B. Muralikrishnan Vis

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* 2002

1 EE B. Muralikrishnan, K. Najarian, J. Raja: Process Mapping and Functional Correlation in Surface Metrology: A Novel Clustering Application. ICPR (1) 2002: 29-32

*	2002
1	EE	B. Muralikrishnan, K. Najarian, J. Raja: Process Mapping and Functional Correlation in Surface Metrology: A Novel Clustering Application. ICPR (1) 2002: 29-32

Coauthor Index

1 K. Najarian [1]

2 J. Raja [1]