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Subhasish Mitra Vis

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*2009
81EENishant Patil, Albert Lin, Jie Zhang, H.-S. Philip Wong, Subhasish Mitra: Digital VLSI logic technology using Carbon Nanotube FETs: frequently asked questions. DAC 2009: 304-309
80EEJie Zhang, Nishant Patil, Arash Hazeghi, Subhasish Mitra: Carbon nanotube circuits in the presence of carbon nanotube density variations. DAC 2009: 71-76
79EESubhasish Mitra, Jie Zhang, Nishant Patil, Hai Wei: Imperfection-immune VLSI logic circuits using Carbon Nanotube Field Effect Transistors. DATE 2009: 436-441
2008
78EESung-Boem Park, Subhasish Mitra: IFRA: instruction footprint recording and analysis for post-silicon bug localization in processors. DAC 2008: 373-378
77EEJie Zhang, Nishant Patil, Subhasish Mitra: Design Guidelines for Metallic-Carbon-Nanotube-Tolerant Digital Logic Circuits. DATE 2008: 1009-1014
76EENeeraj Suri, Christof Fetzer, Jacob Abraham, Stefan Poledna, Avi Mendelson, Subhasish Mitra: Dependable Embedded Systems Special Day Panel: Issues and Challenges in Dependable Embedded Systems. DATE 2008: 1394-1395
75EEYanjing Li, Samy Makar, Subhasish Mitra: CASP: Concurrent Autonomous Chip Self-Test Using Stored Test Patterns. DATE 2008: 885-890
74EESubhasish Mitra: Globally Optimized Robust Systems to Overcome Scaled CMOS Reliability Challenges. DATE 2008: 941-946
73EEDimitris Gizopoulos, Kaushik Roy, Subhasish Mitra, Pia Sanda: Soft Errors: System Effects, Protection Techniques and Case Studies. DATE 2008
72EESubhasish Mitra, Ravishankar K. Iyer, Kishor S. Trivedi, James W. Tschanz: Reliable system design: models, metrics and design techniques. ICCAD 2008: 3
71EEIgor Loi, Subhasish Mitra, Thomas H. Lee, Shinobu Fujita, Luca Benini: A low-overhead fault tolerance scheme for TSV-based 3D network on chip links. ICCAD 2008: 598-602
70EESubhasish Mitra: Tutorial 4: Robust System Design in Scaled CMOS. ISQED 2008: 6
69EETze Wee Chen, Kyunglok Kim, Young Moon Kim, Subhasish Mitra: Gate-Oxide Early Life Failure Prediction. VTS 2008: 111-118
68EERohit Kapur, Subhasish Mitra, Thomas W. Williams: Historical Perspective on Scan Compression. IEEE Design & Test of Computers 25(2): 114-120 (2008)
67EENaresh R. Shanbhag, Subhasish Mitra, Gustavo de Veciana, Michael Orshansky, Radu Marculescu, Jaijeet Roychowdhury, Douglas L. Jones, Jan M. Rabaey: The Search for Alternative Computational Paradigms. IEEE Design & Test of Computers 25(4): 334-343 (2008)
66EENishant Patil, Jie Deng, Albert Lin, H.-S. Philip Wong, Subhasish Mitra: Design Methods for Misaligned and Mispositioned Carbon-Nanotube Immune Circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 27(10): 1725-1736 (2008)
2007
65EENishant Patil, Jie Deng, H.-S. Philip Wong, Subhasish Mitra: Automated Design of Misaligned-Carbon-Nanotube-Immune Circuits. DAC 2007: 958-961
64EESanjit A. Seshia, Wenchao Li, Subhasish Mitra: Verification-guided soft error resilience. DATE 2007: 1442-1447
63EESubhasish Mitra: Circuit Failure Prediction Enables Robust System Design Resilient to Aging and Wearout. IOLTS 2007: 123
62EESubhasish Mitra, Pia Sanda, Norbert Seifert: Soft Errors: Technology Trends, System Effects, and Protection Techniques. IOLTS 2007: 4
61EEMridul Agarwal, Bipul C. Paul, Ming Zhang, Subhasish Mitra: Circuit Failure Prediction and Its Application to Transistor Aging. VTS 2007: 277-286
60EEMehdi Baradaran Tahoori, Subhasish Mitra: Application-Dependent Delay Testing of FPGAs. IEEE Trans. on CAD of Integrated Circuits and Systems 26(3): 553-563 (2007)
2006
59EET. M. Mak, Subhasish Mitra: Should Logic SER be Solved at the Circuit Level? IOLTS 2006: 199
58EEBob Mungamuru, Hector Garcia-Molina, Subhasish Mitra: How To Safeguard Your Sensitive Data. SRDS 2006: 199-211
57EESubhasish Mitra, Ming Zhang, Norbert Seifert, T. M. Mak, Kee Sup Kim: Soft Error Resilient System Design through Error Correction. VLSI-SoC 2006: 332-337
56EERuifeng Guo, Subhasish Mitra, Enamul Amyeen, Jinkyu Lee, Srihari Sivaraj, Srikanth Venkataraman: Evaluation of Test Metrics: Stuck-at, Bridge Coverage Estimate and Gate Exhaustive. VTS 2006: 66-71
55EESubhasish Mitra, Kee Sup Kim: XPAND: An Efficient Test Stimulus Compression Technique. IEEE Trans. Computers 55(2): 163-173 (2006)
54EEMing Zhang, Subhasish Mitra, T. M. Mak, Norbert Seifert, N. J. Wang, Quan Shi, Kee Sup Kim, Naresh R. Shanbhag, S. J. Patel: Sequential Element Design With Built-In Soft Error Resilience. IEEE Trans. VLSI Syst. 14(12): 1368-1378 (2006)
2005
53EEErik H. Volkerink, Subhasish Mitra: Response compaction with any number of unknowns using a new LFSR architecture. DAC 2005: 117-122
52EESubhasish Mitra, Tanay Karnik, Norbert Seifert, Ming Zhang: Logic soft errors in sub-65nm technologies design and CAD challenges. DAC 2005: 2-4
51EET. M. Mak, Subhasish Mitra, Ming Zhang: DFT Assisted Built-In Soft Error Resilience. IOLTS 2005: 69
50EER. D. (Shawn) Blanton, Subhasish Mitra: Testing Nanometer Digital Integration Circuits: Myths, Reality and the Road Ahead. VLSI Design 2005: 8-9
49EESubhasish Mitra, Norbert Seifert, Ming Zhang, Quan Shi, Kee Sup Kim: Subhasish Mitra, Norbert Seifert, Ming Zhang, Quan Shi, Kee Sup Kim. IEEE Computer 38(2): 43-52 (2005)
48EESubhasish Mitra, Steven S. Lumetta, Michael Mitzenmacher, Nishant Patil: X-Tolerant Test Response Compaction. IEEE Design & Test of Computers 22(6): 566-574 (2005)
47EERavishankar K. Iyer, Nithin Nakka, Zbigniew Kalbarczyk, Subhasish Mitra: Recent Advances and New Avenues in Hardware-Level Reliability Support. IEEE Micro 25(6): 18-29 (2005)
46EEMehdi Baradaran Tahoori, Subhasish Mitra: Application-independent testing of FPGA interconnects. IEEE Trans. on CAD of Integrated Circuits and Systems 24(11): 1774-1783 (2005)
45EEAhmad A. Al-Yamani, Subhasish Mitra, Edward J. McCluskey: Optimized reseeding by seed ordering and encoding. IEEE Trans. on CAD of Integrated Circuits and Systems 24(2): 264-270 (2005)
2004
44EEMehdi Baradaran Tahoori, Subhasish Mitra: Defect and Fault Tolerance of Reconfigurable Molecular Computing. FCCM 2004: 176-185
43EEKenneth A. Brand, Erik H. Volkerink, Edward J. McCluskey, Subhasish Mitra: Speed Clustering of Integrated Circuits. ITC 2004: 1128-1137
42EESubhasish Mitra, Steven S. Lumetta, Michael Mitzenmacher: X-Tolerant Signature Analysis. ITC 2004: 432-441
41EEMehdi Baradaran Tahoori, Subhasish Mitra: Interconnect Delay Testing of Designs on Programmable Logic Devices. ITC 2004: 635-644
40EEEdward J. McCluskey, Ahmad A. Al-Yamani, Chien-Mo James Li, Chao-Wen Tseng, Erik H. Volkerink, François-Fabien Ferhani, Edward Li, Subhasish Mitra: ELF-Murphy Data on Defects and Test Sets. VTS 2004: 16-22
39EESubhasish Mitra, Erik H. Volkerink, Edward J. McCluskey, Stefan Eichenberger: Delay Defect Screening using Process Monitor Structures. VTS 2004: 43-52
38EESubhasish Mitra, Wei-Je Huang, Nirmal R. Saxena, Shu-Yi Yu, Edward J. McCluskey: Reconfigurable Architecture for Autonomous Self-Repair. IEEE Design & Test of Computers 21(3): 228-240 (2004)
37EEVladimir Hahanov, Raimund Ubar, Subhasish Mitra: Conference Reports. IEEE Design & Test of Computers 21(6): 594-595 (2004)
36EESubhasish Mitra, Nirmal R. Saxena, Edward J. McCluskey: Efficient Design Diversity Estimation for Combinational Circuits. IEEE Trans. Computers 53(11): 1483-1492 (2004)
35EEMehdi Baradaran Tahoori, Subhasish Mitra: Techniques and algorithms for fault grading of FPGA interconnect test configurations. IEEE Trans. on CAD of Integrated Circuits and Systems 23(2): 261-272 (2004)
34EESubhasish Mitra, Kee Sup Kim: X-compact: an efficient response compaction technique. IEEE Trans. on CAD of Integrated Circuits and Systems 23(3): 421-432 (2004)
2003
33EESubhasish Mitra, Kee Sup Kim: XMAX: X-Tolerant Architecture for MAXimal Test Compression. ICCD 2003: 326-330
32EEDavid M. Wu, Mike Lin, Subhasish Mitra, Kee Sup Kim, Anil Sabbavarapu, Talal Jaber, Pete Johnson, Dale March, Greg Parrish: H-DFT: A Hybrid DFT Architecture For Low-Cost High Quality Structural Testing. ITC 2003: 1229-1238
31EEMehdi Baradaran Tahoori, Subhasish Mitra: Automatic Configuration Generation for FPGA Interconnect Testing. VTS 2003: 134-144
30EEErik H. Volkerink, Subhasish Mitra: Efficient Seed Utilization for Reseeding based Compression. VTS 2003: 232-240
29EEAhmad A. Al-Yamani, Subhasish Mitra, Edward J. McCluskey: Bist Reseeding with very few Seeds. VTS 2003: 69-76
28EEKee Sup Kim, Subhasish Mitra, Paul G. Ryan: Delay Defect Characteristics and Testing Strategies. IEEE Design & Test of Computers 20(5): 8-16 (2003)
2002
27EEAhmad A. Al-Yamani, Subhasish Mitra, Edward J. McCluskey: Testing Digital Circuits with Constraints. DFT 2002: 195-206
26EESubhasish Mitra, Edward J. McCluskey: Dependable Reconfigurable Computing Design Diversity and Self Repair. Evolvable Hardware 2002: 5
25EEErik H. Volkerink, Ajay Khoche, Subhasish Mitra: Packet-Based Input Test Data Compression Techniques. ITC 2002: 154-163
24EESubhasish Mitra, Kee Sup Kim: X-Compact: An Efficient Response Compaction Technique for Test Cost Reduction. ITC 2002: 311-320
23EEMehdi Baradaran Tahoori, Subhasish Mitra, Shahin Toutounchi, Edward J. McCluskey: Fault Grading FPGA Interconnect Test Configurations. ITC 2002: 608-617
22EESubhasish Mitra, Edward J. McCluskey, Samy Makar: Design for Testability and Testing of IEEE 1149.1 Tap Controller. VTS 2002: 247-252
21EEEdward J. McCluskey, Subhasish Mitra, Bob Madge, Peter C. Maxwell, Phil Nigh, Mike Rodgers: Debating the Future of Burn-In. VTS 2002: 311-314
20EEAjay Khoche, Erik H. Volkerink, Jochen Rivoir, Subhasish Mitra: Test Vector Compression Using EDA-ATE Synergies. VTS 2002: 97-102
19EENahmsuk Oh, Subhasish Mitra, Edward J. McCluskey: ED4I: Error Detection by Diverse Data and Duplicated Instructions. IEEE Trans. Computers 51(2): 180-199 (2002)
18EESubhasish Mitra, Nirmal R. Saxena, Edward J. McCluskey: A Design Diversity Metric and Analysis of Redundant Systems. IEEE Trans. Computers 51(5): 498-510 (2002)
2001
17EEWei-Je Huang, Subhasish Mitra, Edward J. McCluskey: Fast Run-Time Fault Location in Dependable FPGA-Based Applications. DFT 2001: 206-214
16EESubhasish Mitra, Nirmal R. Saxena, Edward J. McCluskey: Techniques for Estimation of Design Diversity for Combinational Logic Circuits. DSN 2001: 25-36
15EESubhasish Mitra, Edward J. McCluskey: Diversity Techniques for Concurrent Error Detection. ISQED 2001: 249-250
14EESubhasish Mitra, Edward J. McCluskey: Design Diversity for Concurrent Error Detection in Sequential Logic Circuts. VTS 2001: 178-183
13EESubhasish Mitra, Edward J. McCluskey: Design of Redundant Systems Protected Against Common-Mode Failures. VTS 2001: 190-197
12EEChao-Wen Tseng, Subhasish Mitra, Edward J. McCluskey, Scott Davidson: An Evaluation of Pseudo Random Testing for Detecting Real Defects. VTS 2001: 404-410
2000
11EEPhilip P. Shirvani, Subhasish Mitra, Jo C. Ebergen, Marly Roncken: DUDES: A Fault Abstraction and Collapsing Framework for Asynchronous Circuits. ASYNC 2000: 73-
10 Subhasish Mitra, Edward J. McCluskey: Combinational logic synthesis for diversity in duplex systems. ITC 2000: 179-188
9 Subhasish Mitra, Edward J. McCluskey: Which concurrent error detection scheme to choose ? ITC 2000: 985-994
8EESubhasish Mitra, Nirmal R. Saxena, Edward J. McCluskey: Fault Escapes in Duplex Systems. VTS 2000: 453-458
7EESubhasish Mitra, Edward J. McCluskey: Word Voter: A New Voter Design for Triple Modular Redundant Systems. VTS 2000: 465-470
6EENirmal R. Saxena, Santiago Fernández-Gomez, Wei-Je Huang, Subhasish Mitra, Shu-Yi Yu, Edward J. McCluskey: Dependable Computing and Online Testing in Adaptive and Configurable Systems. IEEE Design & Test of Computers 17(1): 29-41 (2000)
5EESubhasish Mitra, LaNae J. Avra, Edward J. McCluskey: Efficient Multiplexer Synthesis Techniques. IEEE Design & Test of Computers 17(4): 90-97 (2000)
1999
4 Subhasish Mitra, Nirmal R. Saxena, Edward J. McCluskey: A design diversity metric and reliability analysis for redundant systems. ITC 1999: 662-671
3EESubhasish Mitra, LaNae J. Avra, Edward J. McCluskey: An output encoding problem and a solution technique. IEEE Trans. on CAD of Integrated Circuits and Systems 18(6): 761-768 (1999)
1997
2EESubhasish Mitra, LaNae J. Avra, Edward J. McCluskey: An output encoding problem and a solution technique. ICCAD 1997: 304-307
1 Subhasish Mitra, LaNae J. Avra, Edward J. McCluskey: Scan Synthesis for One-Hot Signals. ITC 1997: 714-722

Coauthor Index

1Jacob Abraham [76]
2Mridul Agarwal [61]
3Ahmad A. Al-Yamani [27] [29] [40] [45]
4Enamul Amyeen [56]
5LaNae J. Avra [1] [2] [3] [5]
6Luca Benini [71]
7R. D. (Shawn) Blanton (Ronald D. Blanton) [50]
8Kenneth A. Brand [43]
9Tze Wee Chen [69]
10Scott Davidson [12]
11Jie Deng [65] [66]
12Jo C. Ebergen [11]
13Stefan Eichenberger [39]
14François-Fabien Ferhani [40]
15Santiago Fernández-Gomez [6]
16Christof Fetzer [76]
17Shinobu Fujita [71]
18Hector Garcia-Molina [58]
19Dimitris Gizopoulos [73]
20Ruifeng Guo [56]
21Vladimir Hahanov [37]
22Arash Hazeghi [80]
23Wei-Je Huang [6] [17] [38]
24Ravishankar K. Iyer (Ravi K. Iyer) [47] [72]
25Talal Jaber [32]
26Pete Johnson [32]
27Douglas L. Jones [67]
28Zbigniew Kalbarczyk [47]
29Rohit Kapur [68]
30Tanay Karnik [52]
31Ajay Khoche [20] [25]
32Kee Sup Kim [24] [28] [32] [33] [34] [49] [54] [55] [57]
33Kyunglok Kim [69]
34Young Moon Kim [69]
35Jinkyu Lee [56]
36Thomas H. Lee [71]
37Chien-Mo James Li (James Chien-Mo Li) [40]
38Edward Li [40]
39Wenchao Li [64]
40Yanjing Li [75]
41Albert Lin [66] [81]
42Mike Lin [32]
43Igor Loi [71]
44Steven S. Lumetta (Steven Lumetta) [42] [48]
45Bob Madge [21]
46T. M. Mak [51] [54] [57] [59]
47Samy Makar [22] [75]
48Dale March [32]
49Radu Marculescu [67]
50Peter C. Maxwell [21]
51Edward J. McCluskey [1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [12] [13] [14] [15] [16] [17] [18] [19] [21] [22] [23] [26] [27] [29] [36] [38] [39] [40] [43] [45]
52Avi Mendelson [76]
53Michael Mitzenmacher [42] [48]
54Bobji Mungamuru (Bob Mungamuru) [58]
55Nithin Nakka [47]
56Phil Nigh [21]
57Nahmsuk Oh [19]
58Michael Orshansky [67]
59Sung-Boem Park [78]
60Greg Parrish [32]
61S. J. Patel [54]
62Nishant Patil [48] [65] [66] [77] [79] [80] [81]
63Bipul Chandra Paul (Bipul C. Paul) [61]
64Stefan Poledna [76]
65Jan M. Rabaey [67]
66Jochen Rivoir [20]
67Mike Rodgers [21]
68Marly Roncken [11]
69Kaushik Roy [73]
70Jaijeet Roychowdhury [67]
71Paul G. Ryan [28]
72Anil Sabbavarapu [32]
73Pia Sanda [62] [73]
74Nirmal R. Saxena [4] [6] [8] [16] [18] [36] [38]
75Norbert Seifert [49] [52] [54] [57] [62]
76Sanjit A. Seshia [64]
77Naresh R. Shanbhag [54] [67]
78Quan Shi [49] [54]
79Philip P. Shirvani [11]
80Srihari Sivaraj [56]
81Neeraj Suri [76]
82Mehdi Baradaran Tahoori [23] [31] [35] [41] [44] [46] [60]
83Shahin Toutounchi [23]
84Kishor S. Trivedi [72]
85James W. Tschanz [72]
86Chao-Wen Tseng [12] [40]
87Raimund Ubar [37]
88Gustavo de Veciana [67]
89Srikanth Venkataraman [56]
90Erik H. Volkerink [20] [25] [30] [39] [40] [43] [53]
91N. J. Wang [54]
92Hai Wei [79]
93Thomas W. Williams [68]
94H.-S. Philip Wong [65] [66] [81]
95David M. Wu [32]
96Shu-Yi Yu [6] [38]
97Jie Zhang [77] [79] [80] [81]
98Ming Zhang [49] [51] [52] [54] [57] [61]

Colors in the list of coauthors

Copyright © Tue Nov 3 08:52:44 2009 by Michael Ley (ley@uni-trier.de)