Byung-Gook Park Vis

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12EESeongjae Cho, Jung Hoon Lee, Gil Sung Lee, Jong Duk Lee, Hyungcheol Shin, Byung-Gook Park: Design Consideration for Vertical Nonvolatile Memory Device Regarding Gate-Induced Barrier Lowering (GIBL). IEICE Transactions 92-C(5): 620-626 (2009)
11EEJongwook Jeon, Ickhyun Song, Jong Duk Lee, Byung-Gook Park, Hyungcheol Shin: Application of the Compact Channel Thermal Noise Model of Short Channel MOSFETs to CMOS RFIC Design. IEICE Transactions 92-C(5): 627-634 (2009)
10EESang Hyuk Park, Sangwoo Kang, Seongjae Cho, Dong-Seup Lee, Jung Han Lee, Hong-Seon Yang, Kwon-Chil Kang, Joung-Eob Lee, Jong Duk Lee, Byung-Gook Park: Recessed Channel Dual Gate Single Electron Transistors (RCDG-SETs) for Room Temperature Operation. IEICE Transactions 92-C(5): 647-652 (2009)
9EEYoon Kim, Seongjae Cho, Gil Sung Lee, Il Han Park, Jong Duk Lee, Hyungcheol Shin, Byung-Gook Park: 3-Dimensional Terraced NAND (3D TNAND) Flash Memory-Stacked Version of Folded NAND Array. IEICE Transactions 92-C(5): 653-658 (2009)
8EEDoo-Hyun Kim, Il Han Park, Seongjae Cho, Jong Duk Lee, Hyungcheol Shin, Byung-Gook Park: Simulation of Retention Characteristics in Double-Gate Structure Multi-Bit SONOS Flash Memory. IEICE Transactions 92-C(5): 659-663 (2009)
7EESeongjae Cho, Il Han Park, Jung Hoon Lee, Jang-Gn Yun, Doo-Hyun Kim, Jong Duk Lee, Hyungcheol Shin, Byung-Gook Park: Establishing Read Operation Bias Schemes for 3-D Pillar Structure Flash Memory Devices to Overcome Paired Cell Interference (PCI). IEICE Transactions 91-C(5): 731-735 (2008)
6EEJang-Gn Yun, Il Han Park, Seongjae Cho, Jung Hoon Lee, Doo-Hyun Kim, Gil Sung Lee, Yoon Kim, Jong Duk Lee, Byung-Gook Park: Characterization of 2-bit Recessed Channel Memory with Lifted-Charge Trapping Node (L-CTN) Scheme. IEICE Transactions 91-C(5): 742-746 (2008)
5EEJong Pil Kim, Woo Young Choi, Jae Young Song, Seongjae Cho, Sang Wan Kim, Jong Duk Lee, Byung-Gook Park: Design and Simulation of Asymmetric MOSFETs. IEICE Transactions 90-C(5): 978-982 (2007)
4EESeongjae Cho, Jang-Gn Yun, Il Han Park, Jung Hoon Lee, Jong Pil Kim, Jong Duk Lee, Hyungcheol Shin, Byung-Gook Park: Analyses on Current Characteristics of 3-D MOSFET Determined by Junction Doping Profiles for Nonvolatile Memory Devices. IEICE Transactions 90-C(5): 988-993 (2007)
3EEHyuck In Kwon, In Man Kang, Byung-Gook Park, Jong Duk Lee, Sang Sik Park, Jung Chak Ahn, Yong Hee Lee: Effects of electrical stress on mid-gap interface trap density and capture cross sections in n-MOSFETs characterized by pulsed interface probing measurements. Microelectronics Reliability 44(1): 47-51 (2004)
2EEWoo Young Choi, Jong Duk Lee, Byung-Gook Park: Reverse-order source/drain formation with double offset spacer (RODOS) for CMOS low-power, high-speed and low-noise amplifiers. ISLPED 2003: 189-192
1EEKi-Whan Song, Sang-Hoon Lee, Dae Hwan Kim, Kyung Rok Kim, Jaewoo Kyung, Gwanghyeon Baek, Chun-An Lee, Jong Duk Lee, Byung-Gook Park: Complementary Self-Biased Scheme for the Robust Design of CMOS/SET Hybrid Multi-Valued Logic. ISMVL 2003: 267-272

Coauthor Index

1Jung Chak Ahn [3]
2Gwanghyeon Baek [1]
3Seongjae Cho [4] [5] [6] [7] [8] [9] [10] [12]
4Woo Young Choi [2] [5]
5Jongwook Jeon [11]
6In Man Kang [3]
7Kwon-Chil Kang [10]
8Sangwoo Kang [10]
9Dae Hwan Kim [1]
10Doo-Hyun Kim [6] [7] [8]
11Jong Pil Kim [4] [5]
12Kyung Rok Kim [1]
13Sang Wan Kim [5]
14Yoon Kim [6] [9]
15Hyuck In Kwon [3]
16Jaewoo Kyung [1]
17Chun-An Lee [1]
18Dong-Seup Lee [10]
19Gil Sung Lee [6] [9] [12]
20Jong Duk Lee [1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12]
21Joung-Eob Lee [10]
22Jung Han Lee [10]
23Jung Hoon Lee [4] [6] [7] [12]
24Sang-Hoon Lee [1]
25Yong Hee Lee [3]
26Il Han Park [4] [6] [7] [8] [9]
27Sang Hyuk Park [10]
28Sang Sik Park [3]
29Hyungcheol Shin [4] [7] [8] [9] [11] [12]
30Ickhyun Song [11]
31Jae Young Song [5]
32Ki-Whan Song [1]
33Hong-Seon Yang [10]
34Jang-Gn Yun [4] [6] [7]

Copyright © Tue Nov 3 08:52:44 2009 by Michael Ley (ley@uni-trier.de)