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Bozena Kaminska Vis

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*2008
87 Yindar Chuo, Bozena Kaminska: Multiparameter Single Locus Integrated Multilayer Polymer Microsensor System. BIODEVICES (1) 2008: 36-43
86EEPawel Gburzynski, Bozena Kaminska, Ashikur Rahman: Reliable Data Transmission over Simple Wireless Channels: A Case Study. DSD 2008: 817-824
85 Pawel Gburzynski, Bozena Kaminska: Testing Real-Time Properties of Embedded Systems. ESA 2008: 179-185
2007
84EEPawel Gburzynski, Bozena Kaminska, Wladek Olesinski: A tiny and efficient wireless ad-hoc protocol for low-cost sensor networks. DATE 2007: 1557-1562
83EEAshikur Rahman, Pawel Gburzynski, Bozena Kaminska: Enhanced Dominant Pruning-based Broadcasting in Untrusted Ad-hoc Wireless Networks. ICC 2007: 3389-3394
2006
82 Abraham O. Fapojuwo, Bozena Kaminska: Sixth IASTED International Multi-Conference on Wireless and Optical Communications: Conference on Communication Systems and Applications, Conference on Optical Communication Systems and Networks, Conference on Wireless Networks and Emerging Technologies, Conference on Wireless SENSOR Networks, Banff, Alberta, Canada, July 3-5, 2006 IASTED/ACTA Press 2006
81EEJasbir N. Patel, Abdul Haseeb Ma, Takaya Ueda, Bonnie Gray, Ash Parmeswaran, Bozena Kaminska: A Novel 3-Way Cell Sorter using Power Efficient Electrolysis-Based Actuator. CCECE 2006: 348-351
2005
80EEEwa Sokolowska, M. Barszcz, Bozena Kaminska: TED Thermo Electrical Designer: A New Physical Design Verification Tool. ISQED 2005: 164-168
79EEBozena Kaminska, Stephen K. Sunter, Salvador Mir: Analog and mixed signal test techniques for SOC development. Microelectronics Journal 36(12): 1063 (2005)
2003
78EEBozena Kaminska, Karim Arabi: Mixed Signal DFT: A Concise Overview. ICCAD 2003: 672-680
77EEHans G. Kerkhoff, Bozena Kaminska: Analog and mixed signal test techniques for SoCs. Microelectronics Journal 34(10): 887-888 (2003)
2002
76EEBozena Kaminska: Homegrown Tools and Equipment versus EDA and ATE Vendors: The Future of Design to Test Product Lines. ITC 2002: 23
2001
75EEKhaled Saab, Naim Ben Hamida, Bozena Kaminska: Closing the gap between analog and digital testing. IEEE Trans. on CAD of Integrated Circuits and Systems 20(2): 307-314 (2001)
74EEIboun Taimiya Sylla, Mustapha Slamani, Bozena Kaminska: A Unity Gain High Speed Buffer to Improve Signal Integrity in High Frequency Test Interface. J. Electronic Testing 17(1): 53-61 (2001)
2000
73EEKhaled Saab, Naim Ben Hamida, Bozena Kaminska: Closing the gap between analog and digital. DAC 2000: 774-779
72EEKhaled Saab, Naim Ben Hamida, Bozena Kaminska: Parametric Fault Simulation and Test Vector Generation. DATE 2000: 650-
1999
71 Bozena Kaminska: Is Analog Fault Simulation a Key to Product Quality? Practical Considerations. ITC 1999: 648-648
70EEAbdessatar Abderrahman, Eduard Cerny, Bozena Kaminska: Worst case tolerance analysis and CLP-based multifrequency test generation for analog circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 18(3): 332-345 (1999)
69EESamir Boubezari, Eduard Cerny, Bozena Kaminska, Benoit Nadeau-Dostie: Testability analysis and test-point insertion in RTL VHDL specifications for scan-based BIST. IEEE Trans. on CAD of Integrated Circuits and Systems 18(9): 1327-1340 (1999)
1998
68EEKarim Arabi, Hassan Ihs, Christian Dufaza, Bozena Kaminska: Digital oscillation-test method for delay and stuck-at fault testing of digital circuits. ITC 1998: 91-100
67EEIboun Taimiya Sylla, Mustapha Slamani, Bozena Kaminska, Fartoumi M. Hossein, Patrick Vincent: Impedance Mismatch and Lumped Capacitance Effects in High Frequency Testing. VTS 1998: 239-244
66EEKarim Arabi, Bozena Kaminska, Mohamad Sawan: On chip testing data converters using static parameters. IEEE Trans. VLSI Syst. 6(3): 409-419 (1998)
65EEKarim Arabi, Bozena Kaminska: Integrated Temperature Sensors for On-Line Thermal Monitoring of Microelectronic Structures. J. Electronic Testing 12(1-2): 93-99 (1998)
1997
64EENaim Ben Hamida, Khaled Saab, David Marche, Bozena Kaminska: A perturbation based fault modeling and simulation for mixed-signal circuits. Asian Test Symposium 1997: 182-187
63EEKarim Arabi, Bozena Kaminska: Efficient and accurate testing of analog-to-digital converters using oscillation-test method. ED&TC 1997: 348-352
62 Karim Arabi, Bozena Kaminska: Built-In Temperature Sensors for On-line Thermal Monitoring of Microelectronic Structures. ICCD 1997: 462-467
61 Bozena Kaminska, Karim Arabi, I. Bell, José L. Huertas, B. Kim, Adoración Rueda, Mani Soma, Prashant Goteti: Analog and Mixed-Signal Benchmark Circuits-First Release. ITC 1997: 183-190
60 Karim Arabi, Bozena Kaminska: Design and Realization of an Accurate Built-In Current Sensor for On-Line Power Dissipation Measurement and IDDQ Testing. ITC 1997: 578-586
59 Mathieu Gagnon, Bozena Kaminska: Optical Communication Channel Test Using BIST Approaches. ITC 1997: 626-635
58 Karim Arabi, Bozena Kaminska: Oscillation Built-In Self Test (OBIST) Scheme for Functional and Structural Testing of Analog and Mixed-Signal Integrated Circuits. ITC 1997: 786-795
57EEAbdessatar Abderrahman, Eduard Cerny, Bozena Kaminska: CLP-based Multifrequency Test Generation for Analog Circuits. VTS 1997: 158-165
56EEKarim Arabi, Bozena Kaminska: Parametric and Catastrophic Fault Coverage of Analog Circuits in Oscillation-Test Methodology. VTS 1997: 166-171
55EEMelvin A. Breuer, Bozena Kaminska, J. McDermid, V. Rayapathi, Donald L. Wheater: Will 0.1um Digital Circuits Require Mixed-Signal Testing. VTS 1997: 186-187
54EEKarim Arabi, Bozena Kaminska: Testing analog and mixed-signal integrated circuits using oscillation-test method. IEEE Trans. on CAD of Integrated Circuits and Systems 16(7): 745-753 (1997)
1996
53EENaim Ben Hamida, Bechir Ayari, Bozena Kaminska: Testing of embedded A/D converters in mixed-signal circuit. ICCD 1996: 135-136
52EEKarim Arabi, Bozena Kaminska, Stephen K. Sunter: Design for testability of integrated operational amplifiers using oscillation-test strategy. ICCD 1996: 40-45
51 Naim Ben Hamida, Khaled Saab, David Marche, Bozena Kaminska, Guy Quesnel: LIMSoft: Automated Tool for Design and Test Integration of Analog Circuits. ITC 1996: 571-580
50EEBozena Kaminska, Tad A. Kwasniewski, Linda S. Milor, G. Roberts, P. Flahive, Jérôme Wojcik: Is High Frequency Analog DFT Possible? VTS 1996: 214-215
49EEMohamed Soufi, Steve Rochon, Yvon Savaria, Bozena Kaminska: Design and performance of CMOS TSPC cells for high speed pseudo random testing. VTS 1996: 368-373
48EEKarim Arabi, Bozena Kaminska: Oscillation-test strategy for analog and mixed-signal integrated circuits. VTS 1996: 476-482
47EEMehdi Ehsanian, Bozena Kaminska, Karim Arabi: A new digital test approach for analog-to-digital converter testing. VTS 1996: 60-65
46 Bozena Kaminska, Bernard Courtois: Guest Editors' Introduction: Mixed Analog and Digital Systems. IEEE Design & Test of Computers 13(2): 8-9 (1996)
45 Gil Philips, Yervant Zorian, Charles W. Rosenthal, Bozena Kaminska: Conference Reports. IEEE Design & Test of Computers 13(3): 8, 113-144 (1996)
44EEKarim Arabi, Bozena Kaminska, Janusz Rzeszut: BIST for D/A and A/D Converters. IEEE Design & Test of Computers 13(4): 40-49 (1996)
43EESamir Boubezari, Bozena Kaminska: A new reconfigurable Test Vector Generator for built-in self-test applications. J. Electronic Testing 8(2): 153-164 (1996)
42EEAdel Belhaouane, Yvon Savaria, Bozena Kaminska, Daniel Massicotte: Reconstruction method for jitter tolerant data acquisition system. J. Electronic Testing 9(1-2): 177-185 (1996)
41EEAbdessatar Abderrahman, Bozena Kaminska, Eduard Cerny: Optimization-based multifrequency test generation for analog circuits. J. Electronic Testing 9(1-2): 59-73 (1996)
40EEBozena Kaminska, Bernard Courtois: Guest editorial. J. Electronic Testing 9(1-2): 7-8 (1996)
1995
39EEJanusz Rzeszut, Bozena Kaminska, Yvon Savaria: A new method for testing mixed analog and digital circuits. Asian Test Symposium 1995: 127-132
38EEAli Assi, Bozena Kaminska: Modeling of communication protocols in VHDL. Great Lakes Symposium on VLSI 1995: 168-171
37 Samir Lejmi, Bozena Kaminska, Bechir Ayari: Retiming for BIST-Sequential Circuits. ISCAS 1995: 1740-1743
36 Samir Boubezari, Bozena Kaminska: Mixed Deterministic and Pseudorandom Test Vector Generator Based on Cellular Automata Structures. ISCAS 1995: 1928-1931
35 Bechir Ayari, Bozena Kaminska: BDD-FTEST: Fast, Backtrack-Free Test Generator Based on Binary Decision Diagram Representation. ISCAS 1995: 2132-2135
34 Mohamed Soufi, Yvon Savaria, Bozena Kaminska: On Using Partial Reset for Pseudo-Random Testing. ISCAS 1995: 949-952
33 Samir Lejmi, Bozena Kaminska, Bechir Ayari: Synthesis and Retiming for the Pseudo-Exhaustive BIST of Synchronous Sequential Circuits. ITC 1995: 683-692
32EEMohamed Soufi, Yvon Savaria, Bozena Kaminska: On the design of at-speed testable VLSI circuits. VTS 1995: 290-295
31EESamir Lejmi, Bozena Kaminska, Bechir Ayari: Retiming, resynthesis, and partitioning for the pseudo-exhaustive testing of sequential circuits. VTS 1995: 434-439
30EEKhaled Saab, Bozena Kaminska, Bernard Courtois, Marcelo Lubaszewski: Frequency-based BIST for analog circuit testin. VTS 1995: 54-59
29EEMustapha Slamani, Bozena Kaminska: Multifrequency Analysis of Faults in Analog Circuits. IEEE Design & Test of Computers 12(2): 70-80 (1995)
28 Sreejit Chakravarty, Ramalingam Sridhar, Shambhu J. Upadhyaya, Yervant Zorian, Gil Philips, Bozena Kaminska, Bernard Courtois: Conference Reports. IEEE Design & Test of Computers 12(4): 95-97 (1995)
27 Mohamed Soufi, Yvon Savaria, F. Darlay, Bozena Kaminska: Producing Reliable Initialization and Test of Sequential Circuits with Pseudorandom Vectors. IEEE Trans. Computers 44(10): 1251-1256 (1995)
26 Samir Boubezari, Bozena Kaminska: A Deterministic Built-In-Self-Test Generator Based on Cellular Automata Structures. IEEE Trans. Computers 44(6): 805-816 (1995)
25EEMounir Fares, Bozena Kaminska: FPAD: a fuzzy nonlinear programming approach to analog circuit design. IEEE Trans. on CAD of Integrated Circuits and Systems 14(7): 785-793 (1995)
1994
24 Mohamed Jamoussi, Bozena Kaminska: M-Testability: An Approach for Data-Path Testability Evaluation. EDAC-ETC-EUROASIC 1994: 449-455
23 Abdessatar Abderrahman, Bozena Kaminska, Yvon Savaria: Estimation of Simultaneous Switching Power and Ground Noise of Static CMOS Combinational Circuits. EDAC-ETC-EUROASIC 1994: 658
22EEKarim Arabi, Bozena Kaminska, Janusz Rzeszut: A new built-in self-test approach for digital-to-analog and analog-to-digital converters. ICCAD 1994: 491-494
21 Samir Lejmi, Bozena Kaminska, Edouard Wagneur: Retiming for the Global Optimization of Synchronous Sequential Circuits. ICCD 1994: 398-403
20 Naim Ben Hamida, Bozena Kaminska, Yvon Savaria: Pseudo-Random Vector Compaction for Sequential Testability. ISCAS 1994: 63-66
19 Naim Ben Hamida, Bozena Kaminska: High Level Synthesis with Testability Constraints. ISCAS 1994: 65-68
18 Mustapha Slamani, Bozena Kaminska, Guy Quesnel: An Integrated Approach for Analog Ciruit Testing with a Minmum Number of Detected Parameters. ITC 1994: 631-640
17 Ewa Sokolowska, Bozena Kaminska: Application of Optoelectronic Techniques to High Speed Testing. ITC 1994: 710-719
16 Mohamed Jamoussi, Bozena Kaminska: Data Path Testability Evaluation via Functional Testability Measures. VLSI Design 1994: 301-306
15 Naim Ben Hamida, Bozena Kaminska: Multiple Fault Testing in Analog Circuits. VLSI Design 1994: 61-66
14 Mounir Fares, Bozena Kaminska: Exploring Test Space with Fuzzy Decision Making. IEEE Design & Test of Computers 11(3): 17-27 (1994)
13EEBechir Ayari, Bozena Kaminska: A new dynamic test vector compaction for automatic test pattern generation. IEEE Trans. on CAD of Integrated Circuits and Systems 13(3): 353-358 (1994)
12EESaid Amellal, Bozena Kaminska: Functional synthesis of digital systems with TASS. IEEE Trans. on CAD of Integrated Circuits and Systems 13(5): 537-552 (1994)
11EEMounir Fares, Bozena Kaminska: Fuzzy optimization models for analog test decisions. J. Electronic Testing 5(2-3): 299-305 (1994)
1993
10 Mohamed Jamoussi, Bozena Kaminska: A Functional-level Testability Evaluation Using a New M-Testability. ISCAS 1993: 1611-1614
9 Naim Ben Hamida, Bozena Kaminska, Yvon Savaria: Initiability: A Measure of Sequential Testability. ISCAS 1993: 1619-1622
8 Said Amellal, Bozena Kaminska: Scheduling of a Control and Data Flow Graph. ISCAS 1993: 1666-1669
7 Samir Lejmi, Bozena Kaminska, Edouard Wagneur: Resynthesis and Retiming of Synchronous Sequential Cirucits. ISCAS 1993: 1674-1677
6 Naim Ben Hamida, Bozena Kaminska: Analog Circuit Testing Based on Sensitivity Computation and New Circuit Modeling. ITC 1993: 652-661
5EENaim Ben Hamida, Bozena Kaminska: Multiple fault analog circuit testing by sensitivity analysis. J. Electronic Testing 4(4): 331-343 (1993)
1992
4EEMustapha Slamani, Bozena Kaminska: Analog Circuit Fault Diagnosis Based on Sensitivity Computation and Functional Testing. IEEE Design & Test of Computers 9(1): 30-39 (1992)
1989
3 Yvon Savaria, Bruno Laguë, Bozena Kaminska: A Pragmatic Approach to the Design of Self-Testing Circuits. ITC 1989: 745-754
2 Bozena Kaminska, Yvon Savaria: Design-for-Testability Using Test Design Yield and Decision Theory. ITC 1989: 884-892
1988
1 David Stannard, Bozena Kaminska: Detection of Hard Faults in a Combinational Circuit Using Budget Constraints. ITC 1988: 999

Coauthor Index

1Abdessatar Abderrahman [23] [41] [57] [70]
2Said Amellal [8] [12]
3Karim Arabi [22] [44] [47] [48] [52] [54] [56] [58] [60] [61] [62] [63] [65] [66] [68] [78]
4Ali Assi [38]
5Bechir Ayari [13] [31] [33] [35] [37] [53]
6M. Barszcz [80]
7Adel Belhaouane [42]
8I. Bell [61]
9Samir Boubezari [26] [36] [43] [69]
10Melvin A. Breuer [55]
11Eduard Cerny [41] [57] [69] [70]
12Sreejit Chakravarty [28]
13Yindar Chuo [87]
14Bernard Courtois [28] [30] [40] [46]
15F. Darlay [27]
16Christian Dufaza [68]
17Mehdi Ehsanian [47]
18Abraham O. Fapojuwo [82]
19Mounir Fares [11] [14] [25]
20P. Flahive [50]
21Mathieu Gagnon [59]
22Pawel Gburzynski [83] [84] [85] [86]
23Prashant Goteti [61]
24Bonnie Gray [81]
25Naim Ben Hamida [5] [6] [9] [15] [19] [20] [51] [53] [64] [72] [73] [75]
26Fartoumi M. Hossein [67]
27José Luis Huertas (José L. Huertas) [61]
28Hassan Ihs [68]
29Mohamed Jamoussi [10] [16] [24]
30Hans G. Kerkhoff [77]
31B. Kim [61]
32Tad A. Kwasniewski [50]
33Bruno Laguë [3]
34Samir Lejmi [7] [21] [31] [33] [37]
35Marcelo Lubaszewski [30]
36Abdul Haseeb Ma [81]
37David Marche [51] [64]
38Daniel Massicotte [42]
39J. McDermid [55]
40Linda S. Milor (Linda Milor) [50]
41Salvador Mir [79]
42Benoit Nadeau-Dostie [69]
43Wladek Olesinski [84]
44Ash Parmeswaran [81]
45Jasbir N. Patel [81]
46Gil Philips [28] [45]
47Guy Quesnel [18] [51]
48Ashikur Rahman [83] [86]
49V. Rayapathi [55]
50G. Roberts [50]
51Steve Rochon [49]
52Charles W. Rosenthal [45]
53Adoración Rueda [61]
54Janusz Rzeszut [22] [39] [44]
55Khaled Saab [30] [51] [64] [72] [73] [75]
56Yvon Savaria [2] [3] [9] [20] [23] [27] [32] [34] [39] [42] [49]
57Mohamad Sawan [66]
58Mustapha Slamani [4] [18] [29] [67] [74]
59Ewa Sokolowska [17] [80]
60Mani Soma [61]
61Mohamed Soufi [27] [32] [34] [49]
62Ramalingam Sridhar [28]
63David Stannard [1]
64Stephen K. Sunter [52] [79]
65Iboun Taimiya Sylla [67] [74]
66Takaya Ueda [81]
67Shambhu J. Upadhyaya [28]
68Patrick Vincent [67]
69Edouard Wagneur [7] [21]
70Donald L. Wheater [55]
71Jérôme Wojcik [50]
72Yervant Zorian [28] [45]

Colors in the list of coauthors

Copyright © Tue Nov 3 08:52:44 2009 by Michael Ley (ley@uni-trier.de)