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Koji Miyamoto Vis

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*2002
2EEMahesh S. Krishnan, Viktor Kol'dyaev, Eiji Morifoji, Koji Miyamoto, Tomasz Brozek, Xiaolei Li: Series resistance degradation due to NBTI in PMOSFET. Microelectronics Reliability 42(9-11): 1433-1438 (2002)
2000
1EEShaoying Liu, Tetsuo Fukuzaki, Koji Miyamoto: A GUI and testing tool for SOFL. APSEC 2000: 421-

Coauthor Index

1Tomasz Brozek [2]
2Tetsuo Fukuzaki [1]
3Viktor Kol'dyaev [2]
4Mahesh S. Krishnan [2]
5Xiaolei Li [2]
6Shaoying Liu [1]
7Eiji Morifoji [2]

Colors in the list of coauthors

Copyright © Tue Nov 3 08:52:44 2009 by Michael Ley (ley@uni-trier.de)