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Michel Mermet-Guyennet Vis

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*2006
3EEAlberto Castellazzi, Mauro Ciappa, Wolfgang Fichtner, G. Lourdel, Michel Mermet-Guyennet: Compact modelling and analysis of power-sharing unbalances in IGBT-modules used in traction applications. Microelectronics Reliability 46(9-11): 1754-1759 (2006)
2EED. Barlini, Mauro Ciappa, Alberto Castellazzi, Michel Mermet-Guyennet, Wolfgang Fichtner: New technique for the measurement of the static and of the transient junction temperature in IGBT devices under operating conditions. Microelectronics Reliability 46(9-11): 1772-1777 (2006)
1EEX. Perpiñà, J. F. Serviere, J. Saiz, D. Barlini, Michel Mermet-Guyennet, J. Millán: Temperature measurement on series resistance and devices in power packs based on on-state voltage drop monitoring at high current. Microelectronics Reliability 46(9-11): 1834-1839 (2006)

Coauthor Index

1D. Barlini [1] [2]
2Alberto Castellazzi [2] [3]
3Mauro Ciappa [2] [3]
4Wolfgang Fichtner [2] [3]
5G. Lourdel [3]
6J. Millán [1]
7X. Perpiñà [1]
8J. Saiz [1]
9J. F. Serviere [1]

Copyright © Tue Nov 3 08:52:44 2009 by Michael Ley (ley@uni-trier.de)