Amitava Majumdar

2007
24	EE	Yifeng Cui, Reagan Moore, Kim Olsen, Amit Chourasia, Philip Maechling, Bernard Minster, Steven M. Day, Yuanfang Hu, Jing Zhu, Amitava Majumdar, Thomas Jordan: Enabling Very-Large Scale Earthquake Simulations on Parallel Machines. International Conference on Computational Science (1) 2007: 46-53
2006
23	EE	Amitava Majumdar, Wei-Yu Chen, Jun Guo: Hold time validation on silicon and the relevance of hazards in timing analysis. DAC 2006: 326-331
22	EE	Tharaka Devadithya, Kim Baldridge, Adam Birnbaum, Amitava Majumdar, Dong Ju Choi, Richard Wolski, Simon K. Warfield, Neculai Archip: On-Demand High Performance Computing: Image Guided Neuro-Surgery Feasibility Study. ICPADS (2) 2006: 97-102
2005
21	EE	Amitava Majumdar, Adam Birnbaum, Dong Ju Choi, Abhishek Trivedi, Simon K. Warfield, Kim Baldridge, Petr Krysl: A Dynamic Data Driven Grid System for Intra-operative Image Guided Neurosurgery. International Conference on Computational Science (2) 2005: 672-679
2003
20	EE	Olivier Caty, Ismet Bayraktaroglu, Amitava Majumdar, Richard Lee, John Bell, Lisa Curhan: Instruction Based BIST for Board/System Level Test of External Memories and Internconnects. ITC 2003: 961-970
2002
19	EE	Ishwar Parulkar, Thomas A. Ziaja, Rajesh Pendurkar, Anand D'Souza, Amitava Majumdar: A Scalable, Low Cost Design-for-Test Architecture for UltraSPARC? Chip Multi-Processors. ITC 2002: 726-735
18	EE	Yuni K. Dewaraja, Michael Ljungberg, Amitava Majumdar, Abhijit Bose, Kenneth F. Koral: A parallel Monte Carlo code for planar and SPECT imaging: implementation, verification and applications in 131I SPECT. Computer Methods and Programs in Biomedicine 67(2): 115-124 (2002)
2001
17		Kamran Zarrineh, Thomas A. Ziaja, Amitava Majumdar: Automatic Generation and Validation of Memory Test Models for High Performance Microprocessors. ICCD 2001: 526-529
2000
16	EE	Amitava Majumdar: arallel Performance Study of Monte Carlo Photon Transport Code on Shared-, Distributed-, and Distributed-Shared-Memory Architectures. IPDPS 2000: 93-
15	EE	Dimitri Kagaris, Spyros Tragoudas, Amitava Majumdar: Test-set partitioning for multi-weighted random LFSRs. Integration 30(1): 65-75 (2000)
1998
14	EE	Dimitrios Kagaris, Spyros Tragoudas, Amitava Majumdar: On-Chip Test Embedding for Multi-Weighted Random LFSRs. DFT 1998: 135-
13	EE	Amitava Majumdar, Michio Komoda, Tim Ayres: Ground Bounce Considerations in DC Parametric Test Generation Using Boundary Scan. VTS 1998: 86-91
1997
12	EE	Rahul Simha, Amitava Majumdar: An urn model with applications to database performance evaluation. Computers & OR 24(4): 289-300 (1997)
1996
11		Dimitrios Kagaris, Spyros Tragoudas, Amitava Majumdar: On the Use of Counters for Reproducing Deterministic Test Sets. IEEE Trans. Computers 45(12): 1405-1419 (1996)
10		Amitava Majumdar: On Evaluating and Optimizing Weights for Weighted Random Pattern Testing. IEEE Trans. Computers 45(8): 904-916 (1996)
1995
9		Amitava Majumdar, Sarma B. K. Vrudhula: Fault Coverage and Test Length Estimation for Random Pattern Testing. IEEE Trans. Computers 44(2): 234-247 (1995)
1994
8		Amitava Majumdar: WRAPTure: A Tool for Evaluation and Optimization of Weights for Weighted Random Pattern Testing. ICCD 1994: 288-291
7		Rahul Simha, Amitava Majumdar: On Lookahead in the List Update Problem. Inf. Process. Lett. 50(2): 105-110 (1994)
1993
6		Amitava Majumdar, Sarma Sastry: Statistical Analysis of Controllability. VLSI Design 1993: 55-60
5	EE	Amitava Majumdar, Sarma Sastry: Probabilistic characterization of controllability in general homogeneous circuits. Computer-Aided Design 25(2): 76-93 (1993)
4	EE	Amitava Majumdar, Sarma B. K. Vrudhula: Analysis of signal probability in logic circuits using stochastic models. IEEE Trans. VLSI Syst. 1(3): 365-379 (1993)
1992
3	EE	Amitava Majumdar, Sarma Sastry: On the Distribution of Fault Coverage and Test length in Random Testing of Combinational Circuits. DAC 1992: 341-346
1991
2	EE	Sarma Sastry, Amitava Majumdar: A Branching Process Model for Observability Analysis of Combinational Circuits. DAC 1991: 452-457
1	EE	Sarma Sastry, Amitava Majumdar: Test efficiency analysis of random self-test of sequential circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 10(3): 390-398 (1991)

Coauthor Index

1	Neculai Archip	[22]
2	Tim Ayres	[13]
3	Kim Baldridge	[21] [22]
4	Ismet Bayraktaroglu	[20]
5	John Bell	[20]
6	Adam Birnbaum	[21] [22]
7	Abhijit Bose	[18]
8	Olivier Caty	[20]
9	Wei-Yu Chen	[23]
10	Dong Ju Choi	[21] [22]
11	Amit Chourasia	[24]
12	Yifeng Cui	[24]
13	Lisa Curhan	[20]
14	Anand D'Souza	[19]
15	Steven M. Day	[24]
16	Tharaka Devadithya	[22]
17	Yuni K. Dewaraja	[18]
18	Jun Guo	[23]
19	Yuanfang Hu	[24]
20	Thomas Jordan	[24]
21	Dimitrios Kagaris (Dimitri Kagaris)	[11] [14] [15]
22	Michio Komoda	[13]
23	Kenneth F. Koral	[18]
24	Petr Krysl	[21]
25	Richard Lee	[20]
26	Michael Ljungberg	[18]
27	Philip Maechling	[24]
28	Bernard Minster	[24]
29	Reagan Moore (Reagan W. Moore)	[24]
30	Kim Olsen	[24]
31	Ishwar Parulkar	[19]
32	Rajesh Pendurkar	[19]
33	Sarma Sastry	[1] [2] [3] [5] [6]
34	Rahul Simha	[7] [12]
35	Spyros Tragoudas	[11] [14] [15]
36	Abhishek Trivedi	[21]
37	Sarma B. K. Vrudhula	[4] [9]
38	Simon K. Warfield	[21] [22]
39	Richard Wolski	[22]
40	Kamran Zarrineh	[17]
41	Jing Zhu	[24]
42	Thomas A. Ziaja	[17] [19]

Colors in the list of coauthors