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Marcelo Lubaszewski Vis

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*2008
64 Marcelo Lubaszewski, Michel Renovell, Rajesh K. Gupta: Proceedings of the 21st Annual Symposium on Integrated Circuits and Systems Design, SBCCI 2008, Gramado, Brazil, September 1-4, 2008 ACM 2008
63EECarlos Roberto Moratelli, Felipe Ghellar, Érika F. Cota, Marcelo Lubaszewski: A fault-tolerant, DFA-resistant AES core. ISCAS 2008: 244-247
62EEFelipe Ghellar, Marcelo Lubaszewski: A novel AES cryptographic core highly resistant to differential power analysis attacks. SBCCI 2008: 140-145
61EEÉrika F. Cota, Fernanda Gusmão de Lima Kastensmidt, Maico Cassel, Marcos Herve, Pedro Almeida, Paulo Meirelles, Alexandre M. Amory, Marcelo Lubaszewski: A High-Fault-Coverage Approach for the Test of Data, Control and Handshake Interconnects in Mesh Networks-on-Chip. IEEE Trans. Computers 57(9): 1202-1215 (2008)
2007
60EETiago R. Balen, Fernanda Lima Kastensmidt, Marcelo Lubaszewski, Michel Renovell: Single Event Upset in SRAM-based Field Programmable Analog Arrays: Effects and Mitigation. ISVLSI 2007: 192-197
59EEAlexandre M. Amory, Frederico Ferlini, Marcelo Lubaszewski, Fernando Moraes: DfT for the Reuse of Networks-on-Chip as Test Access Mechanism. VTS 2007: 435-440
58EEAlexandre M. Amory, Marcelo Lubaszewski, Fernando Gehm Moraes, Edson I. Moreno: Test Time Reduction Reusing Multiple Processors in a Network-on-Chip Based Architecture CoRR abs/0710.4795: (2007)
57EEMarcelo Lubaszewski, Andrew Richardson, C. C. Su: Guest Editorial. J. Electronic Testing 23(6): 469 (2007)
56EETiago R. Balen, José Vicente Calvano, Marcelo Lubaszewski, Michel Renovell: Built-In Self-Test of Field Programmable Analog Arrays based on Transient Response Analysis. J. Electronic Testing 23(6): 497-512 (2007)
2006
55EEAlexandre M. Amory, Kees Goossens, Erik Jan Marinissen, Marcelo Lubaszewski, Fernando Moraes: Wrapper Design for the Reuse of Networks-on-Chip as Test Access Mechanism. European Test Symposium 2006: 213-218
54EECarlos Roberto Moratelli, Érika F. Cota, Marcelo Lubaszewski: A cryptography core tolerant to DFA fault attacks. SBCCI 2006: 190-195
53EEMargrit R. Krug, Marcelo de Souza Moraes, Marcelo Lubaszewski: Using a software testing technique to identify registers for partial scan implementation. SBCCI 2006: 208-213
52EEMargrit R. Krug, Marcelo Lubaszewski, Marcelo de Souza Moraes: Improving ATPG Gate-Level Fault Coverage by using Test Vectors generated from Behavioral HDL Descriptions. VLSI-SoC 2006: 314-319
51EETiago R. Balen, José Vicente Calvano, Marcelo Lubaszewski, Michel Renovell: Functional Test of Field Programmable Analog Arrays. VTS 2006: 326-333
2005
50EEAlexandre M. Amory, Marcelo Lubaszewski, Fernando Gehm Moraes, Edson I. Moreno: Test Time Reduction Reusing Multiple Processors in a Network-on-Chip Based Architecture. DATE 2005: 62-63
49EEMarcelo de Souza Moraes, Érika F. Cota, Luigi Carro, Flávio Rech Wagner, Marcelo Lubaszewski: A constraint-based solution for on-line testing of processors embedded in real-time applications. SBCCI 2005: 68-73
48EEGustavo Pereira, Antonio Andrade Jr., Tiago R. Balen, Marcelo Lubaszewski, Florence Azaïs, Michel Renovell: Testing the Interconnect Networks and I/O Resources of Field Programmable Analog Arrays. VTS 2005: 389-394
47EEFlorence Azaïs, Marcelo Lubaszewski, Pascal Nouet, Michel Renovell: A Strategy for Optimal Test Point Insertion in Analog Cascaded Filters. J. Electronic Testing 21(1): 9-16 (2005)
46EETiago R. Balen, Antonio Q. Andrade, Florence Azaïs, Marcelo Lubaszewski, Michel Renovell: Applying the Oscillation Test Strategy to FPAA's Configurable Analog Blocks. J. Electronic Testing 21(2): 135-146 (2005)
45EEAntonio Andrade Jr., Gustavo Vieira, Tiago R. Balen, Marcelo Lubaszewski, Florence Azaïs, Michel Renovell: Built-in self-test of global interconnects of field programmable analog arrays. Microelectronics Journal 36(12): 1112-1123 (2005)
2004
44 Marcelo Lubaszewski, José Luis Huertas: Test and Design-for-Test of Mixed-Signal Integrated Circuits. IFIP Congress Tutorials 2004: 183-212
43EETiago R. Balen, Antonio Andrade Jr., Florence Azaïs, Michel Renovell, Marcelo Lubaszewski: Testing the Configurable Analog Blocks of Field Programmable Analog Arrays. ITC 2004: 893-902
42EEAntonio Andrade Jr., Érika F. Cota, Marcelo Lubaszewski: Improving mixed-signal SOC testing: a power-aware reuse-based approach with analog BIST. SBCCI 2004: 105-110
41EEAlexandre M. Amory, Érika F. Cota, Marcelo Lubaszewski, Fernando Gehm Moraes: Reducing test time with processor reuse in network-on-chip based systems. SBCCI 2004: 111-116
40EETiago R. Balen, Antonio Andrade Jr., Florence Azaïs, Marcelo Lubaszewski, Michel Renovell: An Approach to the Built-In Self-Test of Field Programmable Analog Arrays. VTS 2004: 383-388
39EEÉrika F. Cota, Luigi Carro, Marcelo Lubaszewski: Reusing an on-chip network for the test of core-based systems. ACM Trans. Design Autom. Electr. Syst. 9(4): 471-499 (2004)
38EEÉrika F. Cota, Luigi Carro, Marcelo Lubaszewski, Alex Orailoglu: Searching for Global Test Costs Optimization in Core-Based Systems. J. Electronic Testing 20(4): 357-373 (2004)
37EEAlex Gonsales, Marcelo Lubaszewski, Luigi Carro, Michel Renovell: A New FPGA for DSP Applications Integrating BIST Capabilities. J. Electronic Testing 20(4): 423-431 (2004)
2003
36EEÉrika F. Cota, Luigi Carro, Flávio Rech Wagner, Marcelo Lubaszewski: Power-aware NoC Reuse on the Testing of Core-based Systems. ITC 2003: 612-621
35EEJosé Vicente Calvano, Marcelo Lubaszewski: Designing for Test Analog Signal Processors for MEMS-Based Inertial Sensors. IWSOC 2003: 251-256
34EEVinícius P. Correia, Marcelo Lubaszewski, André Inácio Reis: SIFU! - A Didactic Stuck-at Fault Simulator. MSE 2003: 93-94
33EEÉrika F. Cota, Márcio Eduardo Kreutz, Cesar Albenes Zeferino, Luigi Carro, Marcelo Lubaszewski, Altamiro Amadeu Susin: The Impact of NoC Reuse on the Testing of Core-based Systems. VTS 2003: 128-133
32EEL. Cassol, O. Betat, Luigi Carro, Marcelo Lubaszewski: The SigmaDelta-BIST Method Applied to Analog Filters. J. Electronic Testing 19(1): 13-20 (2003)
2002
31EEÉrika F. Cota, Luigi Carro, Marcelo Lubaszewski, Alex Orailoglu: Test Planning and Design Space Exploration in a Core-Based Environment. DATE 2002: 478-485
30EEJosé Vicente Calvano, Vladimir Castro Alves, Antônio C. Mesquita, Marcelo Lubaszewski: Filters Designed for Testability Wrapped on the Mixed-Signal Test Bus. VTS 2002: 201-206
2001
29 Luigi Carro, André C. Nácul, Daniel Janner, Marcelo Lubaszewski: Built-in Test of Analog Non-Linear Circuits in a SOC Environment. VLSI-SOC 2001: 437-448
28EEJosé Vicente Calvano, Antonio Carneiro de Mesquita Filho, Vladimir Castro Alves, Marcelo Lubaszewski: Fault Models and Test Generation for OpAmp Circuits - The FFM. J. Electronic Testing 17(2): 121-138 (2001)
27EEÉrika F. Cota, Fernanda Lima, Sana Rezgui, Luigi Carro, Raoul Velazco, Marcelo Lubaszewski, Ricardo Reis: Synthesis of an 8051-Like Micro-Controller Tolerant to Transient Faults. J. Electronic Testing 17(2): 149-161 (2001)
26EEMarcelo Lubaszewski, Víctor H. Champac: Guest Editorial. J. Electronic Testing 17(2): 83-84 (2001)
25 Renato P. Ribas, André Inácio Reis, Marcelo Lubaszewski: Concepção de Circuitos e Sistemas Integrados. RITA 8(1): 7-21 (2001)
2000
24EELuigi Carro, Érika F. Cota, Marcelo Lubaszewski, Yves Bertrand, Florence Azaïs, Michel Renovell: TI-BIST: a temperature independent analog BIST for switched-capacitor filters. Asian Test Symposium 2000: 78-83
23EEJosé Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski: Testing a PWM circuit using functional fault models and compact test vectors for operational amplifiers. Asian Test Symposium 2000: 96-
22EEÉrika F. Cota, Michel Renovell, Florence Azaïs, Yves Bertrand, Luigi Carro, Marcelo Lubaszewski: Reuse of Existing Resources for Analog BIST of a Switch Capacitor Filte. DATE 2000: 226-
21EEJosé Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski: Fault Detection Methodology and BIST Method for 2nd Order Butterworth, Chebyshev and Bessel Filter Approximations. VTS 2000: 319-324
20EEMarcelo Lubaszewski, Salvador Mir, Vladimir Kolarik, C. Nielsen, Bernard Courtois: Design of self-checking fully differential circuits and boards. IEEE Trans. VLSI Syst. 8(2): 113-128 (2000)
1999
19EEÉrika F. Cota, Luigi Carro, Marcelo Lubaszewski: A Method to Diagnose Faults in Linear Analog Circuits using an Adaptive Tester. DATE 1999: 184-188
18 Benoît Charlot, Salvador Mir, Érika F. Cota, Marcelo Lubaszewski, Bernard Courtois: Fault modeling of suspended thermal MEMS. ITC 1999: 319-328
17 Bernard Courtois, Jean-Michel Karam, Salvador Mir, Marcelo Lubaszewski, Vladimir Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner: Design and Test of MEMs. VLSI Design 1999: 270-
1998
16EEJaime Velasco-Medina, Marcelo Lubaszewski, Michael Nicolaidis: An Approach to the On-Line Testing of Operational Amplifiers. Asian Test Symposium 1998: 290-295
15EEMarcelo Lubaszewski: Bridging the Gap between Microelectronics and Micromechanics Testing. Asian Test Symposium 1998: 513
14EEMarcelo Lubaszewski, Érika F. Cota, Bernard Courtois: Microsystems Testing: an Approach and Open Problems. DATE 1998: 524-
13EEJean-Michel Karam, Marcelo Lubaszewski, S. Blanton, Andrew Richardson: Testing MEMS. VTS 1998: 320-321
12 Marcelo Lubaszewski, Bernard Courtois: A Reliable Fail-Safe System. IEEE Trans. Computers 47(2): 236-241 (1998)
11EEVladimir Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois: Thermal Monitoring of Self-Checking Systems. J. Electronic Testing 12(1-2): 81-92 (1998)
1997
10 Érika F. Cota, José Di Elias Domênico, Marcelo Lubaszewski: A CAT Tool for Frequency-domain Testing and Diagnosis on Analog. J. Braz. Comp. Soc. 4(2): (1997)
1996
9EEVladimir Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois: Thermal Monitoring Of Safety-Critical Integrated Systems. Asian Test Symposium 1996: 282-288
8EEMarcelo Lubaszewski, Salvador Mir, Leandro Pulz: ABILBO: Analog BuILt-in Block Observer. ICCAD 1996: 600-603
7EESalvador Mir, Marcelo Lubaszewski, Bernard Courtois: Unified built-in self-test for fully differential analog circuits. J. Electronic Testing 9(1-2): 135-151 (1996)
6EESalvador Mir, Marcelo Lubaszewski, Bernard Courtois: Fault-based ATPG for linear analog circuits with minimal size multifrequency test sets. J. Electronic Testing 9(1-2): 43-57 (1996)
1995
5EEKhaled Saab, Bozena Kaminska, Bernard Courtois, Marcelo Lubaszewski: Frequency-based BIST for analog circuit testin. VTS 1995: 54-59
4EEVladimir Kolarik, Salvador Mir, Marcelo Lubaszewski, Bernard Courtois: Analog checkers with absolute and relative tolerances. IEEE Trans. on CAD of Integrated Circuits and Systems 14(5): 607-612 (1995)
1994
3EESalvador Mir, Vladimir Kolarik, Marcelo Lubaszewski, C. Nielsen, Bernard Courtois: Built-in self-test and fault diagnosis of fully differential analogue circuits. ICCAD 1994: 486-490
1993
2EEMeryem Marzouki, Marcelo Lubaszewski, Mohamed Hedi Touati: Unifying test and diagnosis of interconnects and logic clusters in partial boundary scan boards. ICCAD 1993: 654-657
1992
1 Marcelo Lubaszewski, Bernard Courtois: On the Design of Self-Checking Boundary Scannable Boards. ITC 1992: 372-381

Coauthor Index

1Pedro Almeida [61]
2Vladimir Castro Alves [21] [23] [28] [30]
3Alexandre M. Amory [41] [50] [55] [58] [59] [61]
4Antonio Q. Andrade [46]
5Antonio Andrade Jr. [40] [42] [43] [45] [48]
6Florence Azaïs [22] [24] [40] [43] [45] [46] [47] [48]
7Tiago R. Balen [40] [43] [45] [46] [48] [51] [56] [60]
8Yves Bertrand [22] [24]
9O. Betat [32]
10S. Blanton [13]
11José Vicente Calvano [21] [23] [28] [30] [35] [51] [56]
12Luigi Carro [19] [22] [24] [27] [29] [31] [32] [33] [36] [37] [38] [39] [49]
13Maico Cassel [61]
14L. Cassol [32]
15Víctor H. Champac (Víctor H. Champac Vilela) [26]
16Benoît Charlot [18]
17Vinícius P. Correia [34]
18Érika F. Cota [10] [14] [18] [19] [22] [24] [27] [31] [33] [36] [38] [39] [41] [42] [49] [54] [61] [63]
19Bernard Courtois [1] [3] [4] [5] [6] [7] [9] [11] [12] [14] [17] [18] [20]
20José Di Elias Domênico [10]
21Frederico Ferlini [59]
22Antonio Carneiro de Mesquita Filho [28]
23Felipe Ghellar [62] [63]
24Manfred Glesner [17]
25Alex Gonsales [37]
26Kees G. W. Goossens (Kees Goossens) [55]
27Rajesh K. Gupta (Rajesh Gupta) [64]
28Marcos Herve [61]
29Klaus Hofmann [17]
30José Luis Huertas (José L. Huertas) [44]
31Daniel Janner [29]
32Bozena Kaminska [5]
33Jean-Michel Karam [9] [11] [13] [17]
34Fernanda Gusmão de Lima Kastensmidt (Fernanda Gusmão de Lima, Fernanda Lima Kastensmidt) [60] [61]
35Vladimir Kolarik [3] [4] [20]
36Márcio Eduardo Kreutz [33]
37Margrit R. Krug [52] [53]
38Fernanda Lima [27]
39Erik Jan Marinissen [55]
40Meryem Marzouki [2]
41Paulo Meirelles [61]
42Antônio C. Mesquita [30]
43Salvador Mir [3] [4] [6] [7] [8] [17] [18] [20]
44Fernando Gehm Moraes (Fernando Moraes) [41] [50] [55] [58] [59]
45Marcelo de Souza Moraes [49] [52] [53]
46Carlos Roberto Moratelli [54] [63]
47Edson I. Moreno [50] [58]
48André C. Nácul [29]
49Michael Nicolaidis [16]
50C. Nielsen [3] [20]
51Pascal Nouet [47]
52Alex Orailoglu [31] [38]
53Gustavo Pereira [48]
54Leandro Pulz [8]
55André Inácio Reis [25] [34]
56Ricardo Augusto da Luz Reis (Ricardo A. L. Reis, Ricardo Reis) [27]
57Márta Rencz [9] [11] [17]
58Michel Renovell [22] [24] [37] [40] [43] [45] [46] [47] [48] [51] [56] [60] [64]
59Sana Rezgui [27]
60Renato P. Ribas [25]
61Andrew Richardson [13] [57]
62Khaled Saab [5]
63C. C. Su [57]
64Altamiro Amadeu Susin [33]
65Vladimir Székely [9] [11] [17]
66Mohamed Hedi Touati [2]
67Jaime Velasco-Medina [16]
68Raoul Velazco [27]
69Gustavo Vieira [45]
70Flávio Rech Wagner [36] [49]
71Cesar Albenes Zeferino [33]

Copyright © Tue Nov 3 08:52:44 2009 by Michael Ley (ley@uni-trier.de)