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Vitalij Ocheretnij Vis

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*2006
15EEDaniel Marienfeld, Egor S. Sogomonyan, Vitalij Ocheretnij, Michael Gössel: A New Self-Checking and Code-Disjoint Non-Restoring Array Divider. IOLTS 2006: 23-30
14EEVitalij Ocheretnij, Michael Gössel, Egor S. Sogomonyan, Daniel Marienfeld: Modulo p=3 Checking for a Carry Select Adder. J. Electronic Testing 22(1): 101-107 (2006)
2005
13EEDaniel Marienfeld, Egor S. Sogomonyan, Vitalij Ocheretnij, Michael Gössel: New Self-checking Output-Duplicated Booth Multiplier with High Fault Coverage for Soft Errors. Asian Test Symposium 2005: 76-81
12EEVitalij Ocheretnij, G. Kouznetsov, Ramesh Karri, Michael Gössel: On-Line Error Detection and BIST for the AES Encryption Algorithm with Different S-Box Implementations. IOLTS 2005: 141-146
2004
11 Egor S. Sogomonyan, Daniel Marienfeld, Vitalij Ocheretnij, Michael Gössel: Self-checking Carry-selectAdder with Sum-bit Duplication. ARCS Workshops 2004: 84-91
10EEEgor S. Sogomonyan, Daniel Marienfeld, Vitalij Ocheretnij, Michael Gössel: A New Self-Checking Sum-Bit Duplicated Carry-Select Adder. DATE 2004: 1360-1361
9EEVitalij Ocheretnij, Daniel Marienfeld, Egor S. Sogomonyan, Michael Gössel: Self-Checking Code-Disjoint Carry-Select Adder with Low Area Overhead by Use of Add1-Circuits. IOLTS 2004: 31-36
8EEMichael Gössel, Krishnendu Chakrabarty, Vitalij Ocheretnij, Andreas Leininger: A Signature Analysis Technique for the Identification of Failing Vectors with Application to Scan-BIST. J. Electronic Testing 20(6): 611-622 (2004)
2003
7EEVitalij Ocheretnij, Michael Gössel, Egor S. Sogomonyan, Daniel Marienfeld: A Modulo p Checked Self-Checking Carry Select Adder. IOLTS 2003: 25-29
2002
6EEDaniel Marienfeld, Vitalij Ocheretnij, Michael Gössel, Egor S. Sogomonyan: Partially Duplicated Code-Disjoint Carry-Skip Adder. DFT 2002: 78-86
5EEDaniel Marienfeld, Egor S. Sogomonyan, Vitalij Ocheretnij, Michael Gössel: A New Self-Checking Code-Disjoint Carry-Skip Adder. IOLTW 2002: 39-43
2001
4EEVitalij Ocheretnij, Egor S. Sogomonyan, Michael Gössel: A New Code-Disjoint Sum-Bit Duplicated Carry Look-Ahead Adder for Parity Codes. Asian Test Symposium 2001: 365-
3EEMichael Gössel, Vitalij Ocheretnij, S. Chakrabarty: Diagnosis by Repeated Application of Specific Test Inputs and by Output Monitoring of the MISA. Asian Test Symposium 2001: 57-62
2EEVitalij Ocheretnij, Michael Gössel, Egor S. Sogomonyan: Code-Disjoint Carry-Dependent Sum Adder with Partial Look-Ahead. IOLTW 2001: 147-152
2000
1EEVitalij Ocheretnij, Michael Gössel, Vl. V. Saposhnikov, V. V. Saposhnikov: A New Method of Redundancy Addition for Circuit Optimization. EUROMICRO 2000: 1172-

Coauthor Index

1Krishnendu Chakrabarty [8]
2S. Chakrabarty [3]
3Michael Gössel [1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15]
4Ramesh Karri [12]
5G. Kouznetsov [12]
6Andreas Leininger [8]
7Daniel Marienfeld [5] [6] [7] [9] [10] [11] [13] [14] [15]
8V. V. Saposhnikov [1]
9Vl. V. Saposhnikov [1]
10Egor S. Sogomonyan [2] [4] [5] [6] [7] [9] [10] [11] [13] [14] [15]

Copyright © Tue Nov 3 08:52:44 2009 by Michael Ley (ley@uni-trier.de)