Michael G. Pecht Vis

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19EEYuki Fukuda, Michael D. Osterman, Michael G. Pecht: The impact of electrical current, mechanical bending, and thermal annealing on tin whisker growth. Microelectronics Reliability 47(1): 88-92 (2007)
18EEMohammadreza Keimasi, Sanka Ganesan, Michael G. Pecht: Low temperature electrical measurements of silicon bipolar monolithic microwave integrated circuit (MMIC) amplifiers. Microelectronics Reliability 46(2-4): 326-334 (2006)
17EESanka Ganesan, Michael G. Pecht, Sharon Ling: Use of high temperature operating life data to mitigate risks in long-duration space applications that deploy commercial-grade plastic encapsulated semiconductor devices. Microelectronics Reliability 46(2-4): 360-366 (2006)
16EEDaniel N. Donahoe, Michael G. Pecht, Isabel K. Lloyd, Sanka Ganesan: Moisture induced degradation of multilayer ceramic capacitors. Microelectronics Reliability 46(2-4): 400-408 (2006)
15EETong Fang, Michael D. Osterman, Michael G. Pecht: Statistical analysis of tin whisker growth. Microelectronics Reliability 46(5-6): 846-849 (2006)
14EEJingsong Xie, Michael G. Pecht: Contact discontinuity modeling of electromechanical switches. IEEE Transactions on Reliability 53(2): 279-283 (2004)
13EEArun Ramakrishnan, Michael G. Pecht: Load characterization during transportation. Microelectronics Reliability 44(2): 333-338 (2004)
12EEC. Hillman, B. Castillo, Michael G. Pecht: Diffusion and absorption of corrosive gases in electronic encapsulants. Microelectronics Reliability 43(4): 635-643 (2003)
11EEPing Zhao, Michael G. Pecht: Field failure due to creep corrosion on components with palladium pre-plated leadframes. Microelectronics Reliability 43(5): 775-783 (2003)
10EERicky Valentin, Jeremy Cunningham, Michael D. Osterman, Abhijit Dasgupta II, Michael G. Pecht, Dinos Tsagos: Weapon and communication systems: virtual life assessment of electronic hardware used in the Advanced Amphibious Assault Vehicle (AAAV). Winter Simulation Conference 2002: 948-953
9EENinoslav Stojadinovic, Michael G. Pecht: Editorial. Microelectronics Reliability 42(4-5): 463 (2002)
8EEDawn A. Thomas, Ken Ayers, Michael G. Pecht: The "trouble not identified" phenomenon in automotive electronics. Microelectronics Reliability 42(4-5): 641-651 (2002)
7EELeon Lantz, Seongdeok Hwang, Michael G. Pecht: Characterization of plastic encapsulant materials as a baseline for quality assessment and reliability testing. Microelectronics Reliability 42(8): 1163-1170 (2002)
6EEMichael G. Pecht, Diganta Das, Arun Ramakrishnan: The IEEE standards on reliability program and reliability prediction methods for electronic equipment. Microelectronics Reliability 42(9-11): 1259-1266 (2002)
5EENinoslav Stojadinovic, Michael G. Pecht: Editorial. Microelectronics Reliability 41(1): 1 (2001)
4EEBharatwaj Ramakrishnan, Peter Sandborn, Michael G. Pecht: Process capability indices and product reliability. Microelectronics Reliability 41(12): 2067-2070 (2001)
3EEJingsong Xie, Michael G. Pecht, David DeDonato, Ali Hassanzadeh: An investigation of the mechanical behavior of conductive elastomer interconnects. Microelectronics Reliability 41(2): 281-286 (2001)
2EENinoslav Stojadinovic, Michael G. Pecht: In memory of D. Stewart Peck. Microelectronics Reliability 41(4): 481 (2001)
1EEMichael D. Osterman, Michael G. Pecht: Placement for reliability and routability of convectively cooled PWBs. IEEE Trans. on CAD of Integrated Circuits and Systems 9(7): 734-744 (1990)

Coauthor Index

1Ken Ayers [8]
2B. Castillo [12]
3Jeremy Cunningham [10]
4Diganta Das [6]
5Abhijit Dasgupta II [10]
6David DeDonato [3]
7Daniel N. Donahoe [16]
8Tong Fang [15]
9Yuki Fukuda [19]
10Sanka Ganesan [16] [17] [18]
11Ali Hassanzadeh [3]
12C. Hillman [12]
13Seongdeok Hwang [7]
14Mohammadreza Keimasi [18]
15Leon Lantz [7]
16Sharon Ling [17]
17Isabel K. Lloyd [16]
18Michael D. Osterman [1] [10] [15] [19]
19Arun Ramakrishnan [6] [13]
20Bharatwaj Ramakrishnan [4]
21Peter Sandborn [4]
22Ninoslav Stojadinovic [2] [5] [9]
23Dawn A. Thomas [8]
24Dinos Tsagos [10]
25Ricky Valentin [10]
26Jingsong Xie [3] [14]
27Ping Zhao [11]

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Copyright © Tue Nov 3 08:52:44 2009 by Michael Ley (ley@uni-trier.de)