| * | 2008 |
|---|
| 5 | EE | Youbean Kim,
Kicheol Kim,
Incheol Kim,
Sungho Kang:
A New Built-in Self Test Scheme for Phase-Locked Loops Using Internal Digital Signals.
IEICE Transactions 91-C(10): 1713-1716 (2008) |
| 4 | EE | Kicheol Kim,
Youbean Kim,
Incheol Kim,
HyeonUk Son,
Sungho Kang:
A Low-Cost BIST Based on Histogram Testing for Analog to Digital Converters.
IEICE Transactions 91-C(4): 670-672 (2008) |
| 3 | EE | Youbean Kim,
Kicheol Kim,
Incheol Kim,
Hyunwook Son,
Sungho Kang:
A New Scan Power Reduction Scheme Using Transition Freezing for Pseudo-Random Logic BIST.
IEICE Transactions 91-D(4): 1185-1188 (2008) |
| 2007 |
|---|
| 2 | EE | Incheol Kim,
Kicheol Kim,
Youbean Kim,
HyeonUk Son,
Sungho Kang:
A New Analog-to-Digital Converter BIST Considering a Transient Zone.
IEICE Transactions 90-C(11): 2161-2163 (2007) |
| 2005 |
|---|
| 1 | EE | Youbean Kim,
Myung-Hoon Yang,
Yong Lee,
Sungho Kang:
A New Low Power Test Pattern Generator using a Transition Monitoring Window based on BIST Architecture.
Asian Test Symposium 2005: 230-235 |
