VLSI. Microelectronics Reliability 43(1): 173-177 (2003)
18EED. Trémouilles, G. Bertrand, M. Bafleur, Felix Beaudoin, Philippe Perdu, N. Guitard, L. Lescouzères: TCAD and SPICE modeling help solve ESD protection issues in analog CMOS technology. Microelectronics Reliability 43(1): 71-79 (2003)
17EET. Beauchêne, D. Lewis, Felix Beaudoin, V. Pouget, Romain Desplats, Pascal Fouillat, Philippe Perdu, M. Bafleur, D. Trémouilles: Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization. Microelectronics Reliability 43(3): 439-444 (2003)
16EEAbdellatif Firiti, D. Faujour, G. Haller, J. M. Moragues, V. Goubier, Philippe Perdu, Felix Beaudoin, D. Lewis: Short defect characterization based on TCR parameter extraction. Microelectronics Reliability 43(9-11): 1563-1568 (2003)
15EET. Beauchêne, D. Trémouilles, D. Lewis, Philippe Perdu, Pascal Fouillat: Characterization of ESD induced defects using Photovoltaic Laser Stimulation (PLS). Microelectronics Reliability 43(9-11): 1577-1582 (2003)
14EEM. Remmach, Romain Desplats, Felix Beaudoin, E. Frances, Philippe Perdu, D. Lewis: Time Resolved Photoemission (PICA) - From the Physics to Practical Considerations. Microelectronics Reliability 43(9-11): 1639-1644 (2003)
13EERomain Desplats, A. Eral, Felix Beaudoin, Philippe Perdu, Alan J. Weger, Moyra K. McManus, Peilin Song, Franco Stellari: Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling. Microelectronics Reliability 43(9-11): 1663-1668 (2003)
12EEFelix Beaudoin, Romain Desplats, Philippe Perdu, Abdellatif Firiti, G. Haller, V. Pouget, D. Lewis: From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing. Microelectronics Reliability 43(9-11): 1681-1686 (2003)
11EEKevin Sanchez, Romain Desplats, G. Perez, V. Pichetto, Felix Beaudoin, Philippe Perdu: Solar Cell Analysis with Light Emission and OBIC Techniques. Microelectronics Reliability 43(9-11): 1755-1760 (2003)
10EEO. Crépel, Romain Desplats, Y. Bouttement, Philippe Perdu, C. Goupil, Ph. Descamps, Felix Beaudoin, L. Marina: Magnetic emission mapping for passive integrated components characterisation. Microelectronics Reliability 43(9-11): 1809-1814 (2003)
2002
9EEFelix Beaudoin, D. Carisetti, Romain Desplats, Philippe Perdu, D. Lewis, J. C. Clement: Backside Defect Localizations and Revelations Techniques on Gallium Arsenide (GaAs) Devices. Microelectronics Reliability 42(9-11): 1581-1585 (2002)
8EEFelix Beaudoin, G. Haller, Philippe Perdu, Romain Desplats, T. Beauchêne, D. Lewis: Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased. Microelectronics Reliability 42(9-11): 1729-1734 (2002)
7EEO. Crépel, Felix Beaudoin, L. Dantas de Morais, G. Haller, C. Goupil, Philippe Perdu, Romain Desplats, D. Lewis: Backside Hot Spot Detection Using Liquid Crystal Microscopy. Microelectronics Reliability 42(9-11): 1741-1746 (2002)
6EEO. Crépel, C. Goupil, B. Domengès, Ph. Descamps, Philippe Perdu, A. Doukkali: Magnetic field measurements for Non Destructive Failure Analysis. Microelectronics Reliability 42(9-11): 1763-1766 (2002)
2001
5 D. Lewis, V. Pouget, T. Beauchêne, Hervé Lapuyade, Pascal Fouillat, A. Touboul, Felix Beaudoin, Philippe Perdu: Front Side and Backside OBIT Mappings applied to Single Event Transient Testing. Microelectronics Reliability 41(9-10): 1471-1476 (2001)
4 Felix Beaudoin, X. Chauffleur, J. P. Fradin, Philippe Perdu, Romain Desplats, D. Lewis: Modeling Thermal Laser Stimulation. Microelectronics Reliability 41(9-10): 1477-1482 (2001)
3 Romain Desplats, Philippe Perdu, Felix Beaudoin: A New Versatile Testing Interface for Failure Analysis in Integrated Circuits. Microelectronics Reliability 41(9-10): 1495-1499 (2001)
2 Romain Desplats, Felix Beaudoin, Philippe Perdu, P. Poirier, D. Trémouilles, M. Bafleur, D. Lewis: Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation. Microelectronics Reliability 41(9-10): 1539-1544 (2001)
1 Felix Beaudoin, Philippe Perdu, Romain Desplats, S. Rigo, D. Lewis: Silicon Thinning and Polishing on Packaged Devices. Microelectronics Reliability 41(9-10): 1557-1561 (2001)

Coauthor Index

1M. Bafleur [2] [17] [18] [27] [30]
2T. Beauchêne [5] [8] [15] [17] [19]
3Felix Beaudoin [1] [2] [3] [4] [5] [7] [8] [9] [10] [11] [12] [13] [14] [16] [17] [18] [19] [20] [21] [22] [23] [25] [26] [30]
4G. Bertrand [18]
5Y. Bouttement [10]
6D. Briand [21]
7D. Carisetti [9]
8X. Chauffleur [4]
9J. C. Clement [9]
10J. Courbat [21]
11O. Crépel [6] [7] [10]
12Y. Danto [19]
13F. Darracq [30]
14Ph. Descamps [6] [10]
15Romain Desplats [1] [2] [3] [4] [7] [8] [9] [10] [11] [12] [13] [14] [17] [20] [21] [22] [23] [24] [26] [29]
16B. Domengès [6]
17A. Douin [28] [31]
18A. Doukkali [6]
19S. Dudit [24]
20A. Eral [13]
21F. Essely [27] [30]
22D. Faujour [16]
23Julie Ferrigno [32]
24Abdellatif Firiti [12] [16] [25]
25Pascal Fouillat [5] [15] [17] [19] [25] [28] [31]
26J. P. Fradin [4]
27E. Frances [14]
28J.-L. Gauffier [23] [29]
29V. Goubier [16]
30C. Goupil [6] [7] [10]
31C. Guérin [29]
32N. Guitard [18] [27] [30]
33G. Haller [7] [8] [12] [16] [25]
34Hervé Lapuyade [5]
35L. Lescouzères [18]
36D. Lewis [1] [2] [4] [5] [7] [8] [9] [12] [14] [15] [16] [17] [19] [24] [25] [26] [27] [28] [30] [31]
37Dean Lewis [32]
38Ted Lundquist [20]
39L. Marina [10]
40M. De Matos [31]
41Moyra K. McManus [13]
42J. M. Moragues [16]
43L. Dantas de Morais [7]
44C. De Nardi [23] [29]
45Nagamani Nataraj [20]
46J. M. Nicot [22]
47J. Noel [24]
48N. Nolhier [27]
49M. Otte [22]
50G. Perez [11]
51V. Pichetto [11]
52A. Pigozzi [24]
53P. Poirier [2]
54V. Pouget [5] [12] [17] [19] [27] [28] [30] [31]
55M. Remmach [14] [24] [30]
56S. Rigo [1]
57N. F. de Rooij [21]
58J. P. Roux [22] [26]
59Kevin Sanchez [11] [22] [26] [32]
60Ketan Shah [20]
61Peilin Song [13]
62Franco Stellari [13]
63A. Touboul [5] [27] [30]
64D. Trémouilles [2] [15] [17] [18] [27]
65Alan J. Weger [13]
66G. Woods [26]

Copyright © Tue Nov 3 08:52:44 2009 by Michael Ley (ley@uni-trier.de)