| |
| 2002 | ||
|---|---|---|
| 2 | EE | Yongseok Ahn, Sanghyun Lee, Gwanhyeob Koh, Taeyoung Chung, Kinam Kim: The abnormality in gate oxide failure induced by stress-enhanced diffusion of polycrystalline silicon. Microelectronics Reliability 42(3): 349-354 (2002) |
| 2001 | ||
| 1 | EE | Sanghyun Lee: Challenges in Building Design and the Construction Industry: The Future of Design and Construction in the Internet Age. Human.Society@Internet 2001: 225-236 |
| 1 | Yongseok Ahn | [2] |
| 2 | Taeyoung Chung | [2] |
| 3 | Kinam Kim | [2] |
| 4 | Gwanhyeob Koh | [2] |