Ju Yeob Kim

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2005

1 EE Ju Yeob Kim, Sung Je Hong, Jong Kim: Parallely testable design for detection of neighborhood pattern sensitive faults in high density DRAMs. ISCAS (6) 2005: 5854-5857

2005
1	EE	Ju Yeob Kim, Sung Je Hong, Jong Kim: Parallely testable design for detection of neighborhood pattern sensitive faults in high density DRAMs. ISCAS (6) 2005: 5854-5857

Coauthor Index

1 Sung Je Hong [1]

2 Jong Kim [1]