| |
| * | 2000 | |
|---|---|---|
| 2 | Tomoo Inoue, Debesh Kumar Das, Chiiho Sano, Takahiro Mihara, Hideo Fujiwara: Test Generation for Acyclic Sequential Circuits with Hold Registers. ICCAD 2000: 550-556 | |
| 1998 | ||
| 1 | EE | Tomoo Inoue, Toshinori Hosokawa, Takahiro Mihara, Hideo Fujiwara: An Optimal Time Expansion Model Based on Combinational ATPG for RT level Circuits. Asian Test Symposium 1998: 190-197 |
| 1 | Debesh Kumar Das (Debesh K. Das) | [2] |
| 2 | Hideo Fujiwara | [1] [2] |
| 3 | Toshinori Hosokawa | [1] |
| 4 | Tomoo Inoue | [1] [2] |
| 5 | Chiiho Sano | [2] |