Way Kuo Vis

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23EEKyungmee O. Kim, Way Kuo: Optimal burn-in for maximizing reliability of repairable non-series systems. European Journal of Operational Research 193(1): 140-151 (2009)
22EETao Yuan, Way Kuo: Spatial defect pattern recognition on semiconductor wafers using model-based clustering and Bayesian inference. European Journal of Operational Research 190(1): 228-240 (2008)
21EEXiaoyan Zhu, Way Kuo: Comments on "A Hierarchy of Importance Indices". IEEE Transactions on Reliability 57(3): 529-531 (2008)
20EEWay Kuo, Rui Wan: Recent Advances in Optimal Reliability Allocation. Computational Intelligence in Reliability Engineering 2007: 1-36
19EEJung Yoon Hwang, Way Kuo: Model-based clustering for integrated circuit yield enhancement. European Journal of Operational Research 178(1): 143-153 (2007)
18EEWay Kuo: Corrections to "Challenges Related to Reliability in Nano Electronics". IEEE Transactions on Reliability 56(1): 169 (2007)
17EEWay Kuo: Editorial: How Reliable is Teaching Evaluation? The Relationship of Class Size to Teaching Evaluation Scores. IEEE Transactions on Reliability 56(2): 178-181 (2007)
16EEWay Kuo, Jason W. Rupe: R-Impact: Reliability-Based Citation Impact Factor. IEEE Transactions on Reliability 56(3): 366-367 (2007)
15EESuk Joo Bae, Seong-Joon Kim, Way Kuo, Paul H. Kvam: Statistical Models for Hot Electron Degradation in Nano-Scaled MOSFET Devices. IEEE Transactions on Reliability 56(3): 392-400 (2007)
14EEXian Zhao, Lirong Cui, Way Kuo: Reliability for Sparsely Connected Consecutive-k Systems. IEEE Transactions on Reliability 56(3): 516-524 (2007)
13EEWay Kuo: Compatibility and Simplicity: The Fundamentals of Reliability. IEEE Transactions on Reliability 56(4): 585-586 (2007)
12EEWay Kuo, Rui Wan: Recent Advances in Optimal Reliability Allocation. IEEE Transactions on Systems, Man, and Cybernetics, Part A 37(2): 143-156 (2007)
11EEChunghun Ha, Way Kuo: Reliability redundancy allocation: An improved realization for nonconvex nonlinear programming problems. European Journal of Operational Research 171(1): 24-38 (2006)
10EEChunghun Ha, Way Kuo: Multi-path heuristic for redundancy allocation: the tree heuristic. IEEE Transactions on Reliability 55(1): 37-43 (2006)
9EEChunghun Ha, Way Kuo: Multi-Path Approach for Reliability-Redundancy Allocation Using a Scaling Method. J. Heuristics 11(3): 201-217 (2005)
8EELirong Cui, Way Kuo, H. T. Loh, M. Xie: Optimal allocation of minimal & perfect repairs under resource constraints. IEEE Transactions on Reliability 53(2): 193-199 (2004)
7EEKyungmee O. Kim, Way Kuo, Wen Luo: A relation model of gate oxide yield and reliability. Microelectronics Reliability 44(3): 425-434 (2004)
6 Fen-Hui Lin, Way Kuo: Reliability Importance and Invariant Optimal Allocation. J. Heuristics 8(2): 155-171 (2002)
5EEFen-Hui Lin, Way Kuo, Frank Hwang: Structure importance of consecutive-k-out-of-n systems. Oper. Res. Lett. 25(2): 101-107 (1999)
4 Jason W. Rupe, Way Kuo: Performability of systems based on renewal process models. IEEE Transactions on Systems, Man, and Cybernetics, Part A 28(5): 691-698 (1998)
3 Dick B. Simmons, Newton C. Ellis, Way Kuo: Software Process Agents. SEKE 1996: 323-329
2EEJohn P. Mullen, Jason W. Rupe, Srinagesh Gavirneni, Way Kuo: The Command and Control Communications and Information Network Anlysis Tool (C3INAT). Winter Simulation Conference 1990: 888-894
1 Dong-Hae Chi, Way Kuo: Optimal Design for Software Reliability and Development Cost. IEEE Journal on Selected Areas in Communications 8(2): 276-282 (1990)

Coauthor Index

1Suk Joo Bae [15]
2Dong-Hae Chi [1]
3Lirong Cui [8] [14]
4Newton C. Ellis [3]
5Srinagesh Gavirneni [2]
6Chunghun Ha [9] [10] [11]
7Frank Hwang [5]
8Jung Yoon Hwang [19]
9Kyungmee O. Kim [7] [23]
10Seong-Joon Kim [15]
11Paul H. Kvam [15]
12Fen-Hui Lin [5] [6]
13H. T. Loh [8]
14Wen Luo [7]
15John P. Mullen [2]
16Jason W. Rupe [2] [4] [16]
17Dick B. Simmons [3]
18Rui Wan [12] [20]
19M. Xie [8]
20Tao Yuan [22]
21Xian Zhao [14]
22Xiaoyan Zhu [21]

Colors in the list of coauthors

Copyright © Tue Nov 3 08:52:44 2009 by Michael Ley (ley@uni-trier.de)