Marcelo Lubaszewski

2007
51	EE	Tiago R. Balen, Fernanda Lima Kastensmidt, Marcelo Lubaszewski, Michel Renovell: Single Event Upset in SRAM-based Field Programmable Analog Arrays: Effects and Mitigation. ISVLSI 2007: 192-197
50	EE	Alexandre M. Amory, Frederico Ferlini, Marcelo Lubaszewski, Fernando Moraes: DfT for the Reuse of Networks-on-Chip as Test Access Mechanism. VTS 2007: 435-440
49	EE	Alexandre M. Amory, Marcelo Lubaszewski, Fernando Gehm Moraes, Edson I. Moreno: Test Time Reduction Reusing Multiple Processors in a Network-on-Chip Based Architecture CoRR abs/0710.4795: (2007)
48	EE	Marcelo Lubaszewski, Andrew Richardson, C. C. Su: Guest Editorial. J. Electronic Testing 23(6): 469 (2007)
47	EE	Tiago R. Balen, José Vicente Calvano, Marcelo Lubaszewski, Michel Renovell: Built-In Self-Test of Field Programmable Analog Arrays based on Transient Response Analysis. J. Electronic Testing 23(6): 497-512 (2007)
2006
46	EE	Alexandre M. Amory, Kees Goossens, Erik Jan Marinissen, Marcelo Lubaszewski, Fernando Moraes: Wrapper Design for the Reuse of Networks-on-Chip as Test Access Mechanism. European Test Symposium 2006: 213-218
45	EE	Carlos Roberto Moratelli, Érika F. Cota, Marcelo Lubaszewski: A cryptography core tolerant to DFA fault attacks. SBCCI 2006: 190-195
44	EE	Margrit R. Krug, Marcelo de Souza Moraes, Marcelo Lubaszewski: Using a software testing technique to identify registers for partial scan implementation. SBCCI 2006: 208-213
43	EE	Margrit R. Krug, Marcelo Lubaszewski, Marcelo de Souza Moraes: Improving ATPG Gate-Level Fault Coverage by using Test Vectors generated from Behavioral HDL Descriptions. VLSI-SoC 2006: 314-319
42	EE	Tiago R. Balen, José Vicente Calvano, Marcelo Lubaszewski, Michel Renovell: Functional Test of Field Programmable Analog Arrays. VTS 2006: 326-333
2005
41	EE	Alexandre M. Amory, Marcelo Lubaszewski, Fernando Gehm Moraes, Edson I. Moreno: Test Time Reduction Reusing Multiple Processors in a Network-on-Chip Based Architecture. DATE 2005: 62-63
40	EE	Marcelo Moraes, Érika F. Cota, Luigi Carro, Flávio Rech Wagner, Marcelo Lubaszewski: A constraint-based solution for on-line testing of processors embedded in real-time applications. SBCCI 2005: 68-73
39	EE	Gustavo Pereira, Antonio Andrade Jr., Tiago R. Balen, Marcelo Lubaszewski, Florence Azaïs, Michel Renovell: Testing the Interconnect Networks and I/O Resources of Field Programmable Analog Arrays. VTS 2005: 389-394
38	EE	Florence Azaïs, Marcelo Lubaszewski, Pascal Nouet, Michel Renovell: A Strategy for Optimal Test Point Insertion in Analog Cascaded Filters. J. Electronic Testing 21(1): 9-16 (2005)
37	EE	Tiago R. Balen, Antonio Q. Andrade, Florence Azaïs, Marcelo Lubaszewski, Michel Renovell: Applying the Oscillation Test Strategy to FPAA's Configurable Analog Blocks. J. Electronic Testing 21(2): 135-146 (2005)
36	EE	Antonio Andrade Jr., Gustavo Vieira, Tiago R. Balen, Marcelo Lubaszewski, Florence Azaïs, Michel Renovell: Built-in self-test of global interconnects of field programmable analog arrays. Microelectronics Journal 36(12): 1112-1123 (2005)
2004
35		Marcelo Lubaszewski, José Luis Huertas: Test and Design-for-Test of Mixed-Signal Integrated Circuits. IFIP Congress Tutorials 2004: 183-212
34	EE	Tiago R. Balen, Antonio Andrade Jr., Florence Azaïs, Michel Renovell, Marcelo Lubaszewski: Testing the Configurable Analog Blocks of Field Programmable Analog Arrays. ITC 2004: 893-902
33	EE	Antonio Andrade Jr., Érika F. Cota, Marcelo Lubaszewski: Improving mixed-signal SOC testing: a power-aware reuse-based approach with analog BIST. SBCCI 2004: 105-110
32	EE	Alexandre M. Amory, Érika F. Cota, Marcelo Lubaszewski, Fernando Gehm Moraes: Reducing test time with processor reuse in network-on-chip based systems. SBCCI 2004: 111-116
31	EE	Tiago R. Balen, Antonio Andrade Jr., Florence Azaïs, Marcelo Lubaszewski, Michel Renovell: An Approach to the Built-In Self-Test of Field Programmable Analog Arrays. VTS 2004: 383-388
30	EE	Érika F. Cota, Luigi Carro, Marcelo Lubaszewski: Reusing an on-chip network for the test of core-based systems. ACM Trans. Design Autom. Electr. Syst. 9(4): 471-499 (2004)
2003
29	EE	Érika F. Cota, Luigi Carro, Flávio Rech Wagner, Marcelo Lubaszewski: Power-aware NoC Reuse on the Testing of Core-based Systems. ITC 2003: 612-621
28	EE	José Vicente Calvano, Marcelo Lubaszewski: Designing for Test Analog Signal Processors for MEMS-Based Inertial Sensors. IWSOC 2003: 251-256
27	EE	Vinícius P. Correia, Marcelo Lubaszewski, André Inácio Reis: SIFU! - A Didactic Stuck-at Fault Simulator. MSE 2003: 93-94
26	EE	Érika F. Cota, Márcio Eduardo Kreutz, Cesar Albenes Zeferino, Luigi Carro, Marcelo Lubaszewski, Altamiro Amadeu Susin: The Impact of NoC Reuse on the Testing of Core-based Systems. VTS 2003: 128-133
2002
25	EE	Érika F. Cota, Luigi Carro, Marcelo Lubaszewski, Alex Orailoglu: Test Planning and Design Space Exploration in a Core-Based Environment. DATE 2002: 478-485
24	EE	José Vicente Calvano, Vladimir Castro Alves, Antônio C. Mesquita, Marcelo Lubaszewski: Filters Designed for Testability Wrapped on the Mixed-Signal Test Bus. VTS 2002: 201-206
2001
23		Luigi Carro, André C. Nácul, Daniel Janner, Marcelo Lubaszewski: Built-in Test of Analog Non-Linear Circuits in a SOC Environment. VLSI-SOC 2001: 437-448
22		Renato P. Ribas, André Inácio Reis, Marcelo Lubaszewski: Concepção de Circuitos e Sistemas Integrados. RITA 8(1): 7-21 (2001)
2000
21	EE	Luigi Carro, Érika F. Cota, Marcelo Lubaszewski, Yves Bertrand, Florence Azaïs, Michel Renovell: TI-BIST: a temperature independent analog BIST for switched-capacitor filters. Asian Test Symposium 2000: 78-83
20	EE	José Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski: Testing a PWM circuit using functional fault models and compact test vectors for operational amplifiers. Asian Test Symposium 2000: 96-
19	EE	Érika F. Cota, Michel Renovell, Florence Azaïs, Yves Bertrand, Luigi Carro, Marcelo Lubaszewski: Reuse of Existing Resources for Analog BIST of a Switch Capacitor Filte. DATE 2000: 226-
18	EE	José Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski: Fault Detection Methodology and BIST Method for 2nd Order Butterworth, Chebyshev and Bessel Filter Approximations. VTS 2000: 319-324
17	EE	Marcelo Lubaszewski, Salvador Mir, Vladimir Kolarik, C. Nielsen, Bernard Courtois: Design of self-checking fully differential circuits and boards. IEEE Trans. VLSI Syst. 8(2): 113-128 (2000)
1999
16	EE	Érika F. Cota, Luigi Carro, Marcelo Lubaszewski: A Method to Diagnose Faults in Linear Analog Circuits using an Adaptive Tester. DATE 1999: 184-188
15		Benoît Charlot, Salvador Mir, Érika F. Cota, Marcelo Lubaszewski, Bernard Courtois: Fault modeling of suspended thermal MEMS. ITC 1999: 319-328
14		Bernard Courtois, Jean-Michel Karam, Salvador Mir, Marcelo Lubaszewski, Vladimir Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner: Design and Test of MEMs. VLSI Design 1999: 270-
1998
13	EE	J. Velasco-Medina, Marcelo Lubaszewski, Michael Nicolaidis: An Approach to the On-Line Testing of Operational Amplifiers. Asian Test Symposium 1998: 290-295
12	EE	Marcelo Lubaszewski: Bridging the Gap between Microelectronics and Micromechanics Testing. Asian Test Symposium 1998: 513
11	EE	Marcelo Lubaszewski, Érika F. Cota, Bernard Courtois: Microsystems Testing: an Approach and Open Problems. DATE 1998: 524-
10	EE	Jean-Michel Karam, Marcelo Lubaszewski, S. Blanton, Andrew Richardson: Testing MEMS. VTS 1998: 320-321
9		Marcelo Lubaszewski, Bernard Courtois: A Reliable Fail-Safe System. IEEE Trans. Computers 47(2): 236-241 (1998)
1997
8		Érika F. Cota, José Di Elias Domênico, Marcelo Lubaszewski: A CAT Tool for Frequency-domain Testing and Diagnosis on Analog. J. Braz. Comp. Soc. 4(2): (1997)
1996
7	EE	Vladimir Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois: Thermal Monitoring Of Safety-Critical Integrated Systems. Asian Test Symposium 1996: 282-288
6	EE	Marcelo Lubaszewski, Salvador Mir, Leandro Pulz: ABILBO: Analog BuILt-in Block Observer. ICCAD 1996: 600-603
1995
5	EE	Khaled Saab, Bozena Kaminska, Bernard Courtois, Marcelo Lubaszewski: Frequency-based BIST for analog circuit testin. VTS 1995: 54-59
4	EE	Vladimir Kolarik, Salvador Mir, Marcelo Lubaszewski, Bernard Courtois: Analog checkers with absolute and relative tolerances. IEEE Trans. on CAD of Integrated Circuits and Systems 14(5): 607-612 (1995)
1994
3	EE	Salvador Mir, Vladimir Kolarik, Marcelo Lubaszewski, C. Nielsen, Bernard Courtois: Built-in self-test and fault diagnosis of fully differential analogue circuits. ICCAD 1994: 486-490
1993
2	EE	Meryem Marzouki, Marcelo Lubaszewski, Mohamed Hedi Touati: Unifying test and diagnosis of interconnects and logic clusters in partial boundary scan boards. ICCAD 1993: 654-657
1992
1		Marcelo Lubaszewski, Bernard Courtois: On the Design of Self-Checking Boundary Scannable Boards. ITC 1992: 372-381

Coauthor Index

1	Vladimir Castro Alves	[18] [20] [24]
2	Alexandre M. Amory	[32] [41] [46] [49] [50]
3	Antonio Q. Andrade	[37]
4	Antonio Andrade Jr.	[31] [33] [34] [36] [39]
5	Florence Azaïs	[19] [21] [31] [34] [36] [37] [38] [39]
6	Tiago R. Balen	[31] [34] [36] [37] [39] [42] [47] [51]
7	Yves Bertrand	[19] [21]
8	S. Blanton	[10]
9	José Vicente Calvano	[18] [20] [24] [28] [42] [47]
10	Luigi Carro	[16] [19] [21] [23] [25] [26] [29] [30] [40]
11	Benoît Charlot	[15]
12	Vinícius P. Correia	[27]
13	Érika F. Cota	[8] [11] [15] [16] [19] [21] [25] [26] [29] [30] [32] [33] [40] [45]
14	Bernard Courtois	[1] [3] [4] [5] [7] [9] [11] [14] [15] [17]
15	José Di Elias Domênico	[8]
16	Frederico Ferlini	[50]
17	Manfred Glesner	[14]
18	Kees G. W. Goossens (Kees Goossens)	[46]
19	Klaus Hofmann	[14]
20	José Luis Huertas (José L. Huertas)	[35]
21	Daniel Janner	[23]
22	Bozena Kaminska	[5]
23	Jean-Michel Karam	[7] [10] [14]
24	Fernanda Gusmão de Lima Kastensmidt (Fernanda Gusmão de Lima, Fernanda Lima Kastensmidt)	[51]
25	Vladimir Kolarik	[3] [4] [17]
26	Márcio Eduardo Kreutz	[26]
27	Margrit R. Krug	[43] [44]
28	Erik Jan Marinissen	[46]
29	Meryem Marzouki	[2]
30	Antônio C. Mesquita	[24]
31	Salvador Mir	[3] [4] [6] [14] [15] [17]
32	Fernando Gehm Moraes (Fernando Moraes)	[32] [41] [46] [49] [50]
33	Marcelo Moraes	[40]
34	Marcelo de Souza Moraes	[43] [44]
35	Carlos Roberto Moratelli	[45]
36	Edson I. Moreno	[41] [49]
37	André C. Nácul	[23]
38	Michael Nicolaidis	[13]
39	C. Nielsen	[3] [17]
40	Pascal Nouet	[38]
41	Alex Orailoglu	[25]
42	Gustavo Pereira	[39]
43	Leandro Pulz	[6]
44	André Inácio Reis	[22] [27]
45	Márta Rencz	[7] [14]
46	Michel Renovell	[19] [21] [31] [34] [36] [37] [38] [39] [42] [47] [51]
47	Renato P. Ribas	[22]
48	Andrew Richardson	[10] [48]
49	Khaled Saab	[5]
50	C. C. Su	[48]
51	Altamiro Amadeu Susin	[26]
52	Vladimir Székely	[7] [14]
53	Mohamed Hedi Touati	[2]
54	J. Velasco-Medina	[13]
55	Gustavo Vieira	[36]
56	Flávio Rech Wagner	[29] [40]
57	Cesar Albenes Zeferino	[26]

Colors in the list of coauthors