| * | 2007 |
|---|
| 30 | EE | Jeong-Yeol Kim,
Ho-Soon Shin,
Jong-Bae Lee,
Moon-Hyun Yoo,
Jeong-Taek Kong:
SilcVerify: An Efficient Substrate Coupling Noise Simulation Tool for High-Speed & Nano-Scaled Memory Design.
ISQED 2007: 475-480 |
| 29 | EE | Jeong-Taek Kong:
Tipping Point for New Design Technologies: DFM, Low Power and ESL.
ISQED 2007: 9-14 |
| 28 | EE | Young-Taek Kim,
Taehun Kim,
Youngduk Kim,
Chulho Shin,
Eui-Young Chung,
Kyu-Myung Choi,
Jeong-Taek Kong,
Soo-Kwan Eo:
Fast and Accurate Transaction Level Modeling of an Extended AMBA2.0 Bus Architecture
CoRR abs/0710.4808: (2007) |
| 27 | EE | Andrew B. Kahng,
Ira Chayut,
John M. Cohn,
Toshihiro Hattori,
Jeong-Taek Kong,
Pierre G. Paulin,
Rich Tobias:
Roundtable: Design and CAD Challenges for Leading-Edge Multimedia Designs.
IEEE Design & Test of Computers 24(1): 83-93 (2007) |
| 2006 |
|---|
| 26 | EE | Ikhwan Lee,
Hyunsuk Kim,
Peng Yang,
Sungjoo Yoo,
Eui-Young Chung,
Kyu-Myung Choi,
Jeong-Taek Kong,
Soo-Kwan Eo:
PowerViP: Soc power estimation framework at transaction level.
ASP-DAC 2006: 551-558 |
| 25 | EE | Sungpack Hong,
Sungjoo Yoo,
Sheayun Lee,
Sangwoo Lee,
Hye Jeong Nam,
Bum-Seok Yoo,
Jaehyung Hwang,
Donghyun Song,
Janghwan Kim,
Jeongeun Kim,
HoonSang Jin,
Kyu-Myung Choi,
Jeong-Taek Kong,
Soo-Kwan Eo:
Creation and utilization of a virtual platform for embedded software optimization: : an industrial case study.
CODES+ISSS 2006: 235-240 |
| 24 | EE | John M. Cohn,
Jeong-Taek Kong,
Chris Malachowsky,
Rich Tobias,
B. Traw:
Design challenges for next-generation multimedia, game and entertainment platforms.
DAC 2006: 459 |
| 23 | EE | Junhyung Um,
Woo-Cheol Kwon,
Sungpack Hong,
Young-Taek Kim,
Kyu-Myung Choi,
Jeong-Taek Kong,
Soo-Kwan Eo,
Taewhan Kim:
A systematic IP and bus subsystem modeling for platform-based system design.
DATE 2006: 560-564 |
| 22 | EE | Sungpack Hong,
Sungjoo Yoo,
HoonSang Jin,
Kyu-Myung Choi,
Jeong-Taek Kong,
Soo-Kwan Eo:
Runtime distribution-aware dynamic voltage scaling.
ICCAD 2006: 587-594 |
| 21 | EE | Young-Gu Kim,
Sang-Hoon Lee,
Dae-Han Kim,
Jae-Woo Im,
Sung-Eun Yu,
Dae-Wook Kim,
Young-Kwan Park,
Jeong-Taek Kong:
Sensing Margin Analysis of MLC Flash Memories Using a Novel Unified Statistical Model.
ISQED 2006: 185-189 |
| 2005 |
|---|
| 20 | EE | Young-Taek Kim,
Taehun Kim,
Youngduk Kim,
Chulho Shin,
Eui-Young Chung,
Kyu-Myung Choi,
Jeong-Taek Kong,
Soo-Kwan Eo:
Fast and Accurate Transaction Level Modeling of an Extended AMBA2.0 Bus Architecture.
DATE 2005: 138-139 |
| 19 | | Jeong-Taek Kong:
SoC in Nanoera: Challenges and Endless Possibility.
DATE 2005: 2 |
| 18 | EE | Yong-Chan Ban,
Soo-Han Choi,
Ki-Hung Lee,
Dong-Hyun Kim,
Ji-Suk Hong,
Yoo-Hyon Kim,
Moon-Hyun Yoo,
Jeong-Taek Kong:
A Fast Lithography Verification Framework for Litho-Friendly Layout Design.
ISQED 2005: 169-174 |
| 17 | EE | Young-Seok Hong,
Heeseok Lee,
Joon-Ho Choi,
Moon-Hyun Yoo,
Jeong-Taek Kong:
Analysis for Complex Power Distribution Networks Considering Densely Populated Vias.
ISQED 2005: 208-212 |
| 2004 |
|---|
| 16 | EE | Chulho Shin,
Young-Taek Kim,
Eui-Young Chung,
Kyu-Myung Choi,
Jeong-Taek Kong,
Soo-Kwan Eo:
Fast Exploration of Parameterized Bus Architecture for Communication-Centric SoC Design.
DATE 2004: 352-357 |
| 15 | EE | Jong-Eun Koo,
Kyung-Ho Lee,
Young-Hoe Cheon,
Joon-Ho Choi,
Moon-Hyun Yoo,
Jeong-Taek Kong:
A Variable Reduction Technique for the Analysis of Ultra Large-Scale Power Distribution Networks.
ISQED 2004: 137-142 |
| 14 | EE | Jeong-Taek Kong:
CAD for nanometer silicon design challenges and success.
IEEE Trans. VLSI Syst. 12(11): 1132-1147 (2004) |
| 2003 |
|---|
| 13 | EE | Hyo-Sig Won,
Kyo-Sun Kim,
Kwang-Ok Jeong,
Ki-Tae Park,
Kyu-Myung Choi,
Jeong-Taek Kong:
An MTCMOS design methodology and its application to mobile computing.
ISLPED 2003: 110-115 |
| 12 | EE | Jae-Seok Yang,
Jeong-Yeol Kim,
Joon-Ho Choi,
Moon-Hyun Yoo,
Jeong-Taek Kong:
Elimination of false aggressors using the functional relationship for full-chip crosstalk analysis.
ISQED 2003: 344-347 |
| 11 | EE | Won-Seok Lee,
Keun-Ho Lee,
Jin-Kyu Park,
Tae-Kyung Kim,
Young-Kwan Park,
Jeong-Taek Kong:
Investigation of the capacitance deviation due to metal-fills and the effective interconnect geometry modeling.
ISQED 2003: 373-376 |
| 2002 |
|---|
| 10 | EE | Chul-Hong Park,
Soo-Han Choi,
Sang-Uhk Rhie,
Dong-Hyun Kim,
Jun-Seong Park,
Tae-Hwang Jang,
Ji-Soong Park,
Yoo-Hyon Kim,
Moon-Hyun Yoo,
Jeong-Taek Kong:
A Hybrid PPC Method Based on the Empirical Etch Model for the 0.14µm DRAM Generation and Beyond.
ISQED 2002: 143-147 |
| 9 | EE | Jin-Kyu Park,
Keun-Ho Lee,
Chang-Sub Lee,
Gi-Young Yang,
Young-Kwan Park,
Jeong-Taek Kong:
Characterizing the Current Degradation of Abnormally Structured MOS Transistors Using a 3D Poisson Solver.
ISQED 2002: 322-325 |
| 2001 |
|---|
| 8 | EE | Tae-Jin Kwon,
Sang-Hoon Lee,
Tae-Seon Kim,
Hoe-Jin Lee,
Young-Kwan Park,
Taek-Soo Kim,
Seok-Jin Kim,
Jeong-Taek Kong:
Performance Improvement for High Speed Devices Using E-tests and the SPICE Model.
ISQED 2001: 443- |
| 2000 |
|---|
| 7 | EE | Ji-Soong Park,
Chul-Hong Park,
Sang-Uhk Rhie,
Yoo-Hyon Kim,
Moon-Hyun Yoo,
Jeong-Taek Kong,
Hyung-Woo Kim,
Sun-Il Yoo:
An Efficient Rule-Based OPC Approach Using a DRC Tool for 0.18mum ASIC.
ISQED 2000: 81-86 |
| 6 | EE | Kwan-Do Kim,
Young-Kwan Park,
Jun-Ha Lee,
Jeong-Taek Kong,
Hee-Sung Kang,
Young-Wug Kim,
Seok-Jin Kim:
Three Dimensional Analysis of Thermal Degradation Effects in FDSOI MOSFET's.
ISQED 2000: 87- |
| 1999 |
|---|
| 5 | EE | HoonSang Jin,
Myung-Soo Jang,
Jin-Suk Song,
Jin-Yong Lee,
Taek-Soo Kim,
Jeong-Taek Kong:
Dynamic power estimation using the probabilistic contribution measure (PCM).
ISLPED 1999: 279-281 |
| 1997 |
|---|
| 4 | EE | Sang-Hoon Lee,
Chang-hoon Choi,
Jeong-Taek Kong,
Wong-Seong Lee,
Jei-Hwan Yoo:
An efficient statistical analysis methodology and its application to high-density DRAMs.
ICCAD 1997: 678-683 |
| 1995 |
|---|
| 3 | | Jeong-Taek Kong,
David Overhauser:
Combining RC-Interconnect Effects with Nonlinear MOS Macromodels.
ISCAS 1995: 570-573 |
| 2 | | Jeong-Taek Kong,
Syed Zakir Hussain,
David Overhauser:
Improving Digital MOS Macromodel Accuracy.
ISCAS 1995: 578-581 |
| 1 | EE | Jeong-Taek Kong,
David Overhauser:
Methods to improve digital MOS macromodel accuracy.
IEEE Trans. on CAD of Integrated Circuits and Systems 14(7): 868-881 (1995) |
