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D. Lewis Vis

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*2006
25EEA. Douin, V. Pouget, M. De Matos, D. Lewis, Philippe Perdu, Pascal Fouillat: Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation. Microelectronics Reliability 46(9-11): 1514-1519 (2006)
24EEF. Essely, F. Darracq, V. Pouget, M. Remmach, Felix Beaudoin, N. Guitard, M. Bafleur, Philippe Perdu, A. Touboul, D. Lewis: Application of various optical techniques for ESD defect localization. Microelectronics Reliability 46(9-11): 1563-1568 (2006)
2005
23EEA. Douin, V. Pouget, D. Lewis, Pascal Fouillat, Philippe Perdu: Electrical Modeling for Laser Testing with Different Pulse Durations. IOLTS 2005: 9-13
22EEN. Guitard, F. Essely, D. Trémouilles, M. Bafleur, N. Nolhier, Philippe Perdu, A. Touboul, V. Pouget, D. Lewis: Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure. Microelectronics Reliability 45(9-11): 1415-1420 (2005)
21EEKevin Sanchez, Romain Desplats, Felix Beaudoin, Philippe Perdu, J. P. Roux, G. Woods, D. Lewis: NIR laser stimulation for dynamic timing analysis. Microelectronics Reliability 45(9-11): 1459-1464 (2005)
20EEAbdellatif Firiti, Felix Beaudoin, G. Haller, Philippe Perdu, D. Lewis, Pascal Fouillat: Impact of semiconductors material on IR Laser Stimulation signal. Microelectronics Reliability 45(9-11): 1465-1470 (2005)
19EEM. Remmach, A. Pigozzi, Romain Desplats, Philippe Perdu, D. Lewis, J. Noel, S. Dudit: Light Emission to Time Resolved Emission For IC Debug and Failure Analysis. Microelectronics Reliability 45(9-11): 1476-1481 (2005)
2003
18EET. Beauchêne, D. Lewis, Felix Beaudoin, V. Pouget, Philippe Perdu, Pascal Fouillat, Y. Danto: A physical approach on SCOBIC investigation in VLSI. Microelectronics Reliability 43(1): 173-177 (2003)
17EET. Beauchêne, D. Lewis, Felix Beaudoin, V. Pouget, Romain Desplats, Pascal Fouillat, Philippe Perdu, M. Bafleur, D. Trémouilles: Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization. Microelectronics Reliability 43(3): 439-444 (2003)
16EEAbdellatif Firiti, D. Faujour, G. Haller, J. M. Moragues, V. Goubier, Philippe Perdu, Felix Beaudoin, D. Lewis: Short defect characterization based on TCR parameter extraction. Microelectronics Reliability 43(9-11): 1563-1568 (2003)
15EET. Beauchêne, D. Trémouilles, D. Lewis, Philippe Perdu, Pascal Fouillat: Characterization of ESD induced defects using Photovoltaic Laser Stimulation (PLS). Microelectronics Reliability 43(9-11): 1577-1582 (2003)
14EEM. Remmach, Romain Desplats, Felix Beaudoin, E. Frances, Philippe Perdu, D. Lewis: Time Resolved Photoemission (PICA) - From the Physics to Practical Considerations. Microelectronics Reliability 43(9-11): 1639-1644 (2003)
13EEFelix Beaudoin, Romain Desplats, Philippe Perdu, Abdellatif Firiti, G. Haller, V. Pouget, D. Lewis: From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing. Microelectronics Reliability 43(9-11): 1681-1686 (2003)
12EEG. Andriamonje, V. Pouget, Y. Ousten, D. Lewis, Y. Danto, J. M. Rampnoux, Y. Ezzahri, Stefan Dilhaire, Stéphane Grauby, Wilfrid Claeys: Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits. Microelectronics Reliability 43(9-11): 1803-1807 (2003)
2002
11EEFelix Beaudoin, D. Carisetti, Romain Desplats, Philippe Perdu, D. Lewis, J. C. Clement: Backside Defect Localizations and Revelations Techniques on Gallium Arsenide (GaAs) Devices. Microelectronics Reliability 42(9-11): 1581-1585 (2002)
10EEFelix Beaudoin, G. Haller, Philippe Perdu, Romain Desplats, T. Beauchêne, D. Lewis: Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased. Microelectronics Reliability 42(9-11): 1729-1734 (2002)
9EEO. Crépel, Felix Beaudoin, L. Dantas de Morais, G. Haller, C. Goupil, Philippe Perdu, Romain Desplats, D. Lewis: Backside Hot Spot Detection Using Liquid Crystal Microscopy. Microelectronics Reliability 42(9-11): 1741-1746 (2002)
2001
8EED. Lewis, Hervé Lapuyade, Yann Deval, Y. Maidon, F. Darracq, R. Briand, Pascal Fouillat: A New Laser System for X-Rays Flashes Sensitivity Evaluation. IOLTW 2001: 111-
7 D. Lewis, V. Pouget, T. Beauchêne, Hervé Lapuyade, Pascal Fouillat, A. Touboul, Felix Beaudoin, Philippe Perdu: Front Side and Backside OBIT Mappings applied to Single Event Transient Testing. Microelectronics Reliability 41(9-10): 1471-1476 (2001)
6 Felix Beaudoin, X. Chauffleur, J. P. Fradin, Philippe Perdu, Romain Desplats, D. Lewis: Modeling Thermal Laser Stimulation. Microelectronics Reliability 41(9-10): 1477-1482 (2001)
5 V. Pouget, Hervé Lapuyade, Pascal Fouillat, D. Lewis, S. Buchner: Theoretical Investigation of an Equivalent Laser LET. Microelectronics Reliability 41(9-10): 1513-1518 (2001)
4 Romain Desplats, Felix Beaudoin, Philippe Perdu, P. Poirier, D. Trémouilles, M. Bafleur, D. Lewis: Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation. Microelectronics Reliability 41(9-10): 1539-1544 (2001)
3 Felix Beaudoin, Philippe Perdu, Romain Desplats, S. Rigo, D. Lewis: Silicon Thinning and Polishing on Packaged Devices. Microelectronics Reliability 41(9-10): 1557-1561 (2001)
2000
2EEV. Pouget, Pascal Fouillat, D. Lewis, Hervé Lapuyade, L. Sarger, F. M. Roche, S. Duzellier, R. Ecoffet: An Overview of the Applications of a Pulsed Laser System for SEU Testing. IOLTW 2000: 52-
1997
1 David J. Bruemmer, R. Dickson, J. Dilatush, D. Lewis, H. Mateyak, M. Mirarchi, M. Morton, J. Tracy, A. Vorobiev, Lisa Meeden: A Situated Vacuuming Robot. AAAI/IAAI 1997: 783-784

Coauthor Index

1G. Andriamonje [12]
2M. Bafleur [4] [17] [22] [24]
3T. Beauchêne [7] [10] [15] [17] [18]
4Felix Beaudoin [3] [4] [6] [7] [9] [10] [11] [13] [14] [16] [17] [18] [20] [21] [24]
5R. Briand [8]
6David J. Bruemmer [1]
7S. Buchner [5]
8D. Carisetti [11]
9X. Chauffleur [6]
10Wilfrid Claeys [12]
11J. C. Clement [11]
12O. Crépel [9]
13Y. Danto [12] [18]
14F. Darracq [8] [24]
15Romain Desplats [3] [4] [6] [9] [10] [11] [13] [14] [17] [19] [21]
16Yann Deval [8]
17R. Dickson [1]
18J. Dilatush [1]
19Stefan Dilhaire [12]
20A. Douin [23] [25]
21S. Dudit [19]
22S. Duzellier [2]
23R. Ecoffet [2]
24F. Essely [22] [24]
25Y. Ezzahri [12]
26D. Faujour [16]
27Abdellatif Firiti [13] [16] [20]
28Pascal Fouillat [2] [5] [7] [8] [15] [17] [18] [20] [23] [25]
29J. P. Fradin [6]
30E. Frances [14]
31V. Goubier [16]
32C. Goupil [9]
33Stéphane Grauby [12]
34N. Guitard [22] [24]
35G. Haller [9] [10] [13] [16] [20]
36Hervé Lapuyade [2] [5] [7] [8]
37Y. Maidon [8]
38H. Mateyak [1]
39M. De Matos [25]
40Lisa Meeden [1]
41M. Mirarchi [1]
42J. M. Moragues [16]
43L. Dantas de Morais [9]
44M. Morton [1]
45J. Noel [19]
46N. Nolhier [22]
47Y. Ousten [12]
48Philippe Perdu [3] [4] [6] [7] [9] [10] [11] [13] [14] [15] [16] [17] [18] [19] [20] [21] [22] [23] [24] [25]
49A. Pigozzi [19]
50P. Poirier [4]
51V. Pouget [2] [5] [7] [12] [13] [17] [18] [22] [23] [24] [25]
52J. M. Rampnoux [12]
53M. Remmach [14] [19] [24]
54S. Rigo [3]
55F. M. Roche [2]
56J. P. Roux [21]
57Kevin Sanchez [21]
58L. Sarger [2]
59A. Touboul [7] [22] [24]
60J. Tracy [1]
61D. Trémouilles [4] [15] [17] [22]
62A. Vorobiev [1]
63G. Woods [21]

Colors in the list of coauthors

Copyright © Tue Nov 3 08:52:44 2009 by Michael Ley (ley@uni-trier.de)