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Salvador Mir

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2007
33EEJ. Tongbong, Salvador Mir, Jean-Louis Carbonéro: Interactive presentation: Evaluation of test measures for LNA production testing using a multinormal statistical model. DATE 2007: 731-736
32EEEmmanuel Simeu, Salvador Mir, R. Kherreddine, H. N. Nguyen: Envelope Detection Based Transition Time Supervision for Online Testing of RF MEMS Switches. IOLTS 2007: 237-243
31EEAhcène Bounceur, Salvador Mir, Emmanuel Simeu, Luís Rolíndez: Estimation of Test Metrics for the Optimisation of Analogue Circuit Testing. J. Electronic Testing 23(6): 471-484 (2007)
2006
30EEAchraf Dhayni, Salvador Mir, Libor Rufer, Ahcène Bounceur: Pseudorandom functional BIST for linear and nonlinear MEMS. DATE 2006: 664-669
29EEAhcène Bounceur, Salvador Mir, Luís Rolíndez, Emmanuel Simeu: CAT platform for analogue and mixed-signal test evaluation and optimization. VLSI-SoC 2006: 320-325
28EELivier Lizzarraga, Salvador Mir, Gilles Sicard, Ahcène Bounceur: Study of a BIST Technique for CMOS Active Pixel Sensors. VLSI-SoC 2006: 326-331
27EELuís Rolíndez, Salvador Mir, Ahcène Bounceur, Jean-Louis Carbonéro: A SNDR BIST for Sigma-Delta Analogue-to-Digital Converters. VTS 2006: 314-319
26EESalvador Mir, Tim Cheng, Andrew Richardson: Guest Editorial. J. Electronic Testing 22(4-6): 311 (2006)
25EELuís Rolíndez, Salvador Mir, Ahcène Bounceur, Jean-Louis Carbonéro: A BIST Scheme for SNDR Testing of SigmaDelta ADCs Using Sine-Wave Fitting. J. Electronic Testing 22(4-6): 325-335 (2006)
24EESalvador Mir, Libor Rufer, Achraf Dhayni: Built-in-self-test techniques for MEMS. Microelectronics Journal 37(12): 1591-1597 (2006)
2005
23EERabeb Kheriji, V. Danelon, Jean-Louis Carbonéro, Salvador Mir: Optimising Test Sets for a Low Noise Amplifier with a Defect-Oriented Approach. DATE 2005: 170-171
22EEAchraf Dhayni, Salvador Mir, Libor Rufer, Ahcène Bounceur: On-chip Pseudorandom Testing for Linear and Nonlinear MEMS. VLSI-SoC 2005: 245-266
21EELibor Rufer, Salvador Mir, Emmanuel Simeu, C. Domingues: On-Chip Pseudorandom MEMS Testing. J. Electronic Testing 21(3): 233-241 (2005)
20EEBozena Kaminska, Stephen K. Sunter, Salvador Mir: Analog and mixed signal test techniques for SOC development. Microelectronics Journal 36(12): 1063 (2005)
19EEGuillaume Prenat, Salvador Mir, Diego Vázquez, Luís Rolíndez: A low-cost digital frequency testing approach for mixed-signal devices using SigmaDelta modulation. Microelectronics Journal 36(12): 1080-1090 (2005)
2004
18EELuís Rolíndez, Salvador Mir, Guillaume Prenat, Ahcène Bounceur: A 0.18 µm CMOS Implementation of On-chip Analogue Test Signal Generation from Digital Test Patterns. DATE 2004: 706-707
17EESalvador Mir, Libor Rufer, Bernard Courtois: On-chip testing of embedded transducers. VLSI Design 2004: 463-
2003
16EEMohammad A. Naal, Emmanuel Simeu, Salvador Mir: On-Line Testable Decimation Filter Design for AMS Systems. IOLTS 2003: 83-88
15EEC. Roman, Salvador Mir, Benoît Charlot: Building an analogue fault simulation tool and its application to MEMS. Microelectronics Journal 34(10): 897-906 (2003)
2002
14EESalvador Mir, H. Bederr, R. D. (Shawn) Blanton, Hans G. Kerkhoff, H. J. Klim: SoCs with MEMS? Can We Include MEMS in the SoCs Design and Test Flow? VTS 2002: 449-450
2001
13EEBenoît Charlot, Salvador Mir, Fabien Parrain, Bernard Courtois: Electrically Induced Stimuli For MEMS Self-Test. VTS 2001: 210-217
2000
12EESalvador Mir, Benoît Charlot, Gabriela Nicolescu, Philippe Coste, Fabien Parrain, Nacer-Eddine Zergainoh, Bernard Courtois, Ahmed Amine Jerraya, Márta Rencz: Towards design and validation of mixed-technology SOCs. ACM Great Lakes Symposium on VLSI 2000: 29-33
11EEMarcelo Lubaszewski, Salvador Mir, Vladimir Kolarik, C. Nielsen, Bernard Courtois: Design of self-checking fully differential circuits and boards. IEEE Trans. VLSI Syst. 8(2): 113-128 (2000)
1999
10 Benoît Charlot, Salvador Mir, Érika F. Cota, Marcelo Lubaszewski, Bernard Courtois: Fault modeling of suspended thermal MEMS. ITC 1999: 319-328
9 Bernard Courtois, Jean-Michel Karam, Salvador Mir, Marcelo Lubaszewski, Vladimir Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner: Design and Test of MEMs. VLSI Design 1999: 270-
8EESalvador Mir, Benoît Charlot: On the Integration of Design and Test for Chips Embedding MEMS. IEEE Design & Test of Computers 16(4): 28-38 (1999)
1998
7EESalvador Mir, Adoración Rueda, Diego Vázquez, José Luis Huertas: Switch-Level Fault Coverage Analysis for Switched-Capacitor Systems. DATE 1998: 810-814
6EEA. Castillejo, D. Veychard, Salvador Mir, Jean-Michel Karam, Bernard Courtois: Failure mechanisms and fault classes for CMOS-compatible microelectromechanical systems. ITC 1998: 541-550
1997
5EESalvador Mir, Adoración Rueda, Thomas Olbrich, Eduardo J. Peralías, José Luis Huertas: SWITTEST: Automatic Switch-Level Fault Simulation and Test Evaluation of Switched-Capacitor Systems. DAC 1997: 281-286
1996
4EEMarcelo Lubaszewski, Salvador Mir, Leandro Pulz: ABILBO: Analog BuILt-in Block Observer. ICCAD 1996: 600-603
1995
3EEVladimir Kolarik, Salvador Mir, Marcelo Lubaszewski, Bernard Courtois: Analog checkers with absolute and relative tolerances. IEEE Trans. on CAD of Integrated Circuits and Systems 14(5): 607-612 (1995)
1994
2EESalvador Mir, Nick Filer: Re-engineering hardware specifications by exploiting design semantics. EURO-DAC 1994: 336-341
1EESalvador Mir, Vladimir Kolarik, Marcelo Lubaszewski, C. Nielsen, Bernard Courtois: Built-in self-test and fault diagnosis of fully differential analogue circuits. ICCAD 1994: 486-490

Coauthor Index

1H. Bederr [14]
2R. D. (Shawn) Blanton (Ronald D. Blanton) [14]
3Ahcène Bounceur [18] [22] [25] [27] [28] [29] [30] [31]
4Jean-Louis Carbonéro [23] [25] [27] [33]
5A. Castillejo [6]
6Benoît Charlot [8] [10] [12] [13] [15]
7Tim Cheng [26]
8Philippe Coste [12]
9Érika F. Cota [10]
10Bernard Courtois [1] [3] [6] [9] [10] [11] [12] [13] [17]
11V. Danelon [23]
12Achraf Dhayni [22] [24] [30]
13C. Domingues [21]
14Nick Filer [2]
15Manfred Glesner [9]
16Klaus Hofmann [9]
17José Luis Huertas (José L. Huertas) [5] [7]
18Ahmed Amine Jerraya [12]
19Bozena Kaminska [20]
20Jean-Michel Karam [6] [9]
21Hans G. Kerkhoff [14]
22Rabeb Kheriji [23]
23R. Kherreddine [32]
24H. J. Klim [14]
25Vladimir Kolarik [1] [3] [11]
26Livier Lizzarraga [28]
27Marcelo Lubaszewski [1] [3] [4] [9] [10] [11]
28Mohammad A. Naal [16]
29H. N. Nguyen [32]
30Gabriela Nicolescu [12]
31C. Nielsen [1] [11]
32Thomas Olbrich [5]
33Fabien Parrain [12] [13]
34Eduardo J. Peralías [5]
35Guillaume Prenat [18] [19]
36Leandro Pulz [4]
37Márta Rencz [9] [12]
38Andrew Richardson [26]
39Luís Rolíndez [18] [19] [25] [27] [29] [31]
40C. Roman [15]
41Adoración Rueda [5] [7]
42Libor Rufer [17] [21] [22] [24] [30]
43Gilles Sicard [28]
44Emmanuel Simeu [16] [21] [29] [31] [32]
45Stephen K. Sunter [20]
46Vladimir Székely [9]
47J. Tongbong [33]
48Diego Vázquez [7] [19]
49D. Veychard [6]
50Nacer-Eddine Zergainoh [12]

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Copyright © Thu Jun 5 07:42:39 2008 by Michael Ley (ley@uni-trier.de)